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Photonic crystals in biology

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Poster Session, Tuesday, June 15<br />

Theme A1 - B702<br />

Effects of Artificial P<strong>in</strong>n<strong>in</strong>g Centers on NdBa 2 Cu 3 O 7-δ Th<strong>in</strong> Films Prepared by PLD<br />

Erdal Sönmez 1* , Mücahit Yılmaz 2 , Mehmet Yılmaz 1 , Refik Dilber 1 , Bahatt<strong>in</strong> Düzgün 1 and Mehmet Ertuğrul 3<br />

1 K. K. Education Faculty, Department of Physics, Ataturk University, Erzurum, Turkey<br />

2 Education Faculty, Department of Physics, Selcuk University, Konya, Turkey<br />

3 Eng<strong>in</strong>eer<strong>in</strong>g Faculty, Department of Electric-Electronic, Ataturk University, Erzurum, Turkey<br />

Abstract— In this study, the effect of artificial p<strong>in</strong>n<strong>in</strong>g centers (APC) on the critical properties of NdBa 2 Cu 3 O 7-δ (Nd-123) superconductive th<strong>in</strong><br />

films grown on Ni-W metallic substrates was <strong>in</strong>vestigated. Nd-123 superconductive ceramic materials were prepared by solid state reaction<br />

technique and then this ceramic material was used as target for the produc<strong>in</strong>g Nd-123 superconductive th<strong>in</strong> films with pulsed laser deposition<br />

(PLD). APCs were prepared with the deposition of Nd 2 O 3 by PLD. The obta<strong>in</strong>ed superconductive th<strong>in</strong> films were characterized by x-ray<br />

diffraction (XRD) analysis, morphological <strong>in</strong>vestigations of scann<strong>in</strong>g electron microscopy (SEM) and atomic force microscopy (AFM) images,<br />

and electrical analysis such as R-T and I-V measurements. As a result of these analyses, it was determ<strong>in</strong>ed that APCs had important role for the<br />

flux p<strong>in</strong>n<strong>in</strong>g and it provide the <strong>in</strong>creas<strong>in</strong>g about 25% for the critical current value (J c ).<br />

For many practical applications of high temperature<br />

superconductors, high critical current densities (J c ), especially<br />

<strong>in</strong> the presence of large magnetic fields, are required. High<br />

temperature superconductivity (HTS) coated conductors<br />

should employ the optimized flux p<strong>in</strong>n<strong>in</strong>g centers such as<br />

<strong>in</strong>tr<strong>in</strong>sic or extr<strong>in</strong>sic imperfections, which can prevent the<br />

motion of flux l<strong>in</strong>es, <strong>in</strong> order to achieve high J c values <strong>in</strong> the<br />

presence of high magnetic fields [1-3]. Due to the short<br />

coherence length <strong>in</strong> high temperature superconductors,<br />

nanosized non-superconduct<strong>in</strong>g regions are necessary to act as<br />

effective p<strong>in</strong>n<strong>in</strong>g centers <strong>in</strong> NdBa 2 Cu 3 O 7-δ (Nd-123) [4-5].<br />

In the study, we have grown epitaxial Nd-123 films via<br />

pulsed laser deposition. Stoicheiometric Nd-123 powder was<br />

synthesized by us<strong>in</strong>g commercially available powders of<br />

Nd 2 O 3 , BaCO 3 , and CuO with purities of over 99,9% via<br />

solid-state synthesis at 920 ◦C for 24 h. After, Nd-123 films<br />

were prepared with a configuration of Ni–3 at.%W<br />

(50μm)/MgO (30nm)/STO(200nm)/CeO 2 (30nm) via pulsed<br />

laser deposition us<strong>in</strong>g a Kr-F excimer laser (wave length<br />

θ=248nm) at a repetition rate of 10 Hz at a substrate<br />

temperature (Ts) of 790 0 C <strong>in</strong> 1%O 2 /Ar gas at a deposition<br />

pressure of 800 mTorr. The laser energy density and substratetarget<br />

distance were 1,5 J cm −2 and 6,5 cm, respectively.<br />

Besides, to control the density of Nd 2 O 3 nanoislands that they<br />

will serve as artificial p<strong>in</strong>n<strong>in</strong>g centers (APCs), 1, 5, 10, 25, 50<br />

and 100 laser pulses for Nd 2 O 3 target ablation were selected.<br />

Afterwards the films were cooled to room temperature with<strong>in</strong><br />

an hour <strong>in</strong> 500 Torr of oxygen and after deposit<strong>in</strong>g sputtered<br />

Ag electrodes onto the films. Transport properties of the<br />

samples were measured us<strong>in</strong>g the standard four-probe method.<br />

Phase and textural analysis was undertaken us<strong>in</strong>g X-ray<br />

diffraction (XRD). Surface morphology of films were<br />

<strong>in</strong>vestigated by us<strong>in</strong>g scann<strong>in</strong>g electron microscopy (SEM)<br />

and atomic force microscopy (AFM) images.<br />

(a)<br />

(b)<br />

Figure 2. AFM images of samples a)APCs b)3-D image of Nd-123<br />

th<strong>in</strong> film<br />

Typical AFM image of samples prepared by the 25-pulse<br />

PLD process is shown <strong>in</strong> Fig. 2 (a). The Nd 2 O 3 nanoisland<br />

were formed randomly on the substrates, and each nanoisland<br />

was isolated and homogeneously distributed. Fig. 2 (b) reveals<br />

that roughness of the film is 11 nm.<br />

Figure 3. Temperature versus J c curve of the Nd-123 films at 0 T<br />

APCs were successfully <strong>in</strong>troduced <strong>in</strong>to Nd-123 th<strong>in</strong> films<br />

by the deposition of uniformly distributed Nd 2 O 3 nano-island<br />

grown on substrate. The density and size of nano-islands were<br />

controlled by the deposition parameters and AFM. The critical<br />

current of the Nd-123 th<strong>in</strong> films grown on substrates with<br />

nano-islands was enhanced. We reached that best performance<br />

<strong>in</strong> Nd-123 th<strong>in</strong> film prepared with 25 pulses on substrate. This<br />

condition has been observed by the direct AFM that Nd 2 O 3<br />

nano-islands effectively generated APCs <strong>in</strong>side Nd-123 film.<br />

Fig. 3. show that APCs had important role for the flux p<strong>in</strong>n<strong>in</strong>g<br />

and it provide the <strong>in</strong>creas<strong>in</strong>g about 25% for the critical current<br />

value (J c ).<br />

*Correspond<strong>in</strong>g author: esonmez@atauni.edu.tr<br />

Figure 1. X-ray diffraction of the Nd-123 th<strong>in</strong> films<br />

[1] M. Murakami et al., 1989. Jpn J. Appl. Phys. 28 1189.<br />

[2] S. Neesleshwar et. al., 1999. Mat. Sci. & Eng. B. 65 164-169.<br />

[3] K. J. Song et. al., 2006. Physica C 445-448, 656-659.<br />

[4] P. Mele et. al., 2005. Physica C 426-431, 1108-1112.<br />

[5] P. Mele et. al., 2006. Physica C 445-448, 648-651.<br />

6th Nanoscience and Nanotechnology Conference, İzmir, 2010 239

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