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Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

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Figure 8 The gold nanocrystal film shown on the left was prepared <strong>by</strong> drop-casting aconcentrated dispersion onto a polymer window. A penny is shown on the right toillustrate the typical size of the film studied <strong>by</strong> SAXS.C. Nanocrystal Thin FilmsSmall-angle x-ray scattering is an ideal tool to characterize condensed nanocrystalfilms, as it probes a relatively large region of sample and provides anaveraged value of the structural order and symmetry of the superlattice, orglassy structure. Because P( q) can be measured directly from dispersions,Figure 9 (a) Small-angle scattering data from a dispersion of gold nanocrystals(R = 2.75 nm F 10%) in hexane (curve A) and diffraction pattern from a thin film ofthe dispersion drop-cast onto a polymer substrate (curve B). The structure factor[S( q)] (curve C) is determined from the diffraction pattern. (b) The correspondingradial distribution function [ g(r)] for the thin film is calculated from a Fouriertransformation of S( q).<strong>Copyright</strong> <strong>2004</strong> <strong>by</strong> <strong>Marcel</strong> <strong>Dekker</strong>, <strong>Inc</strong>. <strong>All</strong> <strong>Rights</strong> <strong>Reserved</strong>.

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