24.11.2012 Views

The mechanical effects of short-circuit currents in - Montefiore

The mechanical effects of short-circuit currents in - Montefiore

The mechanical effects of short-circuit currents in - Montefiore

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

5.1.1. Determ<strong>in</strong>istic Methods<br />

In determ<strong>in</strong>istic methods, structural design is carried<br />

out accord<strong>in</strong>g to the logical approach given below:<br />

I. Replace the always complex reality <strong>of</strong> structures<br />

with modell<strong>in</strong>g, which can be approached by<br />

calculation,<br />

II. Def<strong>in</strong>e the various actions affect<strong>in</strong>g the structure, as<br />

well as their mode <strong>of</strong> representation, which is<br />

merely a diagrammatic simplification <strong>of</strong> physical<br />

reality,<br />

III. Use a computer model representative <strong>of</strong> the<br />

structure's behavior, <strong>in</strong>s<strong>of</strong>ar as the computer model<br />

is the mathematical tool mak<strong>in</strong>g the transition<br />

possible from knowledge <strong>of</strong> the actions to the<br />

determ<strong>in</strong>ation <strong>of</strong> overall stress S t , symbolized by an<br />

elementary stress function<br />

(5.1) S t =f(S1, ... S n )<br />

IV. Check that the marg<strong>in</strong>, characteriz<strong>in</strong>g the "degree<br />

<strong>of</strong> safety", between the state <strong>of</strong> loads and the<br />

strength criteria under consideration is sufficient.<br />

<strong>The</strong> overall resistance is calculated on the basis <strong>of</strong> a<br />

composition g <strong>of</strong> the various criteria.<br />

<strong>The</strong> degree <strong>of</strong> safety is represented by a safety factor:<br />

resistance<br />

(5.2) k = ---------------stress<br />

<strong>The</strong> dist<strong>in</strong>ction between the representation <strong>of</strong> reality<br />

and the model fitted to comput<strong>in</strong>g requirements<br />

<strong>in</strong>volves a whole web <strong>of</strong> simplifications,<br />

approximations, hypotheses and uncerta<strong>in</strong>ties, which<br />

are determ<strong>in</strong>istic <strong>in</strong> essence and may, for lack <strong>of</strong> a<br />

carefully reasoned choice, distort certa<strong>in</strong> conclusions.<br />

5.1.2. First Level Probabilistic Method<br />

In the first level <strong>of</strong> probabilistic design, illustrated <strong>in</strong><br />

Figure 5.1, the same computer models (for f and g) are<br />

used, but the value <strong>of</strong> one or several parameters is<br />

fixed on the basis <strong>of</strong> statistical data.<br />

<strong>The</strong> classic example <strong>of</strong> this type <strong>of</strong> design is the choice<br />

<strong>of</strong> maximum annual w<strong>in</strong>d velocity on the basis <strong>of</strong> a<br />

recurrence time obta<strong>in</strong>ed from meteorological<br />

statistics. As <strong>in</strong> the determ<strong>in</strong>istic methods, the stresses<br />

must be ascerta<strong>in</strong>ed as lower than the strengths by a set<br />

safety factor.<br />

74<br />

5.1.3. Second Level Probabilistic Method<br />

<strong>The</strong>se methods consist <strong>in</strong> evaluat<strong>in</strong>g the risk <strong>of</strong> failure<br />

as a probability, so that the designer can choose from<br />

among several degrees <strong>of</strong> safety, depend<strong>in</strong>g on<br />

different failure probability values. <strong>The</strong> computer<br />

models on which the design process is based are the<br />

same as those used <strong>in</strong> the determ<strong>in</strong>istic method, i.e.<br />

functions f and g. However, the statistical distribution<br />

<strong>of</strong> the parameters serves as the reference <strong>in</strong><br />

establish<strong>in</strong>g a distribution <strong>of</strong> stresses and resistances<br />

correspond<strong>in</strong>g to the applied loads and the strength <strong>of</strong><br />

structures. <strong>The</strong>n, <strong>in</strong>stead <strong>of</strong> compar<strong>in</strong>g the two<br />

distributions <strong>in</strong> terms <strong>of</strong> a safety factor, a convolution<br />

is operated to calculate a probability <strong>of</strong> failure <strong>of</strong> a<br />

structure or a failure recurrence time T, expressed <strong>in</strong><br />

annual frequency.<br />

<strong>The</strong> hatched area <strong>in</strong> Figure 5.2 def<strong>in</strong>es the theoretical<br />

risk <strong>of</strong> failure (R), correspond<strong>in</strong>g to the function:<br />

∞<br />

∫ 0<br />

0<br />

R G L f L dL<br />

(5.3) = ( ) ( )<br />

where: G(L) is the Cumulative Distribution Function<br />

(C.D.F.) <strong>of</strong> the strength <strong>of</strong> the supports or components<br />

<strong>in</strong> the same batch<br />

and: fo(L) is the Probability Distribution Function<br />

(P.D.F.) <strong>of</strong> the applied loads.<br />

<strong>The</strong> theoretical risk <strong>of</strong> failure may be calculated as a<br />

function <strong>of</strong> the relative position <strong>of</strong> curves G(L) and<br />

fo(L).<br />

<strong>The</strong> position <strong>of</strong> curve G(L) may also be def<strong>in</strong>ed as the<br />

guaranteed statistical strength Ls and that <strong>of</strong> curve<br />

fo(L) as the overload probability LT or as the<br />

recurrence time T.<br />

<strong>The</strong> risk <strong>of</strong> failure may also be denoted as a function <strong>of</strong><br />

the ratio:<br />

(5.4) Γ= L<br />

L<br />

or as a function <strong>of</strong> the reliability <strong>in</strong>dex [Ref 80]<br />

(CORNELL, ROSENBLUETH-ESTEVA, HASOFER-<br />

LIND, DITLEVSEN).<br />

For a given load recurrence time, the risk <strong>of</strong> failure<br />

decreases as Γ <strong>in</strong>creases.<br />

s<br />

T

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!