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Scientific and Technical Aerospace Reports Volume 38 July 28, 2000

Scientific and Technical Aerospace Reports Volume 38 July 28, 2000

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This paper presents a physics-based model describing the current-induced formation of a parasitic barrier in the conduction<br />

b<strong>and</strong> at the base collector heterojunction in npn SiGe heterojunction bipolar transistors (HBTs). Due to the valence b<strong>and</strong> discontinuity<br />

DELTA E(sub v), hole injection into the collector at the onset of base pushout is impeded, which gives rise to formation of<br />

a barrier to electron transport which degrades the device’s high frequency performance. In this paper, we present results from an<br />

analytical model for the height of the barrier calculated from the device’s structure as a function of the collector junction bias <strong>and</strong><br />

collector current density.<br />

Author<br />

Bipolar Transistors; Conduction B<strong>and</strong>s; Heterojunctions; Silicon; Germanium; Electrophysics; Semiconductor Devices; Barrier<br />

Layers<br />

<strong>2000</strong>0063515 National Inst. of St<strong>and</strong>ards <strong>and</strong> Technology, Electronics <strong>and</strong> Electrical Engineering Lab., Gaithersburg, MD USA<br />

NIST Electronics <strong>and</strong> Electrical Engineering Laboratory <strong>and</strong> the Development of Its Semiconductor Program: A Presentation<br />

to the St<strong>and</strong>ards Alumni Association<br />

French, J. C.; Feb. 1999; 58p<br />

Report No.(s): PB<strong>2000</strong>-105433; NISTIR-6507; No Copyright; Avail: CASI; A04, Hardcopy; A01, Microfiche<br />

The report is a Presentation to the St<strong>and</strong>ards Alumni Association by Judson C. French, Director, Electronics <strong>and</strong> Electrical<br />

Engineering Laboratory (EEEL). EEEL’s formal mission is to promote U.S. economic growth through improved competitiveness,<br />

by providing measurement capability of high economic impact focused primarily on the needs of U.S. electronics <strong>and</strong> electrical<br />

equipment industries. EEEL does this by providing measurement research <strong>and</strong> services, principally in the authors’ five technical<br />

divisions. It covers in the Electricity Division the provision of the Nation’s basic, primary electrical st<strong>and</strong>ards, <strong>and</strong> support for<br />

electronic instrumentation, the electrical utilities, video technologies <strong>and</strong> electronic product data exchange, <strong>and</strong>, covers in the<br />

other divisions, semiconductor electronics, radio-frequency <strong>and</strong> microwave <strong>and</strong> millimeter wave signals <strong>and</strong> interference, superconductors,<br />

magnetics, <strong>and</strong> optoelectronics.<br />

NTIS<br />

Electrical Engineering; Semiconductors (Materials); Superconductors (Materials); Product Development<br />

<strong>2000</strong>0064047 Georgia Inst. of Tech., Atlanta, GA USA<br />

Process Characterization of Non-Stoichiometric Material Growth Final Report, 1 Jun. 1996 - 31 May 1999<br />

Brown, April S.; May, Gary; May 1999; 12p; In English<br />

Contract(s)/Grant(s): F49620-96-1-0197<br />

Report No.(s): AD-A376202; FR-3; AFRL-SR-BL-TR-00-0119; No Copyright; Avail: CASI; A01, Microfiche; A03, Hardcopy<br />

This project addresses characterization of the Molecular Beam Epitaxy (MBE) process utilizing a Statistical Experiment<br />

Design (SED) approach <strong>and</strong> then building models. This approach is applied to GaAs-based materials, InP-based materials, <strong>and</strong><br />

GaN-based materials, <strong>and</strong> to non-stoichiometric Be-doping InGaAs materials. The model responses are related to known physical<br />

effects for the growth of these materials. In addition, new phenomena are uncovered.<br />

DTIC<br />

Molecular Beam Epitaxy; Experiment Design<br />

<strong>2000</strong>0064117 Joint Inst. for Nuclear Research, Frank Lab. of Neutron Physics, Dubna, USSR<br />

Twinned structure of La2CuO4 crystals<br />

Balagurov, A. M.; Beskrovnyj, A. I.; Pomyakushin, V.; Simkin, V. G.; Bagautdinov, B.; Dec. 31, 1998; 19p; In Russian; In English<br />

Report No.(s): DE99-608002; JINR-R-14-98-9; No Copyright; Avail: Department of Energy Information Bridge<br />

The twin microstructure of La2CuO(4+(delta)) superconducting crystals with (delta) from 0.02 to 0.04 has been studied by<br />

neutron <strong>and</strong> x-ray scanning of reciprocal space as well as by high resolution neutron diffraction. The studied crystals belonged<br />

to two different types with respect to the oxygen mobility: with <strong>and</strong> without macroscopic phase separation. It has been shown that<br />

for both types of crystals the twinning is accompanied by arising of practically the same systems of domains (transformational<br />

twins). Configuration of the domains is so, that the boundaries between them are mainly coherent. In the macroscopically phase<br />

separated La2CuO(4+(delta)) crystals the volume of distorted <strong>and</strong> tense areas is most probably small, that would be the factor,<br />

which furthers to oxygen diffusion.<br />

NTIS<br />

Twinning; Crystal Lattices; Microstructure; Crystal Structure<br />

204

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