09.02.2013 Views

The Impact of Dennard's Scaling Theory - IEEE

The Impact of Dennard's Scaling Theory - IEEE

The Impact of Dennard's Scaling Theory - IEEE

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

CONFERENCES<br />

Synergy between various<br />

dimensions <strong>of</strong> integrated circuits<br />

in the nano-electronic<br />

era will be the theme <strong>of</strong> ISSCC<br />

2007. ISSCC is the flagship conference<br />

<strong>of</strong> the Solid-State Circuits<br />

Society.<br />

Balance Among Process, Circuit,<br />

Architecture, and System Technology<br />

Advances Required for Innovation<br />

Pushed by the continued growth <strong>of</strong><br />

Moore’s Law, integrated circuits<br />

have evolved from the micro-electronic<br />

into the nano-electronic era.<br />

This transition has created tremendous<br />

opportunities for higher-density,<br />

higher-performance, lowerpower<br />

circuits and systems resulting<br />

in cost-effective solutions for<br />

ubiquitous communications, computation,<br />

sensing, display, consumer<br />

electronics, and multimedia.<br />

However, the advent <strong>of</strong> the nanoera<br />

has blurred the traditional<br />

boundaries between the four<br />

dimensions <strong>of</strong> IC innovation (technology,<br />

devices, circuits, and system<br />

architecture). As a result, innovation<br />

in solid-state circuits requires<br />

an intricate balance among<br />

advances in process, circuit, architecture<br />

and system technology.<br />

Novel Circuit Concepts and Four-<br />

Dimension Interrelationships<br />

Selected for Technical Program<br />

Paper proposals for novel circuit<br />

concepts and systems and explorations<br />

<strong>of</strong> the interrelationships<br />

among the four dimensions <strong>of</strong> IC<br />

innovation were especially sought<br />

for the Conference.<br />

Within the resulting technical<br />

program <strong>of</strong> 234 papers, fifty percent<br />

are devoted in nearly equal proportions<br />

to wireline, digital, wireless,<br />

and the combined category <strong>of</strong><br />

imagers, medical, MEMS and dis-<br />

Solid-State Circuits Conference Will Focus<br />

on Nano-Era Synergy<br />

ISSCC 2007 to Meet on 11-15 February in San Francisco<br />

Katherine Olstein, SSCS Administrator, k.olstein@ieee.org<br />

plays. Special topic sessions in<br />

three <strong>of</strong> these technical areas will<br />

be “Last-Mile Access Options:<br />

PON/DLS/Cable/ Wireless,” “Secure<br />

Digital Systems,” and “Implantable<br />

and Prosthetic Devices: Life-Changing<br />

Circuits.” <strong>The</strong> Wireless session<br />

will include a panel discussion entitled<br />

“Digital RF– A Fundamentally-<br />

New Technology, or Just Marketing<br />

Hype?” and a forum, “Giraffe:<br />

Power Amplifiers and Transmitter<br />

Architectures.” <strong>The</strong>re will also be a<br />

tutorial within each area.<br />

In the area <strong>of</strong> data converters<br />

we notice a shift into the 90nm<br />

regime with 1-1.2V supply voltage<br />

giving rise to higher performance<br />

and lower power consumption for<br />

multimode operations. <strong>The</strong> papers<br />

in the digital arena showcase 65nm<br />

technologies at clocking speed up<br />

to 5GHz. Power management<br />

receives special attention among<br />

the high performance digital<br />

papers. Circuits make further<br />

inroads into the medical area with<br />

implantable brain probes, multichannel<br />

high-resolution retinal<br />

prosthesis. CMOS imagers witness<br />

continued shrinking <strong>of</strong> the pixel<br />

size while improving performance,<br />

competing with CCD type <strong>of</strong><br />

imagers. Papers in the area <strong>of</strong><br />

Technology Direction will showcase<br />

the next-generation, post-<br />

CMOS technologies and systems.<br />

Special-Topic Sessions on Next-<br />

Generation Circuit Design<br />

On Sunday evening before the first<br />

day <strong>of</strong> the Conference, two specialtopic<br />

seminars addressing next-generation<br />

circuit-design challenges<br />

will be open to all attendees.<br />

“Digitally Enhanced Analog and<br />

RF” will include four talks by Boris<br />

Murmann (Stanford University),<br />

Steve Lewis (UC, Davis), Larry Lar-<br />

son (UC, San Diego) and Jan Craninckx<br />

(IMEC, Belgium), who will<br />

explore challenges and trends in<br />

CMOS in scaling technologies:<br />

As CMOS chip technologies<br />

scale to finer line widths, smaller<br />

devices, and lower voltages, analog<br />

circuit targets are harder to<br />

achieve due to larger device mismatch,<br />

non-ideal device characteristics,<br />

and limited voltage swing. At<br />

the same time, scaled technologies<br />

reduce power and area, while<br />

increasing performance and lowering<br />

cost for digital circuits every<br />

year. <strong>The</strong>se trends lead to the displacement<br />

<strong>of</strong> high linearity, highly<br />

accurate analog circuits by lower<br />

performance analog circuits. However,<br />

digital signal processing techniques<br />

come to the rescue, resulting<br />

in better performance, at lower<br />

cost and shorter design time.<br />

“Circuit Design in the Year 2012”<br />

will be presented by David Frank<br />

(IBM, TJ Watson, Yorktown Heights,<br />

NY), Hae-Seung Lee (MIT), Marcel<br />

Pelgrom (Philips Research, Eindhoven,<br />

<strong>The</strong> Netherlands) and<br />

Borivoje Nikolic (UC, Berkeley).<br />

This special-topic-session will provide<br />

a thorough overview <strong>of</strong> special<br />

circuit design considerations which<br />

will accommodate sub-32nm device<br />

idiosyncrasies. Four experts will<br />

share their insight into issues confronting<br />

microprocessor and mixedsignal<br />

design in 2012 and <strong>of</strong>fer<br />

potential solutions.<br />

Short Course for Entry-Level and<br />

Experienced Nanometer CMOS<br />

Designers<br />

A Short Course organized by Ian<br />

Galton entitled “Analog, Mixed-Signal<br />

and RF Circuit Design in<br />

Nanometer CMOS” will be <strong>of</strong>fered<br />

twice, with staggered starting times.<br />

Instructors Matt Miller (Freescale<br />

76 <strong>IEEE</strong> SSCS NEWSLETTER Winter 2007

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!