The Impact of Dennard's Scaling Theory - IEEE
The Impact of Dennard's Scaling Theory - IEEE
The Impact of Dennard's Scaling Theory - IEEE
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Editor’s Column<br />
We appreciate<br />
all<br />
<strong>of</strong> your<br />
feedback on our<br />
first issue in September,<br />
2006 on “<strong>The</strong><br />
Technical <strong>Impact</strong> <strong>of</strong><br />
Moore's Law.” With the Winter, 2007<br />
issue, we are continuing our new<br />
policy <strong>of</strong> mailing a hard copy <strong>of</strong> the<br />
SSCS News to all 11,500 members.<br />
This issue is the first <strong>of</strong> four that SSCS<br />
plans to publish annually (one each<br />
in Winter, Spring, Summer, and Fall).<br />
<strong>The</strong> goal <strong>of</strong> every issue is to be a<br />
self-contained resource on a select-<br />
President:<br />
Richard C. Jaeger<br />
Alabama Microelectronics Center<br />
Auburn University, AL<br />
jaeger@eng.auburn.edu<br />
Fax: +1 334 844-1888<br />
Vice President:<br />
Willy Sansen<br />
K. U. Leuven<br />
Leuven, Belgium<br />
Secretary:<br />
David A. Johns<br />
University <strong>of</strong> Toronto<br />
Toronto, Ontario, Canada<br />
Treasurer:<br />
Rakesh Kumar<br />
Technology Connexions<br />
Poway, CA<br />
Past President:<br />
Stephen H. Lewis<br />
University <strong>of</strong> California<br />
Davis, CA<br />
Other Representatives:<br />
Representative to Sensors Council<br />
Darrin Young<br />
Representative from CAS to SSCS<br />
Domine Leenaerts<br />
Representative to CAS from SSCS<br />
Un-Ku Moon<br />
Newsletter Editor:<br />
Lewis Terman<br />
IBM T. J. Watson Research Center<br />
terman@us.ibm.com<br />
Fax: +1 914 945-4160<br />
ed topic, with background articles<br />
(that is, the ‘original sources’) and<br />
new articles by experts who<br />
describe the current state <strong>of</strong> affairs<br />
in technology and the impact <strong>of</strong> the<br />
original papers and/or patents.<br />
<strong>The</strong> theme <strong>of</strong> the Winter 2007<br />
issue is “<strong>The</strong> <strong>Impact</strong> <strong>of</strong> <strong>Dennard's</strong><br />
<strong>Scaling</strong> <strong>The</strong>ory.”<br />
This issue contains one Research<br />
Highlights article: “Analog IC Design<br />
at the University <strong>of</strong> Twente,” by<br />
Bram Nauta, Head <strong>of</strong> the IC Design<br />
Group at the University <strong>of</strong> Twente,<br />
<strong>The</strong> Netherlands. <strong>The</strong> issue also<br />
contains seven short feature articles<br />
<strong>IEEE</strong> Solid-State Circuits Society AdCom<br />
Newsletter Coeditor:<br />
Mary Y. Lanzerotti<br />
IBM T.J. Watson Research Center<br />
myl@us.ibm.com<br />
Fax: +1 914 945 1358<br />
Elected AdCom Members at Large<br />
Terms to 31 Dec. 07:<br />
Bill Bidermann<br />
David Johns<br />
Terri Fiez<br />
Takayasu Sakurai<br />
Mehmet Soyuer<br />
Terms to 31 Dec. 08:<br />
Wanda K. Gass<br />
Ali Hajimiri<br />
Paul J. Hurst<br />
Akira Matsuzawa<br />
Ian Young<br />
Terms to 31 Dec. 09:<br />
John J. Corcoran<br />
Kevin Kornegay<br />
Hae-Seung (Harry) Lee<br />
Thomas H. Lee<br />
Jan Van der Spiegel<br />
Chairs <strong>of</strong> Standing Committees:<br />
Awards David Hodges<br />
Chapters Jan Van der Spiegel<br />
Education CK Ken Yang<br />
Meetings Anantha Chandrakasan<br />
Membership Bruce Hecht<br />
Nominations Stephen H. Lewis<br />
Publications Bernhard Boser<br />
For detailed contact information, see the Society<br />
e-News: www.ieee.org/portal/site/sscs<br />
For questions regarding Society business, contact the SSCS Executive Office.<br />
Contributions for the Spring 2007 issue <strong>of</strong> the Newsletter must be received by<br />
8 February 2007 at the SSCS Executive Office. A complete media kit for advertisers<br />
is available at www.spectrum.ieee.org/mc_print. Scroll down to find SSCS<br />
Anne O’Neill, Executive Director<br />
<strong>IEEE</strong> SSCS<br />
445 Hoes Lane<br />
Piscataway, NJ 08854<br />
Tel: +1 732 981 3400<br />
Fax: +1 732 981 3401<br />
Email: sscs@ieee.org<br />
Katherine Olstein, SSCS Administrator<br />
<strong>IEEE</strong> SSCS<br />
445 Hoes Lane,<br />
Piscataway, NJ 08854<br />
Tel: +1 732 981 3410<br />
Fax: +1 732 981 3401<br />
Email: k.olstein@ieee.org<br />
that address the theme:<br />
(1) “A 30 Year Retrospective on<br />
<strong>Dennard's</strong> MOSFET <strong>Scaling</strong><br />
Paper,” by Mark Bohr <strong>of</strong> Intel<br />
Corporation;<br />
(2) “Device <strong>Scaling</strong>: <strong>The</strong> Treadmill<br />
that Fueled Three Decades <strong>of</strong><br />
Semiconductor Industry Growth,”<br />
by Pallab Chatterjee <strong>of</strong> i2 Technologies;<br />
(3) “Recollections on MOSFET<br />
<strong>Scaling</strong>,” by Dale Critchlow,<br />
the University <strong>of</strong> Vermont;<br />
(4) “<strong>The</strong> Business <strong>of</strong> <strong>Scaling</strong>,” by<br />
Rakesh Kumar, TCX, Inc. Technology<br />
Connexions;<br />
(5) “A Perspective on the <strong>The</strong>ory<br />
<strong>of</strong> MOSFET <strong>Scaling</strong> and its<br />
<strong>Impact</strong>,” by Tak Ning, IBM;<br />
(6) “<strong>Impact</strong> <strong>of</strong> <strong>Scaling</strong> and the<br />
environment in which the <strong>Scaling</strong><br />
developed<br />
at that time," by Yoshio Nishi, Stanford<br />
University;<br />
(7) "It's All About Scale," by Hans<br />
Stork, TI.<br />
Three original papers by Dennard,<br />
from 1972 (IEDM Conference),<br />
1973 (IEDM Conference), and 1974<br />
(<strong>IEEE</strong> Journal <strong>of</strong> Solid-State Circuits),<br />
are also reprinted in this<br />
issue.<br />
Thank you for taking the time to<br />
read the SSCS News. We appreciate<br />
your comments and feedback! Please<br />
send comments to myl@us.ibm.com.<br />
2 <strong>IEEE</strong> SSCS NEWSLETTER Winter 2007