The mechanical effects of short-circuit currents in - Montefiore
The mechanical effects of short-circuit currents in - Montefiore
The mechanical effects of short-circuit currents in - Montefiore
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<strong>The</strong> numerical resolution <strong>of</strong> these equations leads to the<br />
evaluation <strong>of</strong> the compressive force and <strong>of</strong> the m<strong>in</strong>imum<br />
length <strong>of</strong> the sub-conductor, which is still free.<br />
<strong>The</strong> use <strong>of</strong> such method, comb<strong>in</strong>ed with evaluation <strong>of</strong><br />
p<strong>in</strong>ch give access to the follow<strong>in</strong>g results (Figure 3.67)<br />
on 28 known tests (case 8 <strong>of</strong> volume 2 <strong>of</strong> this brochure).<br />
What is clear is that Manuzio formula is correct for low<br />
spacer compression (the first dots are com<strong>in</strong>g from<br />
Manuzio tests) but deviate up to 25% for other cases.<br />
<strong>The</strong> new method , described <strong>in</strong> this paper rema<strong>in</strong>s <strong>in</strong> the<br />
range <strong>of</strong> measurement precision. One dot is clearly out<br />
<strong>of</strong> the range, probably connected to measurement error.<br />
<strong>The</strong> ma<strong>in</strong> problem <strong>of</strong> Manuzio formula is com<strong>in</strong>g from<br />
the systematic under-evaluation <strong>of</strong> spacer compression,<br />
which cannot be accepted for spacer design.<br />
Most <strong>of</strong> the validation cases are <strong>in</strong> the range <strong>of</strong> overhead<br />
l<strong>in</strong>e practice (30, 40, 60 and 120 meters), more results<br />
would be needed to extend our proposal to substations<br />
range, especially if we have no contact between<br />
subconductors. Nevertheless, we can po<strong>in</strong>t out the good<br />
correlation for 10 m subspan length.<br />
Of course more complex situations, like asymmetric<br />
bundle, very wide bundle, and other range than those<br />
used for validations can be evaluated by complex<br />
advanced methods, as used <strong>in</strong> [Ref 54]). But <strong>in</strong> most<br />
practical cases, this method can be used for evaluat<strong>in</strong>g<br />
calculated values (kN)<br />
20<br />
18<br />
16<br />
14<br />
12<br />
10<br />
8<br />
6<br />
4<br />
2<br />
0<br />
spacer compression<br />
(measurement vs calculation)<br />
0 5 10 15 20<br />
measured values (kN)<br />
67<br />
spacer compression, then replac<strong>in</strong>g <strong>short</strong>-<strong>circuit</strong> tests by<br />
equivalent <strong>mechanical</strong> test <strong>in</strong> a classical lab.<br />
When design<strong>in</strong>g a spacer or a spacer damper for<br />
overhead l<strong>in</strong>e, not only the <strong>short</strong>-<strong>circuit</strong> level is<br />
important, but also the <strong>in</strong>itial value <strong>of</strong> the tension <strong>in</strong> the<br />
conductors (as well as subconductor spac<strong>in</strong>g,<br />
subconductor diameter and subspan length). <strong>The</strong> same<br />
<strong>short</strong>-<strong>circuit</strong> on the same structure may have very<br />
different <strong>effects</strong> depend<strong>in</strong>g on <strong>short</strong>-<strong>circuit</strong> time<br />
<strong>in</strong>ception (driv<strong>in</strong>g asymmetry <strong>of</strong> the current).<br />
Important data to be used for IEC evaluation <strong>of</strong> Fpi<br />
<strong>The</strong> use <strong>of</strong> this method will need a data <strong>in</strong> relation with<br />
tower stiffness. <strong>The</strong> proposed method to evaluate spacer<br />
compression need a heuristic value <strong>of</strong> 100 N/mm for<br />
each support <strong>in</strong>stead <strong>of</strong> actual stiffness, used <strong>in</strong> other<br />
part <strong>of</strong> IEC60865 (see annex 8.3) to evaluate Fpi for<br />
example.<br />
This relatively low value compared to actual tower data<br />
is <strong>in</strong> relation with a “dynamic stiffness” (which should<br />
<strong>in</strong>clude the dynamic behaviour <strong>of</strong> the support and<br />
anchor<strong>in</strong>g <strong>in</strong>sulator cha<strong>in</strong> <strong>in</strong> such a dynamic excitation,<br />
more close to an impulse).<br />
+10%<br />
-10%<br />
-25%<br />
new method<br />
"Manuzio"<br />
Figure 3.67Comparison <strong>of</strong> spacer compression between tests and simplified method