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Callister - An introduction - 8th edition

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18.12 The Temperature Dependence of Carrier Concentration • 741<br />

Electron concentration (m –3 )<br />

Temperature (°C)<br />

3 × 10 21 –200 –100 0 100 200 300<br />

2 × 10 21<br />

1 × 10 21<br />

Freeze-out<br />

region<br />

Extrinsic region<br />

Intrinsic<br />

region<br />

n i<br />

Figure 18.17 Electron<br />

concentration versus<br />

temperature for silicon<br />

(n-type) that has been doped<br />

with 10 21 m 3 of a donor<br />

impurity, and for intrinsic<br />

silicon (dashed line). Freezeout,<br />

extrinsic, and intrinsic<br />

temperature regimes are<br />

noted on this plot. (From<br />

S. M. Sze, Semiconductor<br />

Devices, Physics and<br />

Technology. Copyright © 1985<br />

by Bell Telephone Laboratories,<br />

Inc. Reprinted by permission of<br />

John Wiley & Sons, Inc.)<br />

0<br />

0 100 200 300 400 500 600<br />

Temperature (K)<br />

intermediate temperatures (between approximately 150 K and 475 K) the material<br />

is n-type (inasmuch as P is a donor impurity), and electron concentration is constant;<br />

this is termed the “extrinsic-temperature region”. 7 Electrons in the conduction band<br />

are excited from the phosphorus donor state (per Figure 18.13b), and because the<br />

electron concentration is approximately equal to the P content (10 21 m 3 ), virtually<br />

all of the phosphorus atoms have been ionized (i.e., have donated electrons). Also,<br />

intrinsic excitations across the band gap are insignificant in relation to these extrinsic<br />

donor excitations. The range of temperatures over which this extrinsic region<br />

exists will depend on impurity concentration; furthermore, most solid-state devices<br />

are designed to operate within this temperature range.<br />

At low temperatures, below about 100 K (Figure 18.17), electron concentration<br />

drops dramatically with decreasing temperature and approaches zero at 0 K. Over<br />

these temperatures, the thermal energy is insufficient to excite electrons from the<br />

P donor level into the conduction band. This is termed the “freeze-out temperature<br />

region” inasmuch as charged carriers (i.e., electrons) are “frozen” to the dopant atoms.<br />

Finally, at the high end of the temperature scale of Figure 18.17, electron concentration<br />

increases above the P content and asymptotically approaches the intrinsic<br />

curve as temperature increases. This is termed the intrinsic temperature region because<br />

at these high temperatures the semiconductor becomes intrinsic; that is, charge<br />

carrier concentrations resulting from electron excitations across the band gap first<br />

become equal to and then completely overwhelm the donor carrier contribution<br />

with rising temperature.<br />

Concept Check 18.6<br />

On the basis of Figure 18.17, as dopant level is increased would you expect the temperature<br />

at which a semiconductor becomes intrinsic to increase, to remain essentially<br />

the same, or to decrease? Why?<br />

[The answer may be found at www.wiley.com/college/callister (Student Companion Site).]<br />

7 For donor-doped semiconductors, this region is sometimes called the saturation region;<br />

for acceptor-doped materials, it is often termed the exhaustion region.

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