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ICMCTF 2012! - CD-Lab Application Oriented Coating Development

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Advanced Characterization of <strong>Coating</strong>s and Thin Films<br />

Room: Sunrise - Session TS2-2<br />

Advanced Characterization of <strong>Coating</strong>s and Thin Films<br />

Moderators: F. Giuliani, Imperial College London - South Kensington<br />

Campus, UK, S. Korte, University of Erlangen-Nürnberg, Germany, P.<br />

Schaaf, TU Ilmenau, Germany<br />

1:30 pm TS2-2-1<br />

Testing of mechanical thin film properties by vibrating Micro-<br />

Electromechanical Systems (MEMS), P. SCHAAF, R. GRIESLER, J. KLAUS, M.<br />

STUBENRAUCH, K. TONISCH, J. PEZOLDT, S. MICHAEL, TU Ilmenau, Germany<br />

1:50 pm TS2-2-2<br />

A New FIB-DIC Material Removal Method for Poisson’s Ratio and<br />

Residual Stress Measurement in thin films, M. SEBASTIANI, University of Rome<br />

"Roma Tre", Italy, E. BEMPORAD, F. CARASSITI, University of Rome “Roma Tre”, Italy<br />

2:10 pm TS2-2-3<br />

Low temperature deformation in complex crystals, V. SCHNABEL, University of<br />

Cambridge, UK, S. KORTE, Gordon <strong>Lab</strong>oratory, Department of Materials Science and<br />

Metallurgy, University of Cambridge, UK, C. WALTER, R. STEARN, W. CLEGG, University of<br />

Cambridge, UK<br />

2:30 pm TS2-2-4<br />

Carbon-Based <strong>Coating</strong> for Flexible Fabric Heater Prepared by Arc Ion<br />

Plating, C.C. HSU, C.M. CHEN, J.L. HE, Feng Chia University, Taiwan<br />

2:50 pm TS2-2-5 Invited<br />

Kinetics of Thin Film Growth and Gas-Solid Reactions using in situ High-<br />

Temperature Scanning Tunneling Microscopy, S. KODAMBAKA, Y. MURATA,<br />

University of California, Los Angeles, US, V. PETROVA, I. PETROV, University of Illinois at<br />

Urbana-Champaign, US<br />

3:10 pm Invited talk continued.<br />

3:30 pm TS2-2-7<br />

In-situ AFM studies of crack initiation in ultra-thin SiOx films on polymer<br />

substrates., B. OZKAYA, University of Paderborn, Germany, S. STEVES, Ruhr<br />

Universität Bochum, Germany, C.N. LIU, O. OZCAN, University of Paderborn, Germany, P.<br />

AWAKOWICZ, Ruhr Universität Bochum, Germany, G. GRUNDMEIER, University of<br />

Paderborn, Germany<br />

3:50 pm TS2-2-8<br />

High Frequency Characterization of Screen-printed Silver Circuits with<br />

an Environmental Reliability Test, K.S. KIM, W.R. MYUNG, S.B. JUNG,<br />

Sungkyunkwan University, Republic of Korea<br />

4:10 pm TS2-2-10<br />

The Bipolar Resistance Switching Behavior with a Pt/CoSiOX/TiN<br />

Structure of Nonvolatile Memory Device, Y.E. SYU, National Sun Yat-Sen<br />

University, Taiwan, G.W. CHANG, National Chiao Tung University, Taiwan<br />

4:30 pm TS2-2-11<br />

A low-temperature method to improve the performance of Ni: SiO2 -<br />

based nonvolatile memory by supercritical CO2 fluid, S.L. CHUANG, National<br />

Sun Yat-Sen University, Taiwan<br />

4:50 pm TS2-2-12<br />

Resistive switching characteristics induced by doping of Sn in SiO2based<br />

nonvolatile memory, T.M. TSAI, K.C. CHANG, T.C. CHANG, Y.E. SYU, D.S.<br />

GAN, National Sun Yat-Sen University, Taiwan<br />

5:10 pm<br />

Monday Afternoon, April 23, <strong>2012</strong><br />

Welcome Mixer<br />

6:00 – 7:30 pm<br />

Golden Foyer and the Lion Fountain Patio<br />

Sponsored by Oerlikon Balzers<br />

TS-9<br />

VAMAS TWA 22 Annual General Meeting<br />

Mechanical Property Measurements of Thin Films and <strong>Coating</strong>s<br />

Royal Palm 1-3 5:30 – 6:30 pm

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