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Photonic crystals in biology

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P<br />

P Mustafa<br />

Poster Session, Tuesday, June 15<br />

Theme A1 - B702<br />

Deposition and Characterization of ZnS Th<strong>in</strong> Films by Thermionic Vacuum Arc (TVA) Technique<br />

1<br />

1<br />

1<br />

1<br />

1<br />

UMehmet OzkanUP P* Naci EkemP Zafer BalbagP P, Suat PatP P, Sadan KorkmazP<br />

1<br />

PDepartment of Physics, Eskisehir Osmangazi University,Eskisehir 26480, Turkey<br />

Abstract-ZnS th<strong>in</strong> films have been deposited on a glass slide as substrate by thermionic vacuum arc technique from 3-6mm pieces of ZnS slugs.<br />

The deposited ZnS th<strong>in</strong> films were characterized for determ<strong>in</strong><strong>in</strong>g of the structural, morphological, and optical properties. Thickness and<br />

transparency of ZnS th<strong>in</strong> films were measured us<strong>in</strong>g optical method. Refractive <strong>in</strong>dex and band gap energies were calculated by Swanepoel<br />

method. AFM, SEM images and EDS analyses were realized to determ<strong>in</strong>e for surface morphology of produced ZnS th<strong>in</strong> films. Accord<strong>in</strong>g to<br />

obta<strong>in</strong>ed data deposited of ZnS th<strong>in</strong> film are <strong>in</strong> high purity and nano scaled. Band gap of the deposited ZnS th<strong>in</strong> films is approximately 3.7 eV<br />

ZnS is an important II–VI compound semiconductors with a<br />

large band gap of 3.67 eV <strong>in</strong> bulk material. It is used as a key<br />

material for light-emitt<strong>in</strong>g diodes, cathode-ray tubes, th<strong>in</strong> film<br />

electrolum<strong>in</strong>escence, and w<strong>in</strong>dow layers <strong>in</strong> photovoltaic cells.<br />

Semiconductor nano<strong>crystals</strong> have received much attention <strong>in</strong><br />

recent years because of their potential for use <strong>in</strong> fabrication of<br />

optoelectronic devices [1,2]. Preparations of th<strong>in</strong> films of<br />

these compounds are most often uses vacuum evaporation,<br />

chemical vapor deposition, sputter<strong>in</strong>g, spray pyrolysis method<br />

and molecular beam epitaxy. Additionally, chemical bath<br />

deposition and photochemical are us<strong>in</strong>g the deposits ZnS th<strong>in</strong><br />

film. [3, 4]. However, TVA was used firstly <strong>in</strong> ZnS th<strong>in</strong> film<br />

deposition.<br />

Thermionic vacuum arc (TVA) is a new technology for th<strong>in</strong><br />

film deposition [5-8]. This technology has been supplied great<br />

advantages to deposited th<strong>in</strong> films like compact, low<br />

roughness, nanostructures, homogeneities, adhesive, high<br />

deposition rate etc [6]. A lot of materials were used for th<strong>in</strong><br />

films production and characterization <strong>in</strong> this technique. TVA<br />

technique is gives ability to deposited pure th<strong>in</strong> films and<br />

alloys th<strong>in</strong> films. One of the biggest applications of TVA is<br />

th<strong>in</strong> films of high melt<strong>in</strong>g po<strong>in</strong>t materials like C, W, Mo, Nb,<br />

Ta, Re, B etc. Also, TVA cans ability to growth<br />

semiconductor th<strong>in</strong> films for photo voltaic applications and<br />

optoelectronic materials devices. Additionally, pure<br />

compounds th<strong>in</strong> films (two and more atoms) are enable for<br />

this technology like AlOR3R, ZnO, ZnTe, ZnS, SiOR2R, ZrOR2R etc<br />

from our research group [7].<br />

Figure 1. Draw<strong>in</strong>g of the TVA vacuum chamber and electrodes<br />

arrangements<br />

Thermionic vacuum arc materials plasma can be ignited <strong>in</strong><br />

high or ultra high vacuum conditions between a heated<br />

cathode (special design for produced focused electron beam)<br />

and anode materials. Anode materials are consist<strong>in</strong>g of the<br />

crucible and deposited materials. Due to the electron<br />

bombardment of the anode by the accelerated (with high<br />

voltage) and focused thermo-electrodes from the electron gun,<br />

the anode materials first melts and afterwards starts to<br />

evaporates <strong>in</strong> the <strong>in</strong>ter electrodic space <strong>in</strong> vacuum chamber.<br />

Table 1. EDS analysis results for deposited ZnS th<strong>in</strong> films<br />

Elt. L<strong>in</strong>e Intensity<br />

(c/s)<br />

Error<br />

2-sig<br />

Conc<br />

Units<br />

O Ka 21.33 2.920 2.769 wt.%<br />

Si Ka 533.14 14.602 15.837 wt.%<br />

S Ka 1,282.63 22.648 34.931 wt.%<br />

Zn Ka 487.83 13.967 46.463 wt.%<br />

100.000 wt.% Total<br />

Optical properties of deposited ZnS th<strong>in</strong> films are good<br />

harmony <strong>in</strong> literatures. A transmittance spectrum of deposited<br />

ZnS th<strong>in</strong> film is proper for Swanepoel method. Calculated<br />

refractive <strong>in</strong>dex value is 2.2. Band gap energy of it is<br />

approximately 3.7 eV. These results are also good harmony <strong>in</strong><br />

literature and supported our results. Other measurement and<br />

analyses techniques show that surface of the deposited th<strong>in</strong><br />

films are smooth, low roughness, compact. Additionally<br />

impurities of the structures were very small (4%). This<br />

impurities data were collect from glass slides. Because of<br />

deposited layer was 300 nm.<br />

*Correspond<strong>in</strong>g author: mozkan@ogu.edu.tr<br />

[1] P. Roy, J. R. Ota, S. K. Srivastava, Th<strong>in</strong> Solid Films, 515 (2006)<br />

1912-1917<br />

[2] H. J. Lee, S. I. Lee, Current Applied Physics 7 (2007) 193-197<br />

[3] M. Innocenti, G. Pezzat<strong>in</strong>i, F. Forni, M.L. Foresti, J. Electrochem.<br />

Soc. 148 (2001) C357.<br />

[4] J. H. Fendler, Nanoparticles and Nanostructured Films, Wiley-<br />

VCH, We<strong>in</strong>heim. 1998<br />

[5] N. Ekem, G. Musa, S.Pat, Z.Balbag, I. Cenik , R. Vladoiu, J. Opt.<br />

and Adv. Mater, Vol. 10, No. 3, March 2008, p. 672 – 674<br />

[6] C.Surdu-Bob, I.Mustata, C.Iacob, Journal of Optoelectronics and<br />

Advanced Materials, Vol9 No9,2007,2932-2934<br />

[7] G.Musa, I.Mustata, V.Ciup<strong>in</strong>a, R.Vladoiu, G.Prodan, E.Vasile,<br />

H.Ehrich , Diamond and Related Materials 13 (2004) 1398–1401<br />

[8] HBalbag MZH, HPat SH, HCenik MIH. , HAkan TH, HEkem NH, HMusa GH,<br />

Journal of Optoelectronics and Advanced Materials, Vol. 9 No:<br />

4, 2007,p. Pages: 858-861<br />

6th Nanoscience and Nanotechnology Conference, zmir, 2010 414

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