The mechanical effects of short-circuit currents in - Montefiore
The mechanical effects of short-circuit currents in - Montefiore
The mechanical effects of short-circuit currents in - Montefiore
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our cases). It means that the energy <strong>in</strong>put, which is<br />
severely <strong>in</strong>creased by the asymmetry <strong>of</strong> the current<br />
(the first peak <strong>of</strong> the <strong>short</strong>-<strong>circuit</strong> current can be<br />
more than 2.5 times rms value and the energy is<br />
proportional to the square <strong>of</strong> the current) is totally<br />
converted <strong>in</strong>to <strong>in</strong>crease <strong>of</strong> the tension to create<br />
p<strong>in</strong>ch.<br />
Subspan length effect. Manuzio neglected subspan<br />
length effect, which was consistent with no p<strong>in</strong>ch,<br />
but does not reflect the actual situation as we<br />
observed <strong>in</strong> our tests, even for very large subspan<br />
length. In fact , if we imag<strong>in</strong>e that subconductor are<br />
mov<strong>in</strong>g with fixed end, the subconductor length (<strong>in</strong><br />
a first rough estimate) will have to <strong>in</strong>crease by<br />
about the subconductor spac<strong>in</strong>g (if we imag<strong>in</strong>e that<br />
<strong>in</strong>itially parallel subconductors came <strong>in</strong>to contact<br />
along all subspan length, except very close to the<br />
spacer. It means that, follow<strong>in</strong>g Hooke’s law, the<br />
p<strong>in</strong>ch could be estimate by: σ = εE<br />
or<br />
Fpi<br />
as<br />
as<br />
= E or Fpi<br />
EA<br />
A ls<br />
ls<br />
= where as is the<br />
bundle diameter, ls the subspan length and EA the<br />
product <strong>of</strong> the elasticity modulus times the<br />
subconductor cross section. As EA is very large,<br />
such rough estimation will produce <strong>in</strong>credibly high<br />
p<strong>in</strong>ch Fpi . Such approach clearly po<strong>in</strong>t out that<br />
subconductor tension cannot rema<strong>in</strong> constant<br />
dur<strong>in</strong>g contact, as Manuzio suggested.<br />
<strong>The</strong> new simplified method developed must <strong>in</strong>clude<br />
such parameters. Many ways have been tried. Look<strong>in</strong>g<br />
for the simplest one and try<strong>in</strong>g to be as close as possible<br />
to known IEC methods, we f<strong>in</strong>ally decided to use actual<br />
IEC 60865-1 (based on the work developed <strong>in</strong>side<br />
CIGRE and published [Ref 55]) for evaluation <strong>of</strong> p<strong>in</strong>ch<br />
tension <strong>in</strong> substation structures. We adapted the method<br />
to be used also for overhead l<strong>in</strong>es, simply by<br />
implement<strong>in</strong>g a constant tower stiffness <strong>of</strong> 100N/mm<br />
for both supports <strong>of</strong> one span and we focused our goal<br />
on the use <strong>of</strong> the output <strong>of</strong> IEC60865-1 (the p<strong>in</strong>ch) see<br />
also [Ref 1], to evaluate spacer compression us<strong>in</strong>g the<br />
follow<strong>in</strong>g method:<br />
66<br />
Compressive force on spacer<br />
Y(x<br />
)<br />
lnc<br />
θ<br />
Figure 3.66 Subconductor shape <strong>of</strong> a tw<strong>in</strong> bundle dur<strong>in</strong>g a p<strong>in</strong>ch<br />
(spacer on the left side)<br />
In Figure 3.66, one subconductor is reproduced near<br />
spacer location, at the <strong>in</strong>stant <strong>of</strong> maximum p<strong>in</strong>ch and<br />
maximum spacer compression. <strong>The</strong> x axis represents the<br />
bundle center and the subconductor (straight l<strong>in</strong>e) is<br />
jo<strong>in</strong><strong>in</strong>g the center <strong>of</strong> the bundle keep<strong>in</strong>g a certa<strong>in</strong><br />
distance, depend<strong>in</strong>g on subconductor diameter. Lnc is<br />
called the non contact length which is unknown and<br />
must be evaluated. Between the spacer location and<br />
contact po<strong>in</strong>t, the subconductor shape is like a parabola.<br />
<strong>The</strong> compressive spacer force is the projection <strong>of</strong> the<br />
p<strong>in</strong>ch on the spacer at spacer location (the p<strong>in</strong>ch<br />
direction is given by the tangent which has a deviation θ<br />
from horizontal). <strong>The</strong> p<strong>in</strong>ch is the traction <strong>in</strong> the<br />
subconductor, more or less constant along the<br />
subconductor. In this simple approach, the bend<strong>in</strong>g is<br />
completely neglected so that subconductor shape near<br />
the spacer can be reproduced as shown <strong>in</strong> the figure.<br />
Half <strong>of</strong> the spacer compression is given by :<br />
c = pi.<br />
s<strong>in</strong>( ) x=<br />
0 F F θ<br />
Another way to express it is to use equilibrium equation<br />
with electromagnetic load on the non-contact length<br />
(here expressed for tw<strong>in</strong> bundle) :<br />
l<br />
nc<br />
2 cos( θ ( x))<br />
Fc<br />
= 0,<br />
2.<br />
I . ∫ dx<br />
2y(<br />
x)<br />
0<br />
where the <strong>short</strong>-<strong>circuit</strong> current I is given <strong>in</strong> kA and is<br />
the so called time average <strong>short</strong>-<strong>circuit</strong> current tak<strong>in</strong>g<br />
<strong>in</strong>to account the asymmetry as def<strong>in</strong>ed <strong>in</strong> CIGRE<br />
brochure [Ref 1, equation 4.27, page 49]<br />
where<br />
2<br />
as<br />
− d ⎛ x ⎞ ⎛ x ⎞ as<br />
y ( x)<br />
= . ( as<br />
d).<br />
+<br />
2 ⎜<br />
l ⎟ − −<br />
⎜<br />
nc<br />
l ⎟<br />
⎝ ⎠ ⎝ nc ⎠ 2<br />
and<br />
cos( θ<br />
) =<br />
1<br />
⎛ ∂y<br />
⎞<br />
1+<br />
⎜ ⎟<br />
⎝ ∂x<br />
⎠<br />
2<br />
x