tesi R. Miscioscia.pdf - EleA@UniSA

66 State of the Art
figure 35: AFMP measure on a TC-OTFT pentacene based device [42]; close to the contacts it is
evident the effect of the Schottky barrier and the damage caused by the deposition of the metal
contacts.
As already mentioned, it 'also important to note the reasons
that cause a drastically different behaviors for the metal contacts
depending on whether they are used in BC or TC topologies.
From the physical point of view, an analysis similar to the one
already seen, the KFM (Kelvin Probe Force Microscopy), is also
useful in this direction as shown by Puntambekar, Pesavento and
Frisbie [44] in a comparison of potential profiles expressed by
structures bottom-contacts and top-contacts-contacts respectively
(figure 36).