1Gb: x8, x16 Automotive DDR2 SDRAM - Micron
1Gb: x8, x16 Automotive DDR2 SDRAM - Micron
1Gb: x8, x16 Automotive DDR2 SDRAM - Micron
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
Table 10: <strong>DDR2</strong> I DD Specifications and Conditions (Die Revision H) (Continued)<br />
Notes: 1–7 apply to the entire table<br />
-25E/ -3E/<br />
Parameter/Condition Symbol Configuration -25 -3 Units<br />
Operating burst read current: All banks open,<br />
continuous burst reads, IOUT = 0mA; BL = 4, CL = CL<br />
(IDD), AL = 0; tCK = tCK (IDD), tRAS = t IDD4R <strong>x8</strong> 120 110 mA<br />
RAS MAX (IDD), tRP = tRP (IDD); CKE is HIGH, CS# is HIGH between<br />
valid commands; Address bus inputs are switching;<br />
Data bus inputs are switching<br />
<strong>x16</strong> 150 125<br />
Burst refresh current: t CK = t CK (I DD); REFRESH<br />
command at every t RFC (I DD) interval; CKE is HIGH,<br />
CS# is HIGH between valid commands; Other control<br />
and address bus inputs are switching; Data bus<br />
inputs are switching<br />
Self refresh current: CK and CK# at 0V; CKE ≤<br />
0.2V; Other control and address bus inputs are<br />
floating; Data bus inputs are floating<br />
Operating bank interleave read<br />
current: All bank interleaving reads, IOUT = 0mA; BL<br />
= 4, CL = CL (IDD), AL = tRCD (IDD) - 1 × tCK (IDD); tCK = tCK (IDD), tRC = tRC (IDD), tRRD = tRRD (IDD), tRCD =<br />
tRCD (IDD); CKE is HIGH, CS# is HIGH between valid<br />
commands; Address bus inputs are stable during deselects;<br />
Data bus inputs are switching; See on page<br />
for details<br />
IDD5 <strong>x8</strong> 145 140 mA<br />
<strong>x16</strong> 150 145<br />
IDD6 <strong>x8</strong>, <strong>x16</strong> 7 7 mA<br />
IDD6L 5 5<br />
IDD7 <strong>x8</strong> 210 185 mA<br />
<strong>x16</strong> 260 230<br />
Notes: 1. I DD specifications are tested after the device is properly initialized. 0°C ≤ T C ≤ +85°C.<br />
2. V DD = 1.8V ±0.1V, V DDQ = 1.8V ±0.1V, V DDL = 1.8V ±0.1V, V REF = V DDQ/2.<br />
3. I DD parameters are specified with ODT disabled.<br />
4. Data bus consists of DQ, DM, DQS, DQS#, RDQS, RDQS#, LDQS, LDQS#, UDQS, and<br />
UDQS#. I DD values must be met with all combinations of EMR bits 10 and 11.<br />
5. Definitions for I DD conditions:<br />
LOW V IN ≤ V IL(AC)max<br />
HIGH VIN ≥ VIH(AC)min Stable Inputs stable at a HIGH or LOW level<br />
Floating Inputs at VREF = VDDQ/2 Switching Inputs changing between HIGH and LOW every other clock cycle (once per<br />
two clocks) for address and control signals<br />
Switching Inputs changing between HIGH and LOW every other data transfer (once<br />
per clock) for DQ signals, not including masks or strobes<br />
6. IDD1, IDD4R, and IDD7 require A12 in EMR to be enabled during testing.<br />
7. The following IDD values must be derated (IDD limits increase) on IT-option and AT-option<br />
devices when operated outside of the range 0°C ≤ TC ≤ 85°C:<br />
When<br />
T C ≤ 0°C<br />
<strong>1Gb</strong>: <strong>x8</strong>, <strong>x16</strong> <strong>Automotive</strong> <strong>DDR2</strong> <strong>SDRAM</strong><br />
Electrical Specifications – I DD Parameters<br />
I DD2P and I DD3P(SLOW) must be derated by 4%; I DD4R and I DD5W must be derated<br />
by 2%; and I DD6 and I DD7 must be derated by 7%<br />
PDF: 09005aef840eff89<br />
1gbddr2_ait_aat.pdf – Rev. C 7/11 EN 25 <strong>Micron</strong> Technology, Inc. reserves the right to change products or specifications without notice.<br />
� 2010 <strong>Micron</strong> Technology, Inc. All rights reserved.