1470 JOURNAL OF COMPUTERS, VOL. 8, NO. 6, JUNE 2013 TABLE IV. DIAGNOSIS RESULT OF MULTI-LAYER ANN (WITHOUT PCA) Ma<strong>in</strong> SVM Auxiliary SVM A Auxiliary SVM B No noise 98.84% 100% 100% 10% white nosie 96.31% 100% 100% Table IV shows diagnosis result of the multi-layer ANN without PCA and the dimension of the <strong>in</strong>put data of the ma<strong>in</strong> ANN is 11. Table V shows diagnosis result of the multi-layer ANN with PCA. Here, only the <strong>in</strong>put data of the ma<strong>in</strong> ANN is transformed by the technique of PCA and the dimension of the new <strong>in</strong>put data of the ma<strong>in</strong> ANN is 8. TABLE V. DIAGNOSIS RESULT OF MAIN ANN (WITH PCA) Ma<strong>in</strong> SVM No noise 99.24% 10% white nosie 98.43% It could be seen from Table IV and Table V that the diagnosis precision of the ma<strong>in</strong> ANN with PCA is higher than that without PCA. It could be deduced that the ANN with PCA must be tra<strong>in</strong>ed better than the ANN without PCA and has better generalization ability. V. CONCLUSIONS Additional signals are required <strong>in</strong> order to isolate more complicated faults of open-circuit occurr<strong>in</strong>g <strong>in</strong> two devices <strong>in</strong> NPC <strong>in</strong>verter dur<strong>in</strong>g certa<strong>in</strong> period. Note that this is not just a theoretical problem but a practical one because some failures have been reported recently, see [21]-[22]. In this paper, the voltages <strong>in</strong> all the upper, middle and down bridge are suggested to extract fault features. A scheme of multi-layer ANN is proposed to implement fault diagnosis of NPC <strong>in</strong>verter, <strong>in</strong>volv<strong>in</strong>g the simple open-circuit of one device or more devices. Better precision could be achieved when the <strong>in</strong>put data is transformed by PCA. ACKNOWLEDGMENT The project is supported by Innovation Project of Shanghai Municipal Education Commission numbered 12zz191, Graduates’ Innovation Fund of Shanghai Maritime University numbered YC2011061. REFERENCES [1] C. Hochgraf, R. Lasseter, D. Divan, T. Lipo, “Comparison of Multilevel Inverters for Static Var Compensation, “ IEEE Conference on Industrial Applications, 1994, pp.921-928. [2] R. W. Menzies, P.Steimer, J.K.Ste<strong>in</strong>ke, “Five level GTO Inverters for Large Induction MotorDrives”, IEEE IAS Annual Meet<strong>in</strong>g, 1993, pp.593-601. [3] H. Stemmler, “Power Electronics <strong>in</strong> Electric Traction Applications”, IEEE IECON’93, 1993, pp. 707-713. [4] A. Steimel, “Electric Railway Traction <strong>in</strong> Europe”, IEEE Transactions on Industry Applications, Vol.2, 1996, pp.7- 17. [5] Jih-Sheng Lai, Fang Zheng Peng, “Multilevel Converters- A New Breed of Power Converters”, IEEE Transctions on Industry Applications, Vol.32, 1996, pp. 509-517. [6] Ceballos S., Pou J., Robles E., Zaragoza J., Mart<strong>in</strong> J. L, “Three-Leg Fault-Tolerant Neutral-Po<strong>in</strong>t-Clamped Converter”, IEEE International Symposium on Industrial Electronics, 2007, pp.3180-3185. [7] Tang Q<strong>in</strong>g-quan, Yan Shi-chao, Lu Song-sheng, Liu Zheng-zhi, “Open-circuit Fault Diagnosis of Transistor <strong>in</strong> Three-level Inverter”, Proceed<strong>in</strong>gs of the CSEE, 2008, 28 (21): 26-32. [8] Zhou J<strong>in</strong>g-hua, Liu Hui-chen, Yao Lan-ya, Li Zheng-xi, “Research on the Faults Characteristics and the Fault Diagnosis