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Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

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independent measurements of electron relaxation using, for examples, a TAexperiment [39].In Fig. 10, we compare TA and PL dynamics for ZnS-overcoated CdSeNQDs with R = 1.2 nm. Both traces show initial fast picosecond decayfollowed <strong>by</strong> much slower nanosecond relaxation. The magnitude of the fastTA component, which is likely due to electron surface trapping (discussedearlier), f25% of the signal amplitude, and its relaxation time is f10 ps. Thefast component in the PL trace is significantly greater in amplitude (f70%)and shows much faster initial decay (f2 ps). This difference in PL and TAtemporal behavior is typical for CdSe NQDs and is even more pronounced inthe case of TOPO-passivated samples, which show a greater ratio between thefast PL and TA components than ZnS-overcoated samples. The difference inTA and PL dynamics indicates that temporal evolution of PL signals isdominated not <strong>by</strong> electrons but <strong>by</strong> holes. The comparison of initial decayconstants for TA and PL shows that hole trapping is significantly faster thanelectron trapping. Additionally, the fact that the fast PL component isFigure 10 Comparison of 1S bleaching (squares) and PL (circles) dynamics recordedfor ZnS-overcoated CdSe NQDs of 1.2-nm radius.<strong>Copyright</strong> <strong>2004</strong> <strong>by</strong> <strong>Marcel</strong> <strong>Dekker</strong>, <strong>Inc</strong>. <strong>All</strong> <strong>Rights</strong> <strong>Reserved</strong>.

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