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Diseases and Management of Crops under Protected Cultivation

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(<strong>Diseases</strong> <strong>and</strong> <strong>Management</strong> <strong>of</strong> <strong>Crops</strong> <strong>under</strong> <strong>Protected</strong> <strong>Cultivation</strong>)<br />

MICROSCOPE (SEM). In the SEM, the specimen is scanned with a focused beam <strong>of</strong> electrons<br />

which produce "secondary" electrons as the beam hits the specimen. These are detected <strong>and</strong><br />

converted into an image on a television screen, <strong>and</strong> a three-dimensional image <strong>of</strong> the surface <strong>of</strong><br />

the specimen is produced. Specimens in the TEM are examined by passing the electron beam<br />

through them, revealing more information <strong>of</strong> the internal structure <strong>of</strong> specimens.<br />

The Transmission Electron Microscope (TEM)<br />

The TEM is an evacuated metal cylinder (the column) about 1 to 2 meters high with the<br />

source <strong>of</strong> illumination, a tungsten filament (the cathode), at the top. If the filament is heated <strong>and</strong> a<br />

high voltage (the accelerating voltage) <strong>of</strong> between 40,000 to 100,000 volts is passed between it<br />

<strong>and</strong> the anode, the filament will emit electrons. These negatively charged electrons are<br />

accelerated to an anode (positive charge) placed just below the filament, some <strong>of</strong> which pass<br />

through a tiny hole in the anode, to form an electron beam which passes down the column. The<br />

speed at which they are accelerated to the anode depends on the amount <strong>of</strong> accelerating voltage<br />

present.<br />

Electro-magnets, placed at intervals down the column, focus the electrons, mimicking the<br />

glass lenses on the light microscope. The double condenser lenses focus the electron beam onto<br />

the specimen which is clamped into the removable specimen stage, usually on a specimen grid.<br />

As the electron beam passes through the specimen, some electrons are scattered whilst<br />

the remainder are focused by the objective lens either onto a phosphorescent screen or<br />

photographic film to form an image. Unfocussed electrons are blocked out by the objective<br />

aperture, resulting in an enhancement <strong>of</strong> the image contrast. The contrast <strong>of</strong> the image can be<br />

increased by reducing the size <strong>of</strong> this aperture. The remaining lenses on the TEM are the<br />

intermediate lens <strong>and</strong> the projector lens. The intermediate lens is used to control magnification.<br />

The projector lens corresponds to the ocular lens <strong>of</strong> the light microscope <strong>and</strong> forms a real image<br />

on the fluorescent screen at the base <strong>of</strong> the microscope column.<br />

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