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Physical Principles of Electron Microscopy: An Introduction to TEM ...

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Ray F. Eger<strong>to</strong>n<br />

Department <strong>of</strong> Physics, University <strong>of</strong> Alberta<br />

412 Avadh Bhatia Physics Labora<strong>to</strong>ry<br />

Edmon<strong>to</strong>n, Alberta, Canada<br />

T6G 2R3<br />

Library <strong>of</strong> Congress Control Number: 2005924717<br />

ISBN-10: 0-387-25800-0 Printed on acid-free paper.<br />

ISBN-13: 978-0387-25800-0<br />

© 2005 Springer Science+Business Media, Inc.<br />

All rights reserved. This work may not be translated or copied in whole or in part without the written<br />

permission <strong>of</strong> the publisher (Springer Science+Business Media, Inc., 233 Spring St., New York, NY<br />

10013, USA), except for brief excerpts in connection with reviews or scholarly analysis. Use in connection<br />

with any form <strong>of</strong> information s<strong>to</strong>rage and retrieval, electronic adaptation, computer s<strong>of</strong>tware, or by<br />

similar or dissimilar methodology now known or hereafter developed is forbidden.<br />

The use in this publication <strong>of</strong> trade names, trademarks, service marks, and similar terms, even if they are<br />

not identified as such, is not <strong>to</strong> be taken as an expression <strong>of</strong> opinion as <strong>to</strong> whether or not they are subject<br />

<strong>to</strong> proprietary rights.<br />

Printed in the United States <strong>of</strong> America. (EB)<br />

987654321<br />

springeronline.com

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