Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
Physical Principles of Electron Microscopy: An Introduction to TEM ...
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148 Chapter 5<br />
Section 4-10. Films <strong>of</strong> thickness 10 � 20 nm conduct sufficiently <strong>to</strong> prevent<br />
charging <strong>of</strong> most specimens. Because this thickness is greater than the SE<br />
escape depth, the SE signal comes from the coating rather than from the<br />
specimen material. However, the external con<strong>to</strong>urs <strong>of</strong> a very thin film<br />
closely follow those <strong>of</strong> the specimen, providing the possibility <strong>of</strong> a faithful<br />
<strong>to</strong>pographical image. Gold and chromium are common coating materials.<br />
Evaporated carbon is also used; it has a low SE yield but an extremely small<br />
grain size so that granularity <strong>of</strong> the coating does not appear (as an artifact) in<br />
a high-magnification SE image, masking real specimen features.<br />
Where coating is undesirable or difficult (for example, a specimen with<br />
very rough surfaces), specimen charging can <strong>of</strong>ten be avoided by carefully<br />
choosing the SEM accelerating voltage. This option arises because the<br />
backscattering coefficient � and secondary-electron yield � depend on the<br />
primary-electron energy E0. At high E0 , the penetration depth is large and<br />
only a small fraction <strong>of</strong> the secondary electrons generated in the specimen<br />
can escape in<strong>to</strong> the vacuum. In addition, many <strong>of</strong> the backscattered electrons<br />
are generated deep within the specimen and do not have enough energy <strong>to</strong><br />
escape, so � will be low. A low <strong>to</strong>tal yield (� + �) means that the specimen<br />
charges negatively; according <strong>to</strong> Eq. (5.4). As E0 is reduced, � increases and<br />
the specimen current Is required <strong>to</strong> maintain charge neutrality eventually falls<br />
<strong>to</strong> zero at some incident energy E2 corresponding <strong>to</strong> (� + �) = 1. Further<br />
reduction in E0 could result in a positive charge but this would attract<br />
secondaries back <strong>to</strong> the specimen, neutralizing the charge. So in practice,<br />
positive charging is less <strong>of</strong> a problem.<br />
For an incident energy below some value E1, the <strong>to</strong>tal yield falls below<br />
one because now the primary electrons do not have enough energy <strong>to</strong> create<br />
secondaries. Because by definition � < 1, Eq. (5.4) indicates that negative<br />
charging will again occur. But for E1< E0 < E2, negative charging is absent<br />
even for an insulating specimen, as shown in Fig. 5-20.<br />
1<br />
<strong>to</strong>tal yield (���)<br />
E 1<br />
zerocharging<br />
region<br />
E 2<br />
Figure 5-20. Total electron yield (� + �) as a function <strong>of</strong> primary energy, showing the range<br />
(E1 <strong>to</strong> E2) over which electrostatic charging <strong>of</strong> an insulating specimen is not a problem.<br />
E 0