Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
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<strong>TEM</strong> Specimens and Images 111<br />
Figure 4-13. Unit cell for a face-centered cubic crystal: a cube <strong>of</strong> side a with a<strong>to</strong>ms located at<br />
each corner and at the center <strong>of</strong> each face. <strong>An</strong>other common crystal structure is the bodycentered<br />
cubic (bcc) structure, whose unit cell is a cube with eight corner a<strong>to</strong>ms and a single<br />
a<strong>to</strong>m located at the geometrical center <strong>of</strong> the cube.<br />
For a material whose lattice parameter is known (for example, from x-ray<br />
diffraction), the expected d-spacings can be calculated, using the additional<br />
condition that (for the fcc structure) h, k, and l must be all odd or all even.<br />
Therefore, the first few rings in the diffraction pattern <strong>of</strong> a polycrystalline<br />
fcc metal<br />
correspond <strong>to</strong><br />
(h kl) = (1 1 1), (2 0 0), (2 2 0), (3 1 1), (2 2 2), … (4.24)<br />
Knowing a, the d-spacing for each ring can be calculated using Eq. (4.23)<br />
and its electron-scattering angle � obtained from Eq. (4.21). From Eq. (4.22),<br />
a value <strong>of</strong> L can be deduced for each ring and these individual values<br />
averaged <strong>to</strong> give a more accurate value <strong>of</strong> the camera length. Recording the<br />
diffraction pattern <strong>of</strong> a material with known structure and lattice parameter<br />
therefore provides a way <strong>of</strong> calibrating the camera length, for a given<br />
intermediate-lens setting.<br />
Knowing L, the use <strong>of</strong> Eq. (4.22) and then Eq. (4.21) can provide a list <strong>of</strong><br />
the d-spacings represented in the electron-diffraction pattern recorded from<br />
an unknown material. In favorable cases, these interplanar spacings can then<br />
be matched <strong>to</strong> the d-values calculated for different crystal structures, taking<br />
h, k, and l from rules similar <strong>to</strong> Eq. (4.24) but different for each structure,<br />
and with a as an adjustable parameter. In this way, both the lattice parameter<br />
and the crystal structure <strong>of</strong> the unknown material can be determined, which<br />
may enable the material <strong>to</strong> be identified from previously-tabulated<br />
information.