SAE 2012 World Congress & Exhibition
SAE 2012 World Congress & Exhibition
SAE 2012 World Congress & Exhibition
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2:00 p.m.<br />
2:20 p.m.<br />
2:40 p.m.<br />
3:00 p.m.<br />
3:20 p.m.<br />
Wednesday, April 25<br />
Chat with the Experts: U.S. DOT's V2V and V2I Technology Test Bed Update<br />
Session Code:<br />
Room D0-03A<br />
Safety Critical Systems (part 1 of 2)<br />
Session Code:<br />
Room D0-03B<br />
AECHAT200<br />
Come hear the latest updates on the V2V and V2I Technology Test Bed and connected vehicle research including an expansion within the Detroit<br />
area that will include Signal Phase and Timing (SPaT) and Geometric Intersection Description (GID), and extensions outside of Michigan. The V2V<br />
and V2I Technology Test Bed is available for anyone to use in testing their safety, mobility and environmental applications, services, and<br />
componentsusing interoperable equipment consistent with the DOT's program.<br />
AE300<br />
Wednesday, April 25<br />
The focus of the session is on system safety analysis and design of safety-critical systems employing electronic controls. Topics include:<br />
implementation of safety-relevant systems, fail-safe strategies, distributed fault tolerant systems and hazard analysis. Application areas include:<br />
automotive active safety and alternative energy systems as well as avionics and mission management. Finally, the session addresses application of<br />
new or revised safety standards such as ISO 26262 and DO-178C.<br />
Organizers -<br />
Chairpersons -<br />
10:00 a.m.<br />
<strong>2012</strong>-01-0929<br />
<strong>2012</strong>-01-0927<br />
<strong>2012</strong>-01-0933<br />
<strong>2012</strong>-01-0928<br />
<strong>2012</strong>-01-0930<br />
Brian T. Murray, United Technologies Research Center; Joseph G. D'Ambrosio, GM R&D Center;<br />
Dr. Markus Plankensteiner, TTTech Computertechnik AG<br />
Brian Murray, United Technologies Research Center; Joseph D'Ambrosio, GM R&D Center<br />
ORAL ONLY<br />
Functional Development Methodology for On-Board Distributed ECU<br />
Systems for Production Vehicle Application<br />
Using High-Fidelity Multibody Vehicle Models in Real-Time Simulations<br />
Efficient Testing and Cost Awareness: Low-Cost versus HIL-System<br />
Virtual Testing and Simulation Environment [Micro-HiL] for Engine and<br />
Aftertreatment Calibration and Development -Part 2<br />
Low Cost Vehicle Validation Strategy for Early Detection and Correction<br />
of Real-Life Performance Deficiencies of Various Subsystems<br />
Planned by Testing and Instrumentation Committee / Automobile Electronics Activity<br />
Time Paper No. Title<br />
Akira Watanabe, Asuka Sotome, Nissan Motor Company Ltd.<br />
William Crego Prescott, LMS International; Gert Heirman, Katholieke<br />
Universiteit Leuven; Matthew furman, Joris De Cuyper, LMS International;<br />
Ludger Dragon, Andre Lippeck, Horst Brauner, Daimler AG<br />
Stefan Mueller, Petra Langjahr, Bosch Engineering GmbH<br />
Harsha K. Nanjundaswamy, Mufaddel Dahodwala, Mitesh Farsodia, Dean<br />
Tomazic, Erik Koehler, FEV Inc.<br />
Anand Patidar, Vishwas Vaidya, Tata Motors Ltd.<br />
Session Time:<br />
4:00 p.m.<br />
Keynote Speakers - Walton L. Fehr, US Dept. of Transportation; Greg Krueger, Michigan Dept. of Transportation<br />
Session Time:<br />
10:00 a.m.<br />
Automotive Functional Safety Standard ISO 26262 and the Current<br />
Challenges<br />
Chitra Thyagarajan, Integrated Engineering Solutions, Mahindra Satyam