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tesi R. Miscioscia.pdf - EleA@UniSA

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Chapter 4 135<br />

μ (cm 2 V -1 s -1 )<br />

1.0<br />

0.8<br />

0.6<br />

0.4<br />

0.2<br />

0.0<br />

-0.2<br />

μ(W g ) = - 0.27 + 0.87 W g<br />

After Esseni's I ch extraction<br />

0.2 0.4 0.6 0.8 1.0 1.2 1.4<br />

Lateral grain size (μm)<br />

figure 19: extrapolation of a linear trend from the field-effect mobilities versus mean pentacene<br />

grain dimensions for polymeric dielectrics-based OTFTs (black symbols). Red squares are<br />

PFTEOS:TEOS samples mobilities.<br />

As we can observe in figure 19, the mobility trend in samples<br />

having polymeric dielectric is strongly dependent from channel’s<br />

morphology but also the anomaly of PFTEOS:TEOS samples is still<br />

evident if we remind figure 13.<br />

By interpolating all the symbols but the red ones (the first on<br />

the left and the last on the right in the plot), we obtained an estimation<br />

line for transistor’s performances as the channel film morphology<br />

changes.<br />

The major differences introduced by Ich estimation are, instead,<br />

evident in thermal analyses that allow now to distinguish some<br />

important features of PFTEOS:TEOS samples in comparison with<br />

PMMA samples.<br />

Looking at figure 20, we see that the activation energy curves<br />

are now more separated and denote the dependence of the thermal<br />

activation from thickness and nature of gate dielectric in OTFTs. They<br />

still keep the usual decreasing behavior with the gate field intensity

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