ICMCTF 2012! - CD-Lab Application Oriented Coating Development

2011/12, discuss ideas and priorities for future work, and generate new co-operative action. Current projects
include evaluation of the performance of scratch testing and indentation testing and results will be reported that are
being fed into International Standards (ISO) for those tests.
All are warmly welcomed, especially those interested in co-operative action to generate data that would support
new methods and standards in this field.
VAMAS Technical Working Area 22 addresses pre-standardization needs in the general area of test method development
and evaluation for the measurement of the mechanical properties of small volumes of materials, in particular
thin films and coatings on substrates. Activities cover nano-mechanical measurement methods to determine the
mechanical properties of surfaces, and the films or coatings themselves, as well as larger scale test methods to
evaluate the performance of coating/substrate systems as a whole. Membership is open to all and the adopted activities
are those that attract sufficient international partners willing to work together for the common goal.
Wednesday, April 25, 2012, 4:30 – 5:30 pm Pacific Salon 1-2
Advanced 3-D Nano and Micro Scratch Testing of
Thin Films with In-line Imaging
Dr. Norm Gitis
STLE Fellow and Chair of STLE Committee on Tribotesting
Vice President of Bruker Nano Inc.
Advanced 3-D scratch-adhesion tests are proposed, based on synchronization of X and Y stages and implementation
of 3-D sensors that monitor simultaneously the normal load and lateral forces in all directions, while the software
automatically calculates the actual friction coefficient in real time. The scratch depth is continuously
monitored with an integrated capacitance sensor. The in-line imaging is performed via optical microscope with a
digital camera, producing panoramic photos in the same file with friction, load, and acoustic data. Optionally, it is
done with an advanced optical profiler (for micro-scratches) or AFM (for nano-scratches), all fully integrated in the
CETR-APEX world-leading testing platform. All the motions of the test specimen between the microscope,
profiler, and AFM are done automatically, based on the precision factory calibration of distances.
Examples of impressive test results are presented and discussed for ultra-thin and relatively-thick films of various
hard and soft materials.
This session is intended to deepen the audience’s knowledge of the thin-film and coatings high-end metrology.
Please visit Bruker Nano Inc. Booth #212 in the Exhibit Hall.
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