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LCLS Conceptual Design Report - Stanford Synchrotron Radiation ...

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7.8.2 Bunch Length Diagnostics<br />

L C L S C O N C E P T U A L D E S I G N R E P O R T<br />

The peak current delivered to the <strong>LCLS</strong> undulator is a critical parameter. It is determined by<br />

both the charge and the final bunch length. To setup the compression, the bunch length needs to<br />

be measured before and after BC1, and after BC2. In addition, once the bunch compressors are<br />

set up, a bunch length feedback system will be required for stabilization of the compression.<br />

These feedback systems have not yet been fully designed.<br />

The bunch lengths of interest are approximately 1000, 200, and 20 µm rms (10, 2, and<br />

0.2 psec full width, respectively). Measuring 10-psec accurately using a streak camera is fairly<br />

standard. The 2-psec measurement is more challenging and probably not reliable. Direct<br />

measurement of the final 0.2-psec bunch is quite a different issue. Bunch length monitors [42]<br />

designed to use coherent synchrotron radiation (CSR) have demonstrated fast, non-invasive<br />

measurements in the <strong>LCLS</strong> regime. They, however, provide a relative bunch length measurement.<br />

Absolute bunch length requires an understanding of the frequency spectrum of the radiation, the<br />

various component attenuation functions, and the CSR process.<br />

7.8.2.1 Transverse RF Deflector<br />

A very promising technique to measure the micro-bunch after BC2 is to use a transverse rf<br />

deflecting cavity. This idea has been used in the past [43], [44] and has been suggested again<br />

recently [45]. The high frequency time variation of the deflecting field is used to ‘pitch’ or ‘yaw’<br />

the electron bunch, while the resulting transverse beam width is measured on a simple profile<br />

monitor (OTR). This is a reliable, single-shot measure of the absolute bunch length. The<br />

technique is completely analogous to a streak camera, but with much better potential resolution.<br />

Detailed studies have been made of this technique [46], including wakefield and chromatic<br />

effects, and recent beam measurements have also been made [47]. As an additional benefit, 2.44-<br />

meter long S-band rf deflecting structures are immediately available at SLAC, where they were<br />

fabricated and tested in the early 1960’s [48]. A cut-away view of the S-band traveling-wave rf-<br />

deflector is shown in Figure 7.63.<br />

The bunch length, σz, can be calculated from knowledge of the deflecting voltage, V0, the rf<br />

wavelength, λrf, and the beam energy at the screen, Es.<br />

2 2 ( σy −σy0)<br />

λrf<br />

E<br />

σ<br />

s<br />

z ≈<br />

2π eV0<br />

sin∆ψ cosϕ<br />

βdβs (7.27)<br />

Included here is the product of (βdβs) 1/2 sin(∆ψ), which is the (measurable) vertical transfer<br />

matrix element from angle-to-position and deflector-to-screen. Finally, ϕ is the rf phase of the<br />

deflector (ϕ = 0 at zero-crossing) and σy and σy0 are the measured vertical beam sizes with rf-on<br />

and rf-off, respectively. The voltage of the deflector is easily calibrated using simple BPM<br />

measurements as a function of RF phase. Table 7.23 lists the parameter values associated with<br />

this bunch length measurement after BC2. The rf deflecting structure will be placed downstream<br />

of the BC2 chicane at 5.4 GeV at the 25-5a location (at S ≈ 475 m in Figure 7.18) where an<br />

7-92 ♦ A C C E L E R A T O R

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