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Photonic crystals in biology

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Poster Session, Tuesday, June 15<br />

Theme A1 - B702<br />

Nanos tructured GaN on Silicon Fabricated by Electrochemical and Laser-<strong>in</strong>duced Etch<strong>in</strong>g<br />

Asmiet Ramizy 1 , Z. Hassan 1 *and Khalid Omar 1<br />

1 Neon-Optoelectronics Research and Technology Laboratory, School of Physics, Universiti Sa<strong>in</strong>s Malaysia, 11800 Penang, Malaysia<br />

Abstract-Nanostructured GaN layers have been fabricated by electrochemical and laser-<strong>in</strong>duced etch<strong>in</strong>g (LIE) processes. The etched samples<br />

exhibited dramatic <strong>in</strong>crease <strong>in</strong> photolum<strong>in</strong>escence <strong>in</strong>tensity as compared to the as-grown samples. The Raman spectra also displayed stronger<br />

<strong>in</strong>tensity peaks which were shifted and broadened as a function of etch<strong>in</strong>g parameters.<br />

Wide-gap III–V nitride semiconductors such as GaN are<br />

most promis<strong>in</strong>g for blue or ultraviolet (UV)-emitt<strong>in</strong>g<br />

devices. For the fabrication of GaN nanostructures-based<br />

devices, it is important to control the size of nano<strong>crystals</strong> as<br />

well as to develop a reliable means of monitor<strong>in</strong>g the size<br />

distributions of the nanocrystallites <strong>in</strong> these lum<strong>in</strong>escent<br />

materials. In recent years, process<strong>in</strong>g techniques for III– V<br />

nitrides nanostructures have been successfully established,<br />

especially for crystal growth, while the most suitable etch<strong>in</strong>g<br />

method is not still concrete because of the excellent chemical<br />

stability and high hardness of these compounds. Plasma<br />

etch<strong>in</strong>g [1] and reactive ion etch<strong>in</strong>g (RIE) [2, 3] have ma<strong>in</strong>ly<br />

been applied so far to etch<strong>in</strong>g of III–V nitride <strong>crystals</strong>. With<br />

these processes, however, damage by ion or plasma<br />

bombardment is a serious problem.<br />

In this work, the fabrication of nanostructured porous GaN<br />

by electrochemical etch<strong>in</strong>g (Figure 1) and laser-<strong>in</strong>duced<br />

etch<strong>in</strong>g (Figure 2) have been attempted. Laser process<strong>in</strong>g<br />

has the advantages of not caus<strong>in</strong>g damage or contam<strong>in</strong>ation,<br />

as well as of special selectivity with high resolution and high<br />

efficiency; however, there are few reports on the laser<br />

process<strong>in</strong>g of III–V nitride <strong>crystals</strong>. The studies on the<br />

fundamental properties of these nanostructures are very<br />

important due to their unique structural and optical<br />

properties relative to the bulk form of the correspond<strong>in</strong>g<br />

materia l.<br />

Figure 1. The electrochemical etch<strong>in</strong>g set-up<br />

GaN th<strong>in</strong> films were grown on n-type Si (111) substrate<br />

us<strong>in</strong>g Veeco model Gen II molecular beam epitaxy (MBE)<br />

system. The GaN samples with (0001) orientation, carrier<br />

concentration of 2.1 10 19 cm -3 , and thickness of 0.47 um<br />

were placed <strong>in</strong> an electrolyte solution with ethanol 99.999%:<br />

HF40% (4:1), and applied with current density of 75mA/cm 2<br />

for the electrochemical etch<strong>in</strong>g, and for the laser-<strong>in</strong>duced<br />

etch<strong>in</strong>g, power density of 12 W/cm 2 fro m a laser diode<br />

(=635 nm, 1.90 eV) was applied. The etch<strong>in</strong>g duration was<br />

12 m<strong>in</strong>.<br />

The as-grown samp les exh ibited relatively surface<br />

morphology. Electrochemical etch<strong>in</strong>g resulted <strong>in</strong> the<br />

formation of pores structures with different sizes and shape.<br />

The etched surface became hexagonal, and pores structures<br />

are conf<strong>in</strong>ed to smaller size. In addition, the pores walls were<br />

very th<strong>in</strong> with some short th<strong>in</strong> tips at the top. On the other<br />

hand, the surface morphology of the sample obta<strong>in</strong>ed after<br />

laser <strong>in</strong>duced etch<strong>in</strong>g process shows deep and extremely th<strong>in</strong><br />

pores.<br />

Photolum<strong>in</strong>escence (PL) spectra showed blue shift<br />

lum<strong>in</strong>escence relative to the as-grown sample. The band<br />

edge emission wavelength shifted from 362.0 to 335.0 nm<br />

for the electrochemically etched sample, and to 346.5 for the<br />

laser-<strong>in</strong>duced etched sample. The average diameter of the<br />

GaN crystallites was about 7-10 n m, as determ<strong>in</strong>ed fro m the<br />

PL data. The Raman spectra for the etched samples revealed<br />

shifted and broadened peaks relative to the as grown GaN<br />

which can be attributed to the quantum conf<strong>in</strong>ement effects<br />

on electronic wave function of the GaN nano<strong>crystals</strong>.<br />

In summary, GaN nanostrutures have been fabricated by<br />

two different etch<strong>in</strong>g techniques. The quantum conf<strong>in</strong>ement<br />

effects are considered to control the mechanism of the<br />

lu m<strong>in</strong>escence <strong>in</strong> the nanocrystallites.<br />

This study was supported by FRGS grant and Universiti<br />

Sa<strong>in</strong>s Malaysia.<br />

*Correspond<strong>in</strong>g author: zai@usm.my<br />

[1] S.A. Smith, C.A. Wolden, M.D. Bremser, A.D. Hanser, R.F.<br />

Davis, W.V. Lampert. Appl. Phys. Lett. 71, 3631 (1997)<br />

[2] D. Basak, M. Verdú, M.T. Montojo, M.A. Sánchez-Garcia, F.J.<br />

Sánchez, E. Munõz, E. Calleja. Semicond. Sci. Technol. 12, 1654<br />

(1997)<br />

[3] J. B. Fedison, T. P. Chow, H. Lu, I. B. Bhat, J. Electrochem.<br />

Soc. 144, L221 (1997)<br />

Figure 2. The laser-<strong>in</strong>duced etch<strong>in</strong>g set-up<br />

6th Nanoscience and Nanotechnology Conference, zmir, 2010 353

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