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Nanostructure Science and Technology - World Technology ...

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Appendix F. Glossary 333<br />

PVDF<br />

QCA<br />

QCL<br />

QD or Q-dot<br />

QEq<br />

QM<br />

QUEST<br />

rf<br />

RCMM<br />

redox<br />

RGB<br />

RHEED<br />

RIE<br />

RIKEN<br />

RT<br />

RTD<br />

SAM<br />

SAMIM<br />

SAW<br />

SAXS<br />

SBIR<br />

SED<br />

SELETE<br />

SEM<br />

Sematech<br />

SEMPA<br />

SEP<br />

SET<br />

SFM<br />

SFr<br />

SIMS<br />

SINQ<br />

SIRI<br />

SMM<br />

SNOM<br />

SOI<br />

Poly(vinylidene fluoride)<br />

Quantum cellular automata<br />

Quantum cascade lasers<br />

Quantum dot<br />

Charge equilibration<br />

Quantum mechanics/mechanical<br />

(U.S.) Center for Quantized Electronic Structures, UCSB<br />

Radio frequency<br />

Reduced cell multipole method<br />

Reduction-oxidation<br />

Red, green, blue<br />

Reflection high energy electron diffraction<br />

Reactive ion etching<br />

(Japan, STA) Institute of Physical <strong>and</strong> Chemical Research<br />

Room temperature<br />

Resonant tunneling diode<br />

Self-assembled monolayer<br />

Solvent-assisted microcontact molding<br />

Surface acoustic wave device<br />

Small angle X-ray scattering<br />

(U.S.) Small Business for Innovative Research program<br />

Single electron device<br />

(Japan) Semiconductor Leading Edge Technologies, Inc.<br />

(consortium)<br />

Scanning electron microscope/microscopy<br />

(U.S.) Semiconductor Manufacturing <strong>and</strong> <strong>Technology</strong> Institute<br />

Scanning electron microscopy with polarization analysis<br />

Size-dependent evolutionary pattern<br />

Single-electron transistor<br />

Scanning force microscopy/microscope<br />

Swiss franc<br />

Secondary ion mass spectrometry<br />

(Switzerl<strong>and</strong>) Spallation Neutron Source<br />

(Japan) Semiconductor Industry Research Institute<br />

Scanning Maxwell-stress Microscope<br />

Scanning near-field optical microscopy<br />

Silicon on insulator

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