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Advances in Fingerprint Technology.pdf

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Traur<strong>in</strong>g Model (1963)<br />

Description of the Traur<strong>in</strong>g Model<br />

Discussion of the Traur<strong>in</strong>g Model<br />

K<strong>in</strong>gston Model (1964)<br />

Description of the K<strong>in</strong>gston Model<br />

Probability of the Observed Number of M<strong>in</strong>utiae<br />

Probability of the Observed Position<strong>in</strong>g of M<strong>in</strong>utiae<br />

Probability of the Observed M<strong>in</strong>utiae Types<br />

Overall Probability of a Given Configuration<br />

Chances of False Association<br />

Discussion of the K<strong>in</strong>gston Model<br />

Osterburg Model (1977–1980)<br />

Description of the Osterburg Model<br />

Discussion of the Osterburg Model<br />

Stoney and Thornton Model (1985–1989)<br />

Model Features Proposed by Stoney and Thornton<br />

Ridge Structure and Description of M<strong>in</strong>utia Location<br />

Description of M<strong>in</strong>utia Distribution<br />

Orientation of M<strong>in</strong>utiae<br />

Variation <strong>in</strong> M<strong>in</strong>utia Type<br />

Variation among Pr<strong>in</strong>ts from the Same Source<br />

Number of Position<strong>in</strong>gs and Comparisons<br />

Description of the Stoney and Thornton Model<br />

M<strong>in</strong>utia Description and Survey<br />

Statistical Analysis and F<strong>in</strong>d<strong>in</strong>gs<br />

Discussion of the Stoney and Thornton Model<br />

Champod and Margot Model (1995–1996)<br />

Description of the Champod and Margot Model<br />

Experimental Design<br />

Statistical Analysis and F<strong>in</strong>d<strong>in</strong>gs<br />

Conclusion<br />

Discussion of the Champod and Margot Model<br />

Meagher, Budowle, and Ziesig Model (1999)<br />

Description of the Meagher, Budowle, and Ziesig Model<br />

The First Experiment, Based on Inter-compar<strong>in</strong>g Records<br />

of Rolled F<strong>in</strong>gerpr<strong>in</strong>ts<br />

The Second Experiment, Based on Compar<strong>in</strong>g Subsets<br />

of the Records with the Same Complete Records<br />

Discussion of the Meagher, Budowle, and Ziesig Model<br />

Conclusions<br />

References

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