FLK Gas Sampling System - MPIP - Free
FLK Gas Sampling System - MPIP - Free
FLK Gas Sampling System - MPIP - Free
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SQ250 <strong>FLK</strong> <strong>Gas</strong> <strong>Sampling</strong> <strong>System</strong><br />
The different design versions of the system also contribute to optimized operation. Figure 2 shows the circuits for the analysis<br />
gas and for the compressed air for cleaning the gas sampling pipe and the dedusting filter. Figure 3 shows the coolant circuit<br />
for cooling the gas sampling probe.<br />
Fig. 2 <strong>Gas</strong> circuit for sampling device<br />
Legends:<br />
1 <strong>Gas</strong> sampling probe<br />
2 <strong>Gas</strong> sampling opening<br />
3 Coolant connection<br />
4 Retraction device<br />
5 Dedusting filter<br />
6 Valve combination<br />
7 Control cabinet for controller<br />
8 Installation pipe<br />
9 Valve for blowing dust return<br />
10 Local control box<br />
11 Flash light for process warning<br />
12 Horn for process warning<br />
13 Emergency-stop button<br />
14 Control Center<br />
71 Compressed air for purging 76 Condensate preseparator<br />
probe<br />
77 Low-pressure switch<br />
72 Compressed air for purging 78 Filter and Water separator<br />
filter<br />
79 Compressed air control valve<br />
73 Compressed air inlet<br />
80 Condensate output<br />
74 Dust-free measurement gas 81 Measuring gas line to analyzer cabinet<br />
75 Four-way motorized valve 82 Dust-laden measuring gas<br />
83 Control cable<br />
84 Control cable for pump controller and<br />
fault signals to analyzer cabinet<br />
85 Control cable for retraction device<br />
86 Filter supply cable<br />
The process gas to be analyzed is extracted by the gas sampling probe, cleaned in the electrically heated dedusting filter and<br />
passed to the gas analyzer device. Only a part of the gas flow with a particularly low dust content is extracted due to the<br />
specially formed sampling opening at the tip of the probe.<br />
Copyright ® SIEMENS Page 7 04/04