Photonic crystals in biology
Photonic crystals in biology
Photonic crystals in biology
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P<br />
P Mustafa<br />
Poster Session, Tuesday, June 15<br />
Theme A1 - B702<br />
Deposition and Characterization of ZnS Th<strong>in</strong> Films by Thermionic Vacuum Arc (TVA) Technique<br />
1<br />
1<br />
1<br />
1<br />
1<br />
UMehmet OzkanUP P* Naci EkemP Zafer BalbagP P, Suat PatP P, Sadan KorkmazP<br />
1<br />
PDepartment of Physics, Eskisehir Osmangazi University,Eskisehir 26480, Turkey<br />
Abstract-ZnS th<strong>in</strong> films have been deposited on a glass slide as substrate by thermionic vacuum arc technique from 3-6mm pieces of ZnS slugs.<br />
The deposited ZnS th<strong>in</strong> films were characterized for determ<strong>in</strong><strong>in</strong>g of the structural, morphological, and optical properties. Thickness and<br />
transparency of ZnS th<strong>in</strong> films were measured us<strong>in</strong>g optical method. Refractive <strong>in</strong>dex and band gap energies were calculated by Swanepoel<br />
method. AFM, SEM images and EDS analyses were realized to determ<strong>in</strong>e for surface morphology of produced ZnS th<strong>in</strong> films. Accord<strong>in</strong>g to<br />
obta<strong>in</strong>ed data deposited of ZnS th<strong>in</strong> film are <strong>in</strong> high purity and nano scaled. Band gap of the deposited ZnS th<strong>in</strong> films is approximately 3.7 eV<br />
ZnS is an important II–VI compound semiconductors with a<br />
large band gap of 3.67 eV <strong>in</strong> bulk material. It is used as a key<br />
material for light-emitt<strong>in</strong>g diodes, cathode-ray tubes, th<strong>in</strong> film<br />
electrolum<strong>in</strong>escence, and w<strong>in</strong>dow layers <strong>in</strong> photovoltaic cells.<br />
Semiconductor nano<strong>crystals</strong> have received much attention <strong>in</strong><br />
recent years because of their potential for use <strong>in</strong> fabrication of<br />
optoelectronic devices [1,2]. Preparations of th<strong>in</strong> films of<br />
these compounds are most often uses vacuum evaporation,<br />
chemical vapor deposition, sputter<strong>in</strong>g, spray pyrolysis method<br />
and molecular beam epitaxy. Additionally, chemical bath<br />
deposition and photochemical are us<strong>in</strong>g the deposits ZnS th<strong>in</strong><br />
film. [3, 4]. However, TVA was used firstly <strong>in</strong> ZnS th<strong>in</strong> film<br />
deposition.<br />
Thermionic vacuum arc (TVA) is a new technology for th<strong>in</strong><br />
film deposition [5-8]. This technology has been supplied great<br />
advantages to deposited th<strong>in</strong> films like compact, low<br />
roughness, nanostructures, homogeneities, adhesive, high<br />
deposition rate etc [6]. A lot of materials were used for th<strong>in</strong><br />
films production and characterization <strong>in</strong> this technique. TVA<br />
technique is gives ability to deposited pure th<strong>in</strong> films and<br />
alloys th<strong>in</strong> films. One of the biggest applications of TVA is<br />
th<strong>in</strong> films of high melt<strong>in</strong>g po<strong>in</strong>t materials like C, W, Mo, Nb,<br />
Ta, Re, B etc. Also, TVA cans ability to growth<br />
semiconductor th<strong>in</strong> films for photo voltaic applications and<br />
optoelectronic materials devices. Additionally, pure<br />
compounds th<strong>in</strong> films (two and more atoms) are enable for<br />
this technology like AlOR3R, ZnO, ZnTe, ZnS, SiOR2R, ZrOR2R etc<br />
from our research group [7].<br />
Figure 1. Draw<strong>in</strong>g of the TVA vacuum chamber and electrodes<br />
arrangements<br />
Thermionic vacuum arc materials plasma can be ignited <strong>in</strong><br />
high or ultra high vacuum conditions between a heated<br />
cathode (special design for produced focused electron beam)<br />
and anode materials. Anode materials are consist<strong>in</strong>g of the<br />
crucible and deposited materials. Due to the electron<br />
bombardment of the anode by the accelerated (with high<br />
voltage) and focused thermo-electrodes from the electron gun,<br />
the anode materials first melts and afterwards starts to<br />
evaporates <strong>in</strong> the <strong>in</strong>ter electrodic space <strong>in</strong> vacuum chamber.<br />
Table 1. EDS analysis results for deposited ZnS th<strong>in</strong> films<br />
Elt. L<strong>in</strong>e Intensity<br />
(c/s)<br />
Error<br />
2-sig<br />
Conc<br />
Units<br />
O Ka 21.33 2.920 2.769 wt.%<br />
Si Ka 533.14 14.602 15.837 wt.%<br />
S Ka 1,282.63 22.648 34.931 wt.%<br />
Zn Ka 487.83 13.967 46.463 wt.%<br />
100.000 wt.% Total<br />
Optical properties of deposited ZnS th<strong>in</strong> films are good<br />
harmony <strong>in</strong> literatures. A transmittance spectrum of deposited<br />
ZnS th<strong>in</strong> film is proper for Swanepoel method. Calculated<br />
refractive <strong>in</strong>dex value is 2.2. Band gap energy of it is<br />
approximately 3.7 eV. These results are also good harmony <strong>in</strong><br />
literature and supported our results. Other measurement and<br />
analyses techniques show that surface of the deposited th<strong>in</strong><br />
films are smooth, low roughness, compact. Additionally<br />
impurities of the structures were very small (4%). This<br />
impurities data were collect from glass slides. Because of<br />
deposited layer was 300 nm.<br />
*Correspond<strong>in</strong>g author: mozkan@ogu.edu.tr<br />
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1912-1917<br />
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[3] M. Innocenti, G. Pezzat<strong>in</strong>i, F. Forni, M.L. Foresti, J. Electrochem.<br />
Soc. 148 (2001) C357.<br />
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VCH, We<strong>in</strong>heim. 1998<br />
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[6] C.Surdu-Bob, I.Mustata, C.Iacob, Journal of Optoelectronics and<br />
Advanced Materials, Vol9 No9,2007,2932-2934<br />
[7] G.Musa, I.Mustata, V.Ciup<strong>in</strong>a, R.Vladoiu, G.Prodan, E.Vasile,<br />
H.Ehrich , Diamond and Related Materials 13 (2004) 1398–1401<br />
[8] HBalbag MZH, HPat SH, HCenik MIH. , HAkan TH, HEkem NH, HMusa GH,<br />
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6th Nanoscience and Nanotechnology Conference, zmir, 2010 414