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IGCAR : Annual Report - Indira Gandhi Centre for Atomic Research

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IGC<br />

<strong>Annual</strong> <strong>Report</strong> 2007<br />

system are analyzed. Fault Tree<br />

Analysis, shown in Fig.2, is a<br />

Top down approach, where the<br />

failure of system in a particular<br />

mode is taken as top event and<br />

the causes of that failure along<br />

with the interrelation between<br />

the causes are analyzed until<br />

we reach the basic causes.<br />

Apart from these qualitative<br />

methods there are many<br />

quantitative reliability analysis<br />

methods used to compare<br />

different topologies, and<br />

evaluate the probability of<br />

failure on demand.<br />

Calculation of Failure rate<br />

<strong>for</strong>ms the basis <strong>for</strong> Quantitative<br />

reliability analysis. For<br />

electronic components, US MIL<br />

217-F Notice-2 standard<br />

provides empirical <strong>for</strong>mulae to<br />

find out the failure rate.<br />

Reliability prediction of<br />

electronic components is done<br />

by Parts Stress Method or Parts<br />

Count Method. In case, <strong>for</strong> any<br />

component, if the failure rate is<br />

not available, failure rate data<br />

given by the manufacturer is<br />

used in the calculations. While<br />

arriving at the failure rate, the<br />

derating of the component,<br />

quality level, temperature and<br />

intended environment are taken<br />

into consideration.<br />

IEC 61508 provides<br />

guidelines <strong>for</strong> the determination<br />

of probability of unsafe state of<br />

the system. Using these<br />

guidelines, the probability of<br />

unsafe state can be calculated<br />

at different conditions.<br />

Verification and Validation of<br />

the Software and Hardware<br />

should be done to verify<br />

Fig.1 Example Fault Tree model<br />

whether the system is matching<br />

the requirements or not.<br />

The reliability analysis of<br />

Safety Logic Systems and Core<br />

Temperature Monitoring system<br />

proved the safety of the system<br />

theoretically. The results are<br />

used as inputs in the Level 1<br />

Probabilistic Safety Assessment<br />

of PFBR.<br />

V.C.4. Safety Logic with Fine Impulse Test<br />

System <strong>for</strong> PFBR<br />

PFBR is provided with two<br />

independent, fast acting and<br />

diverse shutdown systems<br />

namely SDS-1 & SDS-2 to<br />

detect any abnormalities in<br />

reactor core and to initiate<br />

safety action. Each system<br />

consists of sensors, signalprocessing<br />

systems, logic<br />

systems, drive mechanisms and<br />

absorber rods. The absorber<br />

rods of the first system are<br />

Control and Safety Rods (CSR)<br />

and that of the second are<br />

called as Diverse Safety Rods<br />

(DSR). There are nine CSR and<br />

three DSR. While CSR are used<br />

<strong>for</strong> startup, control of reactor<br />

power, controlled shutdown<br />

and SCRAM, the DSR are used<br />

only <strong>for</strong> SCRAM. The<br />

respective drive mechanisms<br />

are called as CSRDM &<br />

DSRDM. For SDS-1, Safety<br />

Logic with Fine Impulse Test<br />

(SLFIT) System is provided<br />

whereas <strong>for</strong> SDS-2, Pulse<br />

Coded Safety Logic (PCSL)<br />

System is provided.<br />

SLFIT system receives trip<br />

parameters from neutron flux<br />

monitoring, failed fuel<br />

detection, sodium flow<br />

monitoring, reactor inlet<br />

temperature monitoring systems<br />

130 ENABLING TECHNOLOGIES

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