Methods of Three-level High-power Inverter”, Power Electronics, 2009, 43 (6), pp.1-3 [9] Ho-In Son, Tae-J<strong>in</strong> Kim, Dae-Wook Kang, Dong-Seok Hyun, “Fault Diagnosis and Neutral Po<strong>in</strong>t Voltage Control When the 3-level Inverter Faults Occur”, Power Electronics Specialists Conference, 2004, pp.4558- 4563. [10] Jae-Chul Lee, Tae-J<strong>in</strong> Kim, Dae-Wook Kang, Dong-Seok Hyun, “A Control Method for Improvement of Reliability <strong>in</strong> Fault Tolerant NPC Inverter System”, 37th IEEE Power Electronics Specialists Conference, 2006, pp.1-5. [11] Bo Fan, Yix<strong>in</strong> Y<strong>in</strong>, Cunfa Fu, “A Method of Inverter Circuit Fault Diagnosis Based on BP Neural Network and D-S Evidence Theory”, 8th World Congress on Intelligent Control and Automation, 2010, pp.2249-2253. [12] Wang Baocheng, Li Danhe, Sun Xiaofeng, Wu Weiyang, “The Studies of S<strong>in</strong>gle-phase Inverter Fault Diagnosis Based on D-S Evidential Theory and Fuzzy Logical Theory”, CES/IEEE 5th International on Power Electronics and Motion Control Conference, 2006, pp.1-4. [13] Dong-Eok Kim, Dong-Choon Lee, “Fault Diagnosis of Three-phase PWM Inverters Us<strong>in</strong>g Wavelet and SVM”, IEEE International Symposium on Industrial Electronics, 2008, pp.329-334. [14] Liang hong, Wang yan-qiu, “Study of Fault Diagnosis on Three-phase S<strong>in</strong>e-PWM Inverter Based on Rough Setneural Network System”, Journal of Liaon<strong>in</strong>g Istitute of Technology, 2005, 25 (6), pp.351-353. [15] Babu B.P., Sr<strong>in</strong>ivas J.V.S., Vikranth B., Premchnad P., “Fault Diagnosis <strong>in</strong> Multi-level Inverter System Us<strong>in</strong>g Adaptive Back Propagation Neural Network”, India Conference, INDICON 2008, pp.494-498. [16] Foito D., Mart<strong>in</strong>s J.F., Pires V.F., Maia, J., “An Eigenvalue/Eigenvector 3D Current Reference Method for Detection and Fault Diagnosis <strong>in</strong> a Voltage Source Inverter”, 35th Annual Conference of IEEE on Industrial Electronics, 2009, pp.190-194. [17] Khomfoi S., Tolbert L.M., “Fault Diagnosis and Reconfiguration for Multilevel Inverter Drive Us<strong>in</strong>g AI- Based Techniques”, IEEE Transactions on Industrial Electronics, vol.54, no.6, 2007, pp.2954-2968. [18] Hu Guang-shu, “Digital Signal Process<strong>in</strong>g-theory, Algorithms and Implementation”, Beij<strong>in</strong>g, Ts<strong>in</strong>ghua University Press, 2003. [19] L<strong>in</strong> Wei-xun, “Modern Power Electronics Technology”, Beij<strong>in</strong>g, Mach<strong>in</strong>ery Industry Press, 2006. [20] U.Ahmad, A.Gavrilov, S.Lee, “Modular Multilayer Perceptron for WLAN Based Localization”, Proc. of International Jo<strong>in</strong>t Conference on Neural Networks, 2006, pp. 3465-3471. © 2013 ACADEMY PUBLISHER
JOURNAL OF COMPUTERS, VOL. 8, NO. 6, JUNE 2013 1471 [21] Sun J<strong>in</strong>g, “Fault Recovery Process<strong>in</strong>g for CRH2 Multipleunit Traction Converter”, Railway Locomotive & Car, vol. 29, no. 6, pp. 64-66, 2009,. [22] Li Li-jun, Li Pu-m<strong>in</strong>, “Fault Analysis and Recovery Process<strong>in</strong>g for CRH2 M ultiple-unit Traction Converter”, Railway Locomotive & Car, vol. 28, no. 4, pp. 69-70, 2008. Danjiang Chen was born <strong>in</strong> N<strong>in</strong>gbo, Ch<strong>in</strong>a, on Feb 15, 1979. He received the B.S. and M.S. degrees <strong>in</strong> electrical eng<strong>in</strong>eer<strong>in</strong>g from Zhejiang University, Hