Effect of Post Metallization Annealing for La 2 O 3 Thin Film

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21Au/La O / n-Si(100)/Al2 3250 o C depo C.O.PMA 300~450 o C10minN ambience2450 o C400 o C350 o C Ideal V FB300 o C0-1 -0.5 0 0.5 1 1.5Voltage (V)Figure 3-40: The C-V characteristics dependent on the temperature of PMAtreated by chemical oxidationEquivalent Oxide thickness [nm]32.521.51PMAPDAAs-depo.PDAPMAAs-depo.EOT_HF-lastEOT_C.O.0 100 200 300 400 500Annealing temperature [ o C]Figure 3-41: The values of the VFB shift versus annealing temperature plot- 66 -
V Shift [V]FB-0.4-0.5-0.6-0.7-0.8-0.9-1-1.1PDA(HF-last)PMA(HF-last)PDA(C.O.)As-depo.(HF-last)As-depo.(C.O.)PMA(C.O.)VFB Shift_HF-lastVFB Shift_C.O.-1.20 100 200 300 400 500Annealing temperature [ o C]Figure 3-42: The values of the VFB shift versus annealing temperature plotLeakage Current [J/cm 2 ]10 010 -110 -2Leak J_HF-lastLeak J_C.O.As-depo.As-depo.10 -3PMA450PDA40010 -4PMA450PMA40010 -5PMA300PMA400PMA35010 -6PMA300PMA35010 -7 PDA4001.4 1.6 1.8 2 2.2 2.4 2.6Equivalent Oxide Thickness [nm]Figure 3-39: EOT versus leakage current plot- 67 -
Page 2:
CONTENTSChapter 1 Introduction-----
Page 5 and 6:
Chapter 1Introduction-1 -
Page 7 and 8:
Miniaturization with a scaling fact
Page 9 and 10:
Table 1-2: Electrical Properties fo
Page 11 and 12:
LSI fabrication, such as activation
Page 13 and 14:
Table 1-4 shows the properties of t
Page 15 and 16:
1.3 Purpose of My StudyIt is consid
Page 17 and 18:
Chapter 2FabricationAndCharacteriza
Page 19 and 20: 2.1.1 1 Wet Cleaning Method of Sili
Page 21 and 22: 2.1.3 Molecular Beam Deposition (MB
Page 23 and 24: 2.1.4 Rapid Thermal Annealing (RTA)
Page 25 and 26: 2.1.5 Vacuum Evaporation MethodAlum
Page 27 and 28: 1 1 1 t 1 kTC = C + C = εε+ q ε
Page 29 and 30: In C-V curve, the two type of hyste
Page 31 and 32: 2.2.2 Leakage Current Density-Volta
Page 33 and 34: 2.2.3 Ellipsometry MethodEllipsomet
Page 35 and 36: 3.1 IntroductionIn this chapter, th
Page 37 and 38: 3.3 Electrical Characteristics in t
Page 39 and 40: Capacitance (µF/cm 2 )21Al/La O /
Page 41 and 42: Current Density [A/cm 2 ]10 2 10 1A
Page 43 and 44: 3.3.2 Effects of Chemical Oxidation
Page 45 and 46: 3.3.3 Dependence on the Annealing T
Page 47 and 48: Capacitance (µF/cm 2 )210Al_As-dep
Page 49 and 50: Capacitance (µF/cm 2 )210Al/La O /
Page 51 and 52: Al/La O / n-Si(100)/Al2 3 250 o C d
Page 53 and 54: As the summary of this sub-section,
Page 55 and 56: Current Density[A/cm 10 2 PDAAs-de
Page 57 and 58: Equivalent Oxide thickness [nm]32.5
Page 59 and 60: Figure 3-29 shows the plots of VFB
Page 61 and 62: 3.4.1.4 Dependence on the Ambience
Page 63 and 64: V Shift [V]FB0.60.40.20-0.2-0.4-0.6
Page 65 and 66: Capacitance (µF/cm 2 )21PDA 300 o
Page 67 and 68: case of aluminum electrodes as comp
Page 69: 3.4.2.2 Effects of Chemical Oxidati
Page 73 and 74: 2.62.5EOT [nm]2.42.3As-depo.2.2PDA_
Page 75 and 76: Capacitance (µF/cm 2 )21Au_PMA_N2_
Page 77 and 78: 3.4.2.5 The comparison with the cas
Page 79 and 80: 3.4.3 Effects of PMA for Platinum U
Page 81 and 82: 4Pt/La O / n-Si(100)/Al2 3EOT [nm]3
Page 83 and 84: EOT [nm]2.82.62.42.221.81.6Pt/La O
Page 85 and 86: On the other hand, there was almost
Page 87 and 88: V Shift [V]FB0.2Pt/La O / n-Si(100)
Page 89 and 90: Capacitance (µF/cm 2 )21Pt/La O /
Page 91 and 92: Capacitance (µF/cm 2 )21Pt_As-depo
Page 93 and 94: Chapter 4Conclusions- 89 -
Page 95 and 96: 4.1.2 Summary of the Investigation
Page 97 and 98: Table 4-2: Summary of my investigat
Page 99 and 100: esults. The second is the time when
Page 101 and 102: AluminumAl 2 O 3 or LaAlO 3Al Al Al
Page 103 and 104: AcknowledgementIn the first place,
Page 105 and 106: Reference[1] International Technolo
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Effect of Post Metallization Annealing for La 2 O 3 Thin Film

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