tesi R. Miscioscia.pdf - EleA@UniSA
tesi R. Miscioscia.pdf - EleA@UniSA
tesi R. Miscioscia.pdf - EleA@UniSA
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Chapter 2 51<br />
In figure 17 the improvements introduced by state-of-the –art<br />
surface treatments in the case of n-type and p-type OFETs fabricated<br />
on a SiO2 gate dielectric.<br />
figure 17: Self-Assembled Monolayer (SAM) surface treatments on SiO2 performed on P5<br />
(pentacene) and C60 as reported by [33]<br />
In particular, deposition treatments of Self-Assembled<br />
Monolayers (since now: SAM) made by NH2, CH3 and F are shown in<br />
figure 17.<br />
Not less important is the action of the SAM on the threshold<br />
voltages of the same OTFT as shown by Kobayashi remarked before.<br />
In the abovementioned works of Veres et al. on surface<br />
treatments[32], it can be noticed a clear relationship between changes<br />
in surface energy of the insulator and the mobility obtained in P3HT<br />
(see also figure 18).