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Nondestructive testing of defects in adhesive joints

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Figure 1: Variation <strong>of</strong> ln R with 1/T for silver films deposited on PS/P4VP<br />

blends held at 457 K<br />

Figure 2: Variation <strong>of</strong> logarithm <strong>of</strong> resistances at 457 K and 300K<br />

with PS/P4VP blend composition for 50 nm silver films.

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