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Third Day Poster Session, 17 June 2010 - NanoTR-VI

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<strong>Poster</strong> <strong>Session</strong>, Thursday, <strong>June</strong> <strong>17</strong><br />

Theme F686 - N1123<br />

Epitaxial Graphene Synthesis on Silicon Carbide Substrate<br />

Hüsnü Aslan 1 , 1 ,NihanÖzkan 2 ,and Ahmet Oral 1<br />

1 Faculty of Engineering & Natural Sciences University, Istanbul, 34956, Turkey<br />

2 Department of Physics Engineering, Istanbul Technical University, 34469, Turkey<br />

Abstract – Large scale single layer epitaxial graphene is going to be produced in the ultrahigh vacuum chamber and<br />

characterized by Atomic Force Microscope and Low Energy Electron Diffraction.<br />

Graphene, one atomic thick layer form of graphite,<br />

is composed of hexagonally arranged carbon atoms and<br />

the layers between two graphene sheets are bonded by<br />

weak van der Waals interaction. Its unique electrical<br />

and mechanical properties have recently made it popular<br />

in both science and technology.<br />

Graphene could be produced by using several methods<br />

both chemically and mechanically. The most popular<br />

and the easiest method is called mechanical<br />

exfoliation[1]. However, by using this method one can<br />

produce small-area graphene layer. In order to obtain<br />

large scale graphene, the method called epitaxial growth<br />

on SiC or CVD can be used. This method includes two<br />

steps. For the first step, SiC has to be etched by<br />

hydrogen gas in order to prepare suitable SiC surface<br />

for epitaxial growth. In this process, cleaned SiC<br />

samples are annealed in a vacuum chamber with %5 H 2<br />

and %95 Ar gas flow. For the second step, SiC chip is<br />

heated in ultrahigh vacuum to temperatures between<br />

1000-1500°C in order to sublimate Si [2,3].<br />

In this work, we are planning to produce monolayer<br />

graphene on commercially available 4H-SiC(0001)<br />

sample. The growth process is going to be performed in<br />

an ultrahigh vacuum chamber equipped with e-beam<br />

heater and graphene layers are going to be characterized<br />

by Low Energy Electron Diffraction (LEED). In<br />

addition to this, thickness of this graphene layer is going<br />

to be measured by Atomic Force Microscope.<br />

ers<br />

107T720, 107T892 & 108T930 and NanoMagnetics<br />

Instruments Ltd.<br />

[1] Geim, A-K., and Novoselov, K-S.The rise of graphene,<br />

Nature Materials, 6, 183-191(2007).<br />

[2]Hass, J., De Heer, W.A., and Conrad, E.H. The growth and<br />

morphology of epitaxial multilayer graphene, Journal of<br />

physics: Condensed Matter, 20, 323202 (2008).<br />

[3]Ramachandran V., Brady, M.F., Smith, A.R., Feenstra,<br />

R.M., and Greve, D.W. Preparation of atomically flat surfaces<br />

on silicon carbide using hydrogen etching, Journal of<br />

Electronic Materials, 27, 308-312, (1998)<br />

.<br />

Figure 1. AFM image of an SiC (0001) wafer before<br />

hydrogen etching.<br />

6th Nanoscience and Nanotechnology Conference, zmir, <strong>2010</strong> 666

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