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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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20<br />

Chapter 1<br />

Figure 1-16. Pho<strong>to</strong>graph <strong>of</strong> Chicago S<strong>TEM</strong> and (bot<strong>to</strong>m-left inset) image <strong>of</strong> mercury a<strong>to</strong>ms<br />

on a thin-carbon support film. Courtesy <strong>of</strong> Dr. Albert Crewe (personal communication).<br />

A<strong>to</strong>mic-scale resolution is also available in the conventional (fixedbeam)<br />

<strong>TEM</strong>. A crystalline specimen is oriented so that its a<strong>to</strong>mic columns lie<br />

parallel <strong>to</strong> the incident-electron beam, and it is actually columns <strong>of</strong> a<strong>to</strong>ms<br />

that are imaged; see Fig. 1-17. It was originally thought that such images<br />

might reveal structure within each a<strong>to</strong>m, but such an interpretation is<br />

questionable. In fact, the internal structure <strong>of</strong> the a<strong>to</strong>m can be deduced by<br />

analyzing the angular distribution <strong>of</strong> scattered charged particles (as first done<br />

for alpha particles by Ernest Rutherford) without the need <strong>to</strong> form a direct<br />

image.<br />

Figure 1-17. Early a<strong>to</strong>mic-resolution <strong>TEM</strong> image <strong>of</strong> a gold crystal (Hashimo<strong>to</strong> et al., 1977),<br />

recorded at 65 nm defocus with the incident electrons parallel <strong>to</strong> the 001 axis. Courtesy<br />

Chairperson <strong>of</strong> the Publication Committee, The <strong>Physical</strong> Society <strong>of</strong> Japan, and the authors.

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