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Preparatory Notes for ASNT NDT Level III Examination - Ultrasonic Testing, UT

Preparatory Notes for ASNT NDT Level III Examination - Ultrasonic Testing

Preparatory Notes for ASNT NDT Level III Examination - Ultrasonic Testing

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Rather than go into the details of this <strong>for</strong>mulation, a few fundamental<br />

relationships can be pointed out. The signal-to-noise ratio (S/N), and<br />

there<strong>for</strong>e, the detectability of a defect:<br />

1. Increases with increasing flaw size (scattering amplitude). The detectability<br />

of a defect is directly proportional to its size.<br />

2. Increases with a more focused beam. In other words, flaw detectability is<br />

inversely proportional to the transducer beam width.<br />

3. Increases with decreasing pulse width (delta-t). In other words, flaw<br />

detectability is inversely proportional to the duration of the pulse (∆t)<br />

produced by an ultrasonic transducer. The shorter the pulse (often higher<br />

frequency), the better the detection of the defect. Shorter pulses<br />

correspond to broader bandwidth frequency response. See the figure<br />

below showing the wave<strong>for</strong>m of a transducer and its corresponding<br />

frequency spectrum.

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