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3980xpi Users Manual - Data I/O Corporation

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Glossary<br />

Next Device<br />

Non-default Parameters<br />

Used during serial set programming, this value specifies the next device in the<br />

set. For example, if you are using 8-bit devices and have specified a word<br />

width of 16 bits, it will require two devices to store each 16-bit word.<br />

Depending on the value entered, the data programmed into the next device<br />

will come from either even addresses or odd addresses.<br />

The Non-default parameters screen displays a selected group of parameters on<br />

a parameter entry screen. To display all the available parameters, press F4 to<br />

toggle to the All Parameters screen.<br />

Odd/Even Byte Swap<br />

Used during device operations for 16-bit devices, this option swaps the Most<br />

Significant Bytes (MSB) and the Least Significant Bytes (LSB) of 16-bit words.<br />

The programmer stores RAM data and disk file data with the convention that<br />

the LSB of a 16-bit word resides in the even byte of memory.<br />

Online Help<br />

Available throughout the programmer, the help screens provide you with both<br />

general help and context-sensitive help. The Help screen is divided into four<br />

sections: the key listing, the general help, the specific help, and the reminder<br />

bar.<br />

Output Record Size<br />

The number of data bytes contained in each data record during upload.<br />

Overblow<br />

Overblown Fuse<br />

PAL ®<br />

A condition in which fuses are blown that should not have been.<br />

A fuse that has been over-programmed such that the surrounding area may<br />

have been damaged or such that fuse material splatter was created. Splatter<br />

(or rattlers) can cause intermittent shorting.<br />

An acronym for Programmable Array Logic. PALs are devices with<br />

programmable AND and fixed OR arrays. This is a slightly different architecture<br />

from a PROM or an FPLA. Other examples of PAL-type architectures from other<br />

manufacturers include PEEL and GAL. A registered trademark of Advanced<br />

Micro Devices, Inc.<br />

Parallel Test Vector Application<br />

Use of internal registers to hold and release a full set of test vectors (e.g., 20<br />

for a 10-input 10-output device) at once. In contrast to serial application,<br />

parallel does not require accommodations for clocking contention, and parallel<br />

better matches in-circuit PLD operation and board test suites.<br />

Part Number<br />

The number on the device. For example if you are using an Intel 27C256, the<br />

part number of the device is 27C256.<br />

D-8 <strong>3980xpi</strong>/3980/3900/2900 User <strong>Manual</strong>

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