P Poster Session, Tuesday, June 15 Theme A1 - B702 Screen<strong>in</strong>g of Antioxidant Activity and Phenolic Content of Selected Food Items Cited <strong>in</strong> the Holly Quran 1 1 1 USafaa Y. QustiUP P*, Ahmed N. Abo-khatwaP Pand Mona A. B<strong>in</strong> LahwaP 1 PDepartment of Biochemistry- K<strong>in</strong>g Abdulaziz University- Jeddah, SA. Abstract-Antioxidants are vital substances, which possess the ability to protect the body from damages caused by free radical-<strong>in</strong>duced oxidative stress. A variety of free radical scaveng<strong>in</strong>g antioxidants is found <strong>in</strong> a number of dietary sources. The ma<strong>in</strong> objective of this study was to assess the antioxidant activity of a number of fruits, vegetables and gra<strong>in</strong>s. Therefore, (16) edible plant materials cited <strong>in</strong> the Holly Quran were selected to determ<strong>in</strong>e their antioxidant properties. The antioxidant capacity of these extracts were <strong>in</strong>vestigated based on their ability to scavenge (DPPH) stable free radical. Phenolic content of the extracts was determ<strong>in</strong>ed us<strong>in</strong>g Fol<strong>in</strong>-Ciocalteau reagent. Results of the antioxidant capacity were classified <strong>in</strong> three categories; (1) Fruits possess<strong>in</strong>g extremely high free radical scaveng<strong>in</strong>g activity or antioxidant activity (ICR50R
Poster Session, Tuesday, June 15 Theme A1 - B702 Preparation and Characterization of Nanostructured ZnS Th<strong>in</strong> Films Grown on Glass and Monocrystall<strong>in</strong>e Si Substrates R. Sahraei 1* , G. Nabiyouni 2 and A. Daneshfar 1 1 Department of Chemistry, University of Ilam, Ilam P.O. Box: 65315-516, Iran 2 Department of Physics, University of Arak, Arak, Iran Abstract— Nanocrystall<strong>in</strong>e z<strong>in</strong>c sulfide th<strong>in</strong> films were prepared by a new chemical bath deposition technique onto glass and silicon (111) substrates. Deposition takes place at a temperature of 70 ºC and a pH of 6.0, from an aqueous solution conta<strong>in</strong><strong>in</strong>g z<strong>in</strong>c acetate, thioacetamide, and ethylenediam<strong>in</strong>e. Microstructure analysis us<strong>in</strong>g atomic force microscopy shows that the films deposited on glass substrates conta<strong>in</strong> 28-30 nm clusters, whereas much larger clusters (around 80-120 nm) comprise the films deposited on silicon (111) substrate. X-ray diffraction analysis <strong>in</strong>dicates that both the ZnS films deposited on glass and Si substrates have cubic z<strong>in</strong>cblende structure. Direct band gap energy for these samples was measured to be <strong>in</strong> the range of 3.97- 4.00 eV. Recently, the II-VI compounds semiconductor th<strong>in</strong> films have received an <strong>in</strong>tensive attention due to their application <strong>in</strong> th<strong>in</strong> film solar cells [1]. Among these metal chalcogenides, ZnS is an important semiconductor material because of its broad direct band gap energy (~3.6 eV) at room temperature [2]. Various techniques have been employed to fabricate ZnS th<strong>in</strong> films, such as, electrodeposition, pulsed-laser deposition, chemical vapor deposition (CVD), and chemical bath deposition (CBD) [3, 4]. In this work, we report deposition of nanocrystall<strong>in</strong>e z<strong>in</strong>c sulfide th<strong>in</strong> films on the glass and mono-crystall<strong>in</strong>e Si substrates us<strong>in</strong>g a weak acidic bath <strong>in</strong> which ethylenediam<strong>in</strong>e acts as a complex<strong>in</strong>g agent and thioacetamide acts as a source of sulfide ions. Atomic force microscopy (AFM), X-ray diffraction (XRD), and UV-Vis spectrophotometery are used to <strong>in</strong>vestigate the surface morphology, structural, and optical properties of the nanostructured ZnS th<strong>in</strong> films. We show how the morphology and surface roughness of the ZnS th<strong>in</strong> films depend on the substrate type. Figure 1. AFM images (two- dimensional (2D)) of