Developments in Ceramic Materials Research

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256 Li Chen Figure 9. Life time test of a micro field emitter array at a gate voltage of 150 V over a period of 17.5 hours. In order to statistically identify the emission current uniformity, electron current maps from different samples have to be acquired in the electrical characteristic study. This was achieved by firing the whole micro electron emitter guns on substrate pixel by pixel at a fixed gate potential voltage, while monitoring the emission current collected by the anode screen and read out via the Keithley source meter 2410. For comparison, Figure 10 illustrates two graphs representing electron current distributions from a ceramic sample and a silicon sample. Each tested sample has 20×20 pixels. Pixels are evenly spread over three-quarters of a 2×2 inches area in the centre. The statistic evaluation of emission current uniformity shows equivalent performance for the ceramic sample and silicon sample. Figure 10 (Continued). a
Field Emission Display on Ceramic 257 Figure 10. Field emission current maps from 20×20 pixels. (a) Data collected from a ceramic substrate with average current 10.2 µA, and standard deviation 5.57 µA; (b) Data collected from a silicon substrate with average current 10.8 µA, and standard deviation 7.1 µA. The micro field emitters are vacuum microelectronics devices. Their performances are very sensible to the surrounding environment. Any gases absorption and desorption to the tips surface would influence their field emission behaviour. In particular the tips without surface cleaning treatment could demonstrate very noisy field emission because resistive heating to the tip by the emission current causes temperature rise, therefore contaminants and gas molecules tend to desorb from the surface, causing the work function changes on the field emission sites. In the electrical characteristic study, variation of emission current was associated with image brightness variations on the phosphor screen. It was also revealed on the pressure reading from an ion gauge, which was located further away from the emission site. Pressure bursts from the initial base pressure of 5×10 -10 mbar without firing the field emitter guns, to 2×10 -6 mbar when electrons heavily bombard on the phosphor screen were observed. This suggested a far worse vacuum condition in the narrow space between the phosphor screen and the emitter cathode back plane. Plasma can be triggered easily under this condition due to the large quantity of gas molecules released from the phosphor under the intensive electron bombardment. Figure 11 shows an image of plasma struck on the phosphor screen when an emission current impinged the phosphor causing a pressure rise in the local area. Micro field emitter destruction was inevitable under this condition. A SEM image showing a destructive microstructure from a field emitter array on a ceramic sample after a characteristic study is shown in Figure 12. Melted molybdenum surface, deformed gate apertures and evaporated cone tips are visible. Phosphor particles landing on a field emitter is the evidence of a plasma discharge event. b
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DEVELOPMENTS IN CERAMIC MATERIALS R
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Copyright © 2007 by Nova Science P
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PREFACE Ceramics are refractory, in
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Preface ix crystals is discussed. A
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Preface xi spectra and the directio
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2 Leslie G. Cecil comprehensive dat
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4 Leslie G. Cecil Ringle et al. (19
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6 Leslie G. Cecil The main architec
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8 Leslie G. Cecil can study “the
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10 Leslie G. Cecil Middleton et al.
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12 Leslie G. Cecil The laser ablate
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14 Leslie G. Cecil There are two ge
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16 Leslie G. Cecil distinct recipes
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18 Leslie G. Cecil second group (Fi
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20 Leslie G. Cecil The Vitzil-Orang
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22 Leslie G. Cecil Table 3. Mahalan
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24 Leslie G. Cecil Ixlú and Ch’i
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26 Leslie G. Cecil structures (D. R
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28 Leslie G. Cecil paste and Macanc
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30 Leslie G. Cecil Bieber, A. M. Jr
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32 Leslie G. Cecil Kepecs, S. M., a
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34 Leslie G. Cecil Schele, L., Grub
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36 Z. C. Li, Z. J. Pei and C. Tread
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54 T. T. Basiev, V. A. Demidenko, K
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62 I, % 100 80 60 40 20 0 T. T. Bas
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68 Fluorescence, a.u. 1 T. T. Basie
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70 Fluorescence, a.u. 1 0.1 0.01 0.
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78 k, cm -1 20 18 16 14 12 10 8 6 4
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82 Photon counts 300 250 200 150 10
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84 Fluorescence, a.u. I transfer ,
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86 ln(I transfer (t)) -4.2 -4.4 -4.
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88 Fluorescence, a.u. I transfer ,
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In: Developments in Ceramic Materia
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Synthesis, Spectroscopic and Magnet
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a c Synthesis, Spectroscopic and Ma
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Transmission Transmission Transmiss
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Sm (J/Kmol) Sm (J/Kmol) 15 10 5 Syn
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Intensity (a.u.) Intensity (a.u.) 8
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The Use of Ceramic Pots in Old Wors
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3.2. Wall-in Positions The Use of C
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IACC ( τ ) = t2 ∫ The Use of Cer
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where σ res is the scattering cros
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D50 0.8 0.7 0.6 0.5 0.4 0.3 The Use
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Definition (D50) 1 0.95 0.9 0.85 0.
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Modeling of Thermal Transport in Ce
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q x = Modeling of Thermal Transport
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Page 226 and 227: 212 R. Ramesh, H. Kara, Ron Stevens
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Page 256 and 257: 242 Development of Display Technolo
Page 258 and 259: 244 Li Chen technology moved to the
Page 260 and 261: 246 Li Chen The continuing evolutio
Page 262 and 263: 248 Li Chen the back contact cathod
Page 264 and 265: 250 Li Chen Figure 3. Vertical side
Page 266 and 267: 252 Li Chen Figure 6. Molybdenum mi
Page 268 and 269: 254 Li Chen Figure 8(a). I-V curve
Page 272 and 273: 258 Figure 11(a). Plasma generated
Page 274 and 275: 260 Li Chen [13] C.A. Spindt, K.R.
Page 276 and 277: 262 S. Ardizzone, C. L. Bianchi, G.
Page 295 and 296: A absorption spectra, 66, 67, 77, 7
Page 297 and 298: correlation function, 156 corrosion
Page 299 and 300: group membership, 13, 20, 21, 22, 2
Page 301 and 302: microstructure(s), x, xi, 73, 74, 2
Page 303 and 304: efraction index, 61 refractive inde
Page 305 and 306: time, vii, ix, 1, 3, 7, 8, 11, 26,
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Developments in Ceramic Materials Research

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