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FIFTH CANADIAN CONFERENCE ON NONDESTRUCTIVE ... - IAEA

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- 376 -<br />

the instrument is the same for both detectors, the error arising from<br />

misalignment of the specimen surface relative to the center of the<br />

instrument when the instrument is rotated is eliminated (5,6). This is<br />

particularly important for a portable instrument designed to examine<br />

large specimens, because the instrument rotates about the specimen and<br />

providing an accurate center of rotation can be difficult.<br />

ADVANCES IN INSTRUMENTATI<strong>ON</strong> FOR X-RAY STRESS MEASUREMENT<br />

The explosion in the development of solid state electronics in<br />

the past 15 years has resulted in many advances which make it possible<br />

for accurate measurements of stress to be made with a portable instrument.<br />

The new developments include inexpensive, compact but very powerful,<br />

computers, compact solid state high voltage supplies capable of<br />

delivering 100-200 W and stable, accurate electronic circuits for signal<br />

analysis. Very small X-ray tubes have been developed to complement the<br />

solid state power supplies (Fig. 5(a)).<br />

However, the most important advance has been the development of<br />

small position sensitive proportional counters (7). These measure the<br />

distribution of X-ray intensity in one dimension with a resolution of<br />

50-60 um. Detectors as small as 105 x 50 x 50 mm, with an active length<br />

of 50 mm (Fig. 5(b)) and weighing only = 0.6 kg are now commercially<br />

available. A position sensitive proportional counter consists of a fine<br />

wire centered in a chamber filled with Xe-lOJCHij or Ar-10?CHij (Fig.<br />

6(a)). For the counters shown in Fig. 5 the wire is a 25 ym diameter<br />

quartz filament, coated with carbon, which has a resistance of 8 kjj/mm.<br />

The wire is at a high positive voltage relative to the walls of the chamber.<br />

X-rays passing through the chamber ionize the gas causing electron<br />

cascades onto the wire. The voltage pulses observed at each end of the<br />

wire, arising from each cascade, have rise times proportional to RC,<br />

where R is the resistance from the end of the wire to the point of the<br />

electron cascade, and C is the capacitance between the end of the wire<br />

and ground (Fig. 6(b)). The two voltage pulses are shaped and amplified<br />

to produce bipolar pulses whose cross-over times are proportional to the<br />

rise times (Fig. 6(c)). Each cross-over time is marked by a very sharp<br />

voltage pulse, one of which is delayed a constant amount 6 (Fig. 6(d))<br />

so that it always follows the other. Thus, their time separation T is<br />

proportional to the position of the X-ray photon, x, in the counter.<br />

Electronic circuitry to perform this analysis is available commercially.<br />

DESIGN OF THE CANMET PORTABLE STRESS DIFFRACTOMETER<br />

These new technologies have been applied to design a versatile<br />

diffractometer capable of accurate stress measurement by either single<br />

or multiple exposure techniques. The CANMET diffractometer will be suitable<br />

for field use under clement conditions but with sufficient versatility<br />

and accuracy for dedicated laboratory use.

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