CBD ZnS th<strong>in</strong> films on (a) Si and glass substrate (b). X-ray diffraction patterns of the ZnS film grown on glass and monocrystall<strong>in</strong>e Si substrate show three dist<strong>in</strong>guished peaks at the angles of 28.6º, 47.7º and 56.5º reveal a cubic lattice structure and can be assigned to the (111), (220), and (311) plans, respectively. Broaden<strong>in</strong>g of diffraction peaks <strong>in</strong> the XRD pattern of the ZnS film is attributed to the nanometer-sized crystallites. The calculated average size of nanocrystallites, us<strong>in</strong>g Scherrer equation is found to be about 4.5 and 8 nm for the ZnS films deposited on glass and s<strong>in</strong>gle crystal Si substrates, respectively. The average transmittance of ZnS films is calculated to be 84%, 78%, 74% and 71%, respectively, <strong>in</strong> the visible wavelength region. As it is clear from spectra the films have a steep optical absorption feature, <strong>in</strong>dicat<strong>in</strong>g good homogeneity <strong>in</strong> the shape and size of the nanocrystallites and low defect density near the band edge [5]. The band gap energy (E g ) was determ<strong>in</strong>ed to be <strong>in</strong> the range of 3.97-4.00 eV for the ZnS films with deposition times vary<strong>in</strong>g from 4 to 16 hours. These values are rather larger than the literature value for the bulk ZnS (~ 3.6 eV). The result could be attributed to the quantum size effects as expected from the nanocrystall<strong>in</strong>e nature of the ZnS th<strong>in</strong> films [6, 7]. Figure 1 (a) and (b) illustrates two-dimensional AFM images of the ZnS th<strong>in</strong> films deposited on monocrystall<strong>in</strong>e Si and commercial glass slide substrates, respectively. The th<strong>in</strong> film deposited on Si substrate is made of aggregates (clusters) with a square-like surface morphology, whereas much f<strong>in</strong>er aggregates with an isosceles triangular surface morphology comprise the film deposited on glass substrate. As can be seen, the films deposited on the glass substrate conta<strong>in</strong> smaller clusters (average gra<strong>in</strong> size of around 28-30 nm <strong>in</strong> diameter) and have more surface aggregates than those deposited on Si substrate (average gra<strong>in</strong> size of around 80-120 nm <strong>in</strong> diameter). In summary, we have successfully deposited the nanocrystall<strong>in</strong>e ZnS th<strong>in</strong> films onto glass and monocrystall<strong>in</strong>e Si substrates, from a chemical bath at temperature of 70 °C, and us<strong>in</strong>g ethylenediam<strong>in</strong> as a complex<strong>in</strong>g agent. The XRD measurements <strong>in</strong>dicate that the structure of the ZnS th<strong>in</strong> films is cubic. In our experiment, based on the optical transmission measurements, the band gap energies are calculated to be between 3.97-4.00 eV for the ZnS films with different thicknesses. Morphology and optical properties of the ZnS films were characterized us<strong>in</strong>g AFM and UV-Visible spectroscopy. *Correspond<strong>in</strong>g author: reza_sahrai@yahoo.com [1] M. Bär, A. Ennaoui, J. Klaer, R. Sáez-Araoz, T. Kropp, L. We<strong>in</strong>hardt, C. Heske, H.-W. Schock, Ch.-H. Fischer, M.C. Lux-Ste<strong>in</strong>er, Chem. Phys. Lett. 433, 71 (2006). [2] J. Mu, Y. Zhang, Appl. Surf. Sci. 252, 7826 (2006). [3] R.S. Mane, and C.D. Lokhande, Mater. Chem. Phys. 65, 1 (2000). [4] A. Goudarzi, G. Motedayen Aval, S. S. Park, . Choi, R. Sahraei, M.Habib Ullah, A. Avane, and C. S. Ha, Chemistry of Materials 21, 2375 (2009). [5] C. Hubert, N. Naghavi, B. Canava, A. Etcheberry, and D. L<strong>in</strong>cot, Th<strong>in</strong> Solid Films 515, 6032 (2007). [6] R. Sahraei, G. Motedayen Aval, A. Baghizadeh, M. Lamehi-Rachti, A. Goudarzi, M. H. Majles Ara, Materials Letters 62, 4345 (2008). [7] K. Yamaguchi, T. Yoshida, D. L<strong>in</strong>cot, H. M<strong>in</strong>oura, J. Phys. Chem. B 107, 387 (2003). 6th Nanoscience and Nanotechnology Conference, zmir, 2010 352
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