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Effect of Post Metallization Annealing for La 2 O 3 Thin Film

Effect of Post Metallization Annealing for La 2 O 3 Thin Film

Effect of Post Metallization Annealing for La 2 O 3 Thin Film

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3.4.2.5 The comparison with the case <strong>of</strong> Aluminum ElectrodesAs a summary <strong>of</strong> PMA with gold upper electrodes, the difference <strong>of</strong>behavior after thermal process was described. The C-V characteristics afterPDA/PMA compared to As-deposition are shown in Figure 3-50 and Figure3-51 respectively. It should be noted that although PDA with aluminumupper electrodes yielded a huge VFB shift toward negative side, PDA withgold upper electrodes almost did not yield any VFB shift. This resultindicates that <strong>La</strong>2O3 thin films might react with aluminum upper electrodesthe moment both came into contact. In the same way, although PMA withaluminum upper electrodes yielded a recovery <strong>of</strong> the VFB shift but also adecrease <strong>of</strong> the capacitance value, PMA with gold upper electrodes yieldedjust a little VFB shift and, on the contrary, an increase <strong>of</strong> the capacitancevalue. From these phenomena, it can be suggested that the choice <strong>of</strong> metalupper electrodes would exert an enormous influence on the electricalcharacteristics regardless <strong>of</strong> PDA or PMA, and the key <strong>of</strong> the solution <strong>of</strong> amatter <strong>of</strong> grave concern with the electrical characteristics <strong>of</strong> <strong>La</strong>2O3 would beincluded in this reaction which recovers VFB shift, but also decrease thecapacitance value.Capacitance (µF/cm 2 )2PDA400 o CAs-depo.Al1PDA400 o CAu0-2 -1 0 1 2Voltage (V)Figure 3-50: The comparison <strong>of</strong> electrical behavior after PDAbetween gold and aluminum upper electrodes.- 73 -

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