11.07.2015 Views

Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

Copyright 2004 by Marcel Dekker, Inc. All Rights Reserved.

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

66. Su, B.; Goldman, V.J.; Cunningham, J.E. Phys. Rev. B 1992, 46, 7664.67. Vdovin, E.E., et al. Science 2000, 290, 122.68. Crommie, M.F.; Lutz, C.P.; Eigler, D.M. Science 1993, 262, 218.69. Venema, L.C., et al. Science 1999, 283, 52.70. Pan, S.H.; Hudson, E.W.; Lang, K.M.; Eisaki, H.; Uchida, S.; Davis, J.C.Nature 2000, 403, 746.71. Grandidier, B., et al. Phys. Rev. Lett. 2000, 85, 1068.72. Millo, O.; Katz, D.; Cao, Y-W.; Banin, U. Phys. Rev. Lett. 2001, 86, 5751.73. Wolf, E.L. Principles of Electron Tunneling Spectroscopy; Oxford UniversityPress: Oxford, 1989.74. Wiesendanger, R. Scanning Probe Microscopy and Spectroscopy; CambridgeUniversity Press: London, 1994.75. Colvin, V.L.; Goldstein, A.N.; Alivisatos, A.P. J. Am. Chem. Soc. 1992, 114,5221.76. Efros, A.L.; Rosen, M. Annu. Rev. Phys. Chem. 2000, 30, 475.77. Rabani, E.; Hetenyi, B.; Berne, B.J.; Brus, L.E. J. Chem. Phys. 1999, 110, 5355.78. Franceschetti, A.; Fu, H.; Wang, L.W.; Zunger, A. Phys. Rev. B 1999, 60, 1819.79. Zunger, A. MRS Bull. 1998, 23, 35.80. Franceschetti, A.; Zunger, A. Phys. Rev. B 2000, 62, 2614.81. Franceschetti, A.; Zunger, A. Appl. Phys. Lett. 2000, 76, 1731.82. Niquet, Y.M.; Delerue, C.; Lannoo, M.; <strong>All</strong>an, G. Phys. Rev. B 2001, 64, 3305.83. Lifshitz, E.; Glozman, A.; Litvin, I.D.; Porteanu, H. J. Phys. Chem. B 2000,104, 10,449.84. Millo, O.; Katz, D.; Cao, Y.W.; Banin, U. J. Low Temp. Phys. 2000, 118, 365.85. Alperson, B.; Hodes, G.; Rubinstein, I.; Porath, D.; Millo, O. Appl. Phys. Lett.1999, 75, 1751.86. Terrill, R.H.; Postlethwaite, T.A.; Chen, C-H.; Poon, C-D.; Terzis, A.; Chen,A.; Hutchison, J.E.; Clark, M.R.; Wignall, G.; Londono, J.D.; Superfine, R.;Falvo, M.; Johnson, C.S.; Samulski, E.T.; Murray, R.W. J. Am. Chem. Soc.1995, 117, 12,537.87. Schlamp, M.C.; Peng, X.G.; Alivisatos, A.P. J. Appl. Phys. 1997, 82, 5837.88. Mattoussi, H.; Radzilowski, L.H.; Dabbousi, B.O.; Thomas, E.L.; Bawendi,M.G.; Rubner, M.F. J. Appl. Phys. 1998, 83, 7965.89. Kuno, M.; Lee, J.K.; Dabbousi, B.O.; Mikulec, F.V.; Bawendi, M.G. J. Chem.Phys. 1997, 106, 9869.90. Schooss, D., et al. Phys. Rev. B 1994, 49, 17,072.<strong>Copyright</strong> <strong>2004</strong> <strong>by</strong> <strong>Marcel</strong> <strong>Dekker</strong>, <strong>Inc</strong>. <strong>All</strong> <strong>Rights</strong> <strong>Reserved</strong>.

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!