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NASA Scientific and Technical Aerospace Reports

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3C, 3E, KALPANA-I, GSAT-2&3. In this paper, various ways <strong>and</strong> approaches to achieve this kind of a software system have<br />

been explored <strong>and</strong> presented.<br />

Author<br />

Ground Operational Support System; Computer Programs; Low Earth Orbits; Satellite Orbits<br />

23<br />

CHEMISTRY AND MATERIALS (GENERAL)<br />

Includes general research topics related to the composition, properties, structure, <strong>and</strong> use of chemical compounds <strong>and</strong> materials as they<br />

relate to aircraft, launch vehicles, <strong>and</strong> spacecraft. For specific topics in chemistry <strong>and</strong> materials see categories 25 through 29. For<br />

astrochemistry see category 90 Astrophysics.<br />

20060002199 National Renewable Energy Lab., Golden, CO USA<br />

XPS <strong>and</strong> UPS Investigation of NH4OH-Exposed Cu(In,Ga)Se2 Thin Films<br />

Perkins, C. L.; Hasoon, F. S.; Al-Thani, H. A.; Asher, S. E.; Sheldon, P.; Feb. 2005; 12 pp.; In English<br />

Report No.(s): DE2005-15016463; NREL/CP-520-37419; No Copyright; Avail.: Department of Energy Information Bridge<br />

Photoelectron spectroscopy was used to determine the compositional <strong>and</strong> electronic changes occurring in Cu(In,Ga)Se2<br />

thin films as a result of immersion in aqueous ammonia solution. We find that NH4OH-treated CIGS surfaces are preferentially<br />

etched of indium <strong>and</strong> gallium, resulting in the formation of a thin layer of a degenerate Cu-Se compound that we tentatively<br />

identify as Cu(sub 2)Se. The work function of ammonia-treated samples is found to increase by 0.6 eV relative to as-grown<br />

CIGS thin films. The uniformity of chemical bath effects (etching & deposition) was found to be improved by the addition<br />

to the bath of a non-ionic surfactant. Initial device results show that the new surfactant-based chemical bath deposition (CBD)<br />

method may lead to better <strong>and</strong> thinner CdS buffer layers.<br />

NTIS<br />

Ammonia; Photoelectron Spectroscopy; Thin Films; X Ray Spectroscopy<br />

20060002207 National Renewable Energy Lab., Golden, CO USA<br />

a-SiGe:H Materials <strong>and</strong> Devices Deposited by Hot Wire CVD Using a Tantalum Filament Operated at Low<br />

Temperature<br />

Mahan, A. H.; Xu, Y.; Gedvilas, L. M.; Reedy, R. C.; Branz, H. M.; Feb. 2005; 12 pp.; In English<br />

Report No.(s): DE2005-15016498; NREL/CP-520-37475; No Copyright; Avail.: National <strong>Technical</strong> Information Service<br />

(NTIS)<br />

We report the deposition of improved hydrogenated amorphous silicon germanium (a-SiGe:H) films by the hot wire CVD<br />

(HWCVD) technique using a tantalum filament operating at a low temperature. We gauge the material quality of the a-SiGe:H<br />

films by comparing infrared, small angle X-ray scattering (SAXS), photocapacitance, <strong>and</strong> conductivity measurements to<br />

earlier results, <strong>and</strong> fabricate single-junction n-i-p solar cell devices using these i-layers.<br />

NTIS<br />

Deposition; Low Temperature; Tantalum; Vapor Deposition; Vapors; Wire<br />

20060002219 Idaho National Engineering Lab., Idaho Falls, ID, USA, Khlopin Radium Inst., Saint Petersburg, Russia,<br />

Academy of Sciences (USSR), Novosibirsk, USSR<br />

Fundamental UNEX Chemistry<br />

Herbst, R. S.; Peterman, D. R.; Luther, T. A.; Garn, T. G.; Jan. 2005; 22 pp.; In English<br />

Report No.(s): DE2005-841393; No Copyright; Avail.: National <strong>Technical</strong> Information Service (NTIS)<br />

This presentation was given at the DOE Office of Science-Environmental Management Science Program (EMSP)<br />

High-Level Waste Workshop held on January 19-20, 2005 at the Savannah River Site.<br />

NTIS<br />

Environment Management; Management Methods<br />

20060002227 California Univ., Lawrence Berkeley National Lab., Berkeley, CA, USA<br />

Technetium Chemistry in Waste Environments<br />

Jan. 20, 2005; 20 pp.; In English<br />

Report No.(s): DE2005-841418; No Copyright; Avail.: National <strong>Technical</strong> Information Service (NTIS)<br />

This presentation was given at the DOE Office of Science-Environmental Management Science Program (EMSP)<br />

33

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