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PNNL-13501 - Pacific Northwest National Laboratory

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Volumetric Imaging of Materials by Advanced, High Resolution Pulse-Echo Ultrasound<br />

Morris S. Good, Leonard J. Bond, Peter M. Martin, Gerry J. Posakony, James R. Skorpik<br />

Study Control Number: PN98081/1327<br />

Ultrasound is a useful, nondestructive analytical tool for imaging structures that cannot be examined visually by other<br />

means. The advanced capabilities of high-resolution, pulse-echo ultrasound are being extended to very high frequencies<br />

using improved electronics and tranducers. It is now possible using high-resolution ultrasound to examine the<br />

characteristics of living cells, the structure of cell nuclei, the integrity of cell membranes, and the response of cells to<br />

environmental stresses.<br />

Project Description<br />

High resolution, volumetric acoustic microscopy imaging<br />

has evolved into 1) an invaluable tool in establishing the<br />

quality of critical parts and 2) an analysis tool for<br />

biological cells. Ultrasound offers a noninvasive means<br />

of imaging sub-surface structures on the order of<br />

0.5 microns and larger (Bereiter-Hahn 1996). Applications<br />

of interest include intercellular imaging in support of<br />

the cellular observatory, imaging of ceramic materials at<br />

the microstructural level to aid in material design and life<br />

prediction, and the inspection of small solder connections<br />

of the next generation of integrated circuits (a,b) . To<br />

achieve the desired resolution, ultrasonic, pulse-echo<br />

systems must operate at frequencies ranging from 200<br />

MHz to 800 MHz, however restrictions exist in the ability<br />

to fabricate transducers in this range. Two technologies<br />

have been used to fabricate pulse-echo transducers.<br />

Lapping of bulk piezoelectric material to fabricate a thin<br />

wafer has an upper frequency limit in the range of 200<br />

MHz due to material damage incurred during lapping.<br />

Deposition of piezoelectric material has traditionally had<br />

a lower frequency limit of 1 GHz due to difficulties in<br />

maintaining a proper microstructure of the piezoelectric.<br />

This effort leveraged the world-class deposition skills at<br />

<strong>Pacific</strong> <strong>Northwest</strong> <strong>National</strong> <strong>Laboratory</strong> to overcome this<br />

problem and in fiscal year 1999, fabricated a film<br />

thickness several orders of magnitude greater than<br />

typically deposited and evaluated the resulting ultrasonic<br />

transducers as reported earlier. Due to budget restrictions<br />

in FY 2000, work centered on resolution enhancement<br />

utilizing an existing 50-MHz transducer.<br />

(a) Private communication with <strong>Pacific</strong> <strong>Northwest</strong> <strong>National</strong><br />

<strong>Laboratory</strong> staff.<br />

(b) Private communication with a major integrated circuit<br />

manufacturer.<br />

Introduction<br />

Future work should address three fundamental issues that<br />

still hinder imaging at a resolution representative of<br />

milestone frequencies of 100 MHz and 200 MHz. Two<br />

are related to improved material deposition while the third<br />

is improved electronics to achieve adequate signal-tonoise<br />

values. Improving the deposition process to<br />

maintain a (002) columnar orientation within a 2°<br />

tolerance and thickness uniformity across the transducer<br />

diameter are the first two issues. Issue 1: The (002)<br />

columnar microstructure of the <strong>Pacific</strong> <strong>Northwest</strong><br />

<strong>National</strong> <strong>Laboratory</strong> piezoelectric film has been observed<br />

at an orientation ranging from 0° to 15° relative to the<br />

surface normal. Inclinations greater than 2° degraded<br />

signal quality by generating shear waves. Shear waves<br />

formed an upper noise baseline and leached energy away<br />

from the primary longitudinal wave. Although several<br />

transducers with a 2° inclination have been obtained, most<br />

microstructures at the end of FY 1999 were inclined at<br />

approximately 10° and therefore resulted in a strong shear<br />

wave component. Issue 2: Thickness uniformity of the<br />

deposited film is needed to ensure a good focus and<br />

generation of the desired frequency. A mild thickness<br />

taper (30% thickness change) was observed across the<br />

transducer face. Thickness uniformity within 5% should<br />

be obtained with changes in the presentation of the<br />

substrate to the sputtering electrode. Issue 3: Refinement<br />

of tone-burst electronics should also continue. A low<br />

voltage (10 Volts peak-to-peak) prototype was<br />

demonstrated, however an order of magnitude<br />

improvement is desired to permit adequate penetration in<br />

both materials of interest and fluids such as water that are<br />

used to couple ultrasound between transducer and part.<br />

Sensors and Electronics 415

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