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248 Appendix D. Site Reports—Japan instrument that can look at nanoscale electrical characteristics (work function or charge distribution) as well as structure (topography) by detecting electric long range forces with about 1 mV sensitivity. The instrument is based on an STM or atomic force microscope (AFM), but by oscillating the probe (tip), it is possible to obtain additional information regarding dielectric constant, etc. (Yokoyama et al. 1994; Yokoyama and Inoue 1994). With the SMM, it is even possible to look at living cells under water. The instrument is in use at ETL in various experimental forms, but it is also now beginning to be commercialized by Seiko Instruments (in a price range of $500 thousand to $1 million) in a UHV version with variable temperature capabilities (70-500 K) and both SMM and AFM modes of operation. Future directions for the research work in this area will investigate semiconductor nanodevices under UHV conditions and problems in nanobiology under water. New functionalities for the SMM will be developed using higher frequencies to investigate band structure and the effects of doping, as well as optoelectrical investigations in combination with near-field optical microscopy (an effort funded by AST). Finally, Dr. Hiroyuki Oyanagi described some work in the Physical Science Division on probing nanostructures with EXAFS. Dr. Oyanagi’s group has a close relationship with a number of other groups worldwide. Its EXAFS studies are being carried out at an undulator beamline at the Photon Factory about ten miles from Tsukuba. They have been able to induce local melting by optical excitation and subsequent quenching-in of disordered regions in Se, and they are hoping to use this method for memory applications, if it can be done microscopically. Dr. Oyanagi also mentioned very briefly some work going on in ETL’s Materials Science Division on nanostructured one-dimensionally modulated GaAs quantum well systems. REFERENCES Yokoyama, H., T. Inoue, and J. Itoh. 1994. Appl. Phys. Lett. 65:3143 Yokoyama, H., and T. Inoue. 1994. Thin Solid Films 242:33.
Appendix D. Site Reports—Japan 249 Site: Hitachi Central Research Laboratory Planning Office 1-280 Higashi-Koigakubo Kokubunji-shi Tokyo 185-8601, Japan Fax: 81-423-27-7695 Date Visited: 22 July 1997 WTEC: Hosts: E. Hu (report author), L. Jelinski, C. Koch, D. Shaw, C. Uyehara Dr. Shigeo Nagashima, Deputy General Manager and Head of the Planning Office Dr. Tadashi Ikeda, Head, Research Cooperation Center, Planning Office Ms. Yuko Nakamura, Research Cooperation Center, Planning Office Dr. Masanobu Miyao, Head, Electronics Material Center, Electron Devices Research Department Dr. Toshio Katsuyama, Sr. Researcher, Optoelectronics Research Department Dr. Atsushi Kikukawa, Research Scientist, Advanced Research Laboratory Dr. Masaaki Futamoto, Chief Research Scientist, Information Storage Research Department. Dr. Kazuo Yano, Sr. Researcher, Systems LSI Research Department INTRODUCTION The Research Cooperation Center Planning Office of Hitachi Central Research Laboratory hosted the WTEC team’s visit. We were greeted by Dr. Shigeo Nagashima, Deputy General Manager and Head of the Planning Office. Exact figures were not available as to the representation of nanotechnology research at Hitachi.
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National Science and Technology Cou
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WTEC Panel on NANOSTRUCTURE SCIENCE
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ABSTRACT This report reviews the st
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Foreword Timely information on scie
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Foreword iii collaboration and thus
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Contents Foreword Table of Contents
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List of Figures 1.1 Organization of
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List of Figures ix 5.12 Granular GM
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List of Tables ES.1 Technological I
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Executive Summary Richard W. Siegel
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Executive Summary xix past decade,
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Executive Summary xxi TABLE ES.2. C
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Executive Summary xxiii blocks, and
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Chapter 1 Introduction and Overview
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1. Introduction and Overview 3 •
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1. Introduction and Overview 5 worl
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1. Introduction and Overview 7 grow
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1. Introduction and Overview 9 lead
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1. Introduction and Overview 11 2.
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Chapter 2 Synthesis and Assembly Ev
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2. Synthesis and Assembly 17 transi
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2. Synthesis and Assembly 19 probe
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2. Synthesis and Assembly 21 by adj
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2. Synthesis and Assembly 23 blocks
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2. Synthesis and Assembly 25 Self-A
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2. Synthesis and Assembly 27 Figure
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2. Synthesis and Assembly 29 us to
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2. Synthesis and Assembly 31 Brotzm
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2. Synthesis and Assembly 33 Siegel
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Chapter 3 Dispersions and Coatings
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3. Dispersions and Coatings 37 exis
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3. Dispersions and Coatings 39 more
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3. Dispersions and Coatings 41 into
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3. Dispersions and Coatings 45 oppo
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3. Dispersions and Coatings 47 Kanz
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Chapter 4 High Surface Area Materia
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4. High Surface Area Materials 51 w
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4. High Surface Area Materials 53 F
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4. High Surface Area Materials 55 T
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4. High Surface Area Materials 57 s
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4. High Surface Area Materials 59 T
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4. High Surface Area Materials 61 F
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4. High Surface Area Materials 63 m
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4. High Surface Area Materials 65 I
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Chapter 5 Functional Nanoscale Devi
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5. Functional Nanoscale Devices 69
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Chapter 6 Bulk Behavior of Nanostru
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6. Bulk Behavior of Nanostructured
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Chapter 7 Biologically Related Aspe
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Chapter 8 Research Programs on Nano
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8. Research Programs on Nanotechnol
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APPENDICES Appendix A. Biographies
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Appendix A. Biographies of Panelist
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Appendix B. Site Reports—Europe S
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Appendix B. Site Reports—Europe 1
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Appendix F. Glossary 2DEG A/D AAAR
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Appendix F. Glossary 329 ESPRIT ESR
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Appendix F. Glossary 331 MA MBE mCP
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Appendix F. Glossary 335 WTEC XAS X
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