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The mechanical effects of short-circuit currents in - Montefiore

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case, the reduction <strong>of</strong> reliability results from the<br />

comb<strong>in</strong>ation <strong>of</strong> stress-<strong>in</strong>creas<strong>in</strong>g and strengthdecreas<strong>in</strong>g<br />

<strong>effects</strong>. In the example, the stress <strong>of</strong> a post<br />

<strong>in</strong>sulator with a m<strong>in</strong>imum break<strong>in</strong>g load <strong>of</strong> 8 kN<br />

<strong>in</strong>creased from 5,6 kN to 6,4 kN. At the same time<br />

the strength decreased from 8 kN to 7,2 kN. As a<br />

result <strong>of</strong> <strong>in</strong>creas<strong>in</strong>g stress and decreas<strong>in</strong>g strength the<br />

failure probability rose by two decades.<br />

If the relative changes <strong>of</strong> stress and strength are<br />

unequal, the probability will be taken as follows :<br />

– For a given permissible failure probability one<br />

can f<strong>in</strong>d parameter comb<strong>in</strong>ations Fmax/Fm<strong>in</strong> which<br />

do not exceed the given probability limit.<br />

– If an equivalent static load Fmax is assumed, it<br />

will be possible to determ<strong>in</strong>e m<strong>in</strong>imum strength<br />

<strong>of</strong> post <strong>in</strong>sulators with which an assumed limit <strong>of</strong><br />

failure probability will be observed.<br />

5.2.1.5 Summary<br />

In the described example <strong>of</strong> <strong>mechanical</strong> reliability <strong>of</strong><br />

110 kV post <strong>in</strong>sulators, it was shown that if the stress<br />

density function and the strength distribution function<br />

are known, the reliability can be calculated. If the<br />

percentage <strong>in</strong>crease <strong>of</strong> stress and the percentage<br />

decrease <strong>of</strong> strength as the same, the <strong>in</strong>fluences on the<br />

reliability will be equal. A good co-ord<strong>in</strong>ation <strong>of</strong><br />

<strong>effects</strong> <strong>of</strong> <strong>in</strong>creas<strong>in</strong>g stress and decreas<strong>in</strong>g strength <strong>of</strong><br />

the reliability results <strong>in</strong> the example considered. For<br />

other devices as well, it should be assumed that the<br />

reliability is <strong>in</strong>fluenced by <strong>in</strong>creas<strong>in</strong>g stress and<br />

decreas<strong>in</strong>g strength.<br />

Figure 5.5 Load / strength distributions for rigid bus example<br />

79<br />

Figure 5.6 Bend<strong>in</strong>g break<strong>in</strong>g load<br />

Figure 5.7 Bend<strong>in</strong>g break<strong>in</strong>g load<br />

5.2.1.6 Example <strong>of</strong> sav<strong>in</strong>gs us<strong>in</strong>g probabilistic<br />

approach <strong>in</strong> renovation (Ford, Sahazizian)<br />

Type <strong>of</strong><br />

<strong>short</strong><strong>circuit</strong><br />

Nom<strong>in</strong>al voltage<br />

110 kV 220 kV 400 kV 500 kV<br />

1-ph + e 70 % 85 % 90 % 92 %<br />

2-ph 10 % 6 % 3 % 2 %<br />

2-ph + e 15 % 5 % 4 % 3 %<br />

3-ph 5 % 4 % 3 % 3 %<br />

Σ 100 % 100 % 100 % 100 %<br />

Table 5.1 Various types <strong>of</strong> <strong>short</strong>-<strong>circuit</strong>s (contributions)<br />

Courtesy M. Daszczyszak, University <strong>of</strong> M<strong>in</strong><strong>in</strong>g and<br />

Metallurgy, Cracow, Poland.

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