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Photonic crystals in biology

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Poster Session, Tuesday, June 15<br />

Theme A1 - B702<br />

The Effect of Anneal<strong>in</strong>g Temperature of the Electrical Properties of T<strong>in</strong> (IV) Oxide Films Synthesized<br />

by Sol-Gel Methods<br />

Deniz Gu ltek<strong>in</strong> 1 *, Mehmet Oguz Guler 1 , Ozgur Cevher 1 , Mustafa Basaran 1 , Hatem Akbulut 1<br />

1 Department of Metallurgical & Materials Eng<strong>in</strong>eer<strong>in</strong>g, Sakarya University,Sakarya 54187, Turkey<br />

Abstract-Semiconduct<strong>in</strong>g th<strong>in</strong> films with t<strong>in</strong> dioxide have been deposited on soda lime glass substrates from t<strong>in</strong> (II) chloride dihydrate<br />

(SnCl 2 2H 2 O) precursor us<strong>in</strong>g the dip-coat<strong>in</strong>g sol-gel method. They are prepared from a powder obta<strong>in</strong>ed from chlorides directly <strong>in</strong> our<br />

laboratory: 8.37 g of SnCl 2 2H 2 Oare dissolved <strong>in</strong> 100 ml of absolute ethanol. F<strong>in</strong>ally, s<strong>in</strong>ter<strong>in</strong>g was done <strong>in</strong> a furnace with a heat<strong>in</strong>g rate<br />

(2 o C/m<strong>in</strong>) to 500 o C and kept for 2 hours).<br />

Transparent conductive oxides (TCOs) are very important <strong>in</strong><br />

modern electronic <strong>in</strong>dustry and have been used as plastic<br />

liquid crystal display devices, touch sensitive overlays,<br />

transparent electromagnetic shield<strong>in</strong>g materials, front<br />

electrodes of solar cells, energy efficient w<strong>in</strong>dows, etc.<br />

Numerous works have been performed on SnO2 th<strong>in</strong> films for<br />

improvement of their electrical conductivity to utilize it as a<br />

TCO material <strong>in</strong> transparent electrode applications [1–6].<br />

SnO2 films are low cost, chemically and environmentally<br />

more stable than other TCOs such as ZnO, and Sn-doped<br />

In 2 O 3 (ITO) [7,8]. T<strong>in</strong> oxide films have been widely<br />

fabricated by several workers us<strong>in</strong>g a variety of techniques<br />

such as chemical vapor deposition [9], metal-organic<br />

deposition [10], dc and rf-sputter<strong>in</strong>g, etc. [11,12], among<br />

which sol-gel lies <strong>in</strong> the fact that the dop<strong>in</strong>g level, solution<br />

concentration and homogeneity can be controlled easily<br />

without us<strong>in</strong>g expensive and complicated equipment.<br />

The Sol-Gel Dip-Coat<strong>in</strong>g (SGDC) method is more and more<br />

used for the deposition of various th<strong>in</strong> films on different<br />

substrates. This low temperature soft process presents major<br />

advantages and the possibility of h igh purity start<strong>in</strong>g materials,<br />

an easy coat<strong>in</strong>g of large and complex-shaped substrates,<br />

almost no perturbations of devices <strong>in</strong> the case of deposition on<br />

top, an easy technology and most of the time a low cost.<br />

In the present work the mechanism of formation of a SnO 2<br />

film prepared by the sol-gel method from an ethanolic solution<br />

of SnCl 2 .2H 2 O precursor onto soda-lime glass. The precursor<br />

salt -SnCl 2 .2H 2 O (Merck)- was dissolved <strong>in</strong> ethanol and a<br />

0.05M stock solution was made. The gel-like film was<br />

prepared onto soda-lime glass (size 4 cm x 2 cm, thickness 2<br />

mm). Before start<strong>in</strong>g the processes, sodium silicate glass<br />

substrates were cleaned us<strong>in</strong>g distilled water, ammon ia and<br />

hydrogen peroxide (5:1:1 by volume) and then r<strong>in</strong>sed carefully<br />

us<strong>in</strong>g methanol, acetone and distilled water, respectively The<br />

coat<strong>in</strong>g was made by apply<strong>in</strong>g the precursor salt solution (after<br />

a 10-fold dilution with ethanol) drop by drop onto the support<br />

and remov<strong>in</strong>g the solvent by hot air (60°C). This procedure<br />

was cont<strong>in</strong>ued until a relatively thickness of 400-800 nm layer<br />

was deposited.<br />

Scann<strong>in</strong>g electron microscopy (SEM) and X-ray diffraction<br />

(XRD) us <br />

microstructural data. The crystall<strong>in</strong>ity of each film was<br />

calculated fro m XRD spectra by Scherrer’s formula. Chemical<br />

composition of the synthesized th<strong>in</strong> films was analyzed by<br />

Fourier transform <strong>in</strong>frared spectra. The surface topography of<br />

the th<strong>in</strong> films were observed by scann<strong>in</strong>g electron microscopy<br />

(SEM). The effect of different anneal<strong>in</strong>g temperature on the<br />

electrical resistivity of the th<strong>in</strong> films were also analyzed by<br />

us<strong>in</strong>g four probe resistivity techniques.<br />

[1] H.J. Kim, J.W. Bae, J.S. Kim, Y.C. Jang, G.Y. Yeom, N.E. Lee,<br />

Surf. Coat. Technol. 131 (2000) 201.<br />

[2] Y.K. Fang, J.J. Lee, Th<strong>in</strong> Solid Films 169 (1989) 52.<br />

[3] W.A. Badway, H.H. Afifi, E.M. Elgair, J. Electrochem. Soc. 137<br />

(1990) 1592.<br />

[4] J.C. Mannifacier, L. Szepessy, J.F. Bresse, M. Perot<strong>in</strong>, R. Stuck,<br />

Mater. Res. Bull. 14 (1979) 163.<br />

[5] E. Shanthi, V. Dutta, A. Banerkee, K.L. Chopra, J. Appl. Phys. 51<br />

(1980) 6243.<br />

[6] I.H. Kim, J.H. Ko, D. Kim, K.S. Lee, T.S. Lee, J.-h. Jeong, B.<br />

Cheong, Y.-J. Baik, W.M. Kim, Th<strong>in</strong> Solid Films 515 (2006) 2475.<br />

[7] T. M<strong>in</strong>ami, S. Takata, H. Sato, J. Vac. Sci. Technol. 13 (1995)<br />

1095.<br />

[8] B. Thangaraju, Th<strong>in</strong> Solid Films 402 (2002) 71.<br />

[9] J. Kane, H.P. Schwiezer, J. Electrochem. Soc. 123 (1976) 270.<br />

[10] T.N. Blanton, M. Lelental, Mater. Res. Bull. 29 (1994) 537.<br />

[11] R.S. Dale, C.S. Rastomjee, F.H. Potter, R.G. Egdell, Appl. Surf.<br />

Sci. 70/71 (1993) 359.<br />

[12] A. Martel, F. C-Briones, J. Fand<strong>in</strong>o, R. C-Rodriguez, P. B-Perez,<br />

A. Z-Navarro, M. ZTorres, J.L. Pena, Surf. Coat. Technol. 122<br />

(1999) 136.<br />

*Correspond<strong>in</strong>g author: dkurt@sakarya.edu.tr<br />

6th Nanoscience and Nanotechnology Conference, zmir, 2010 404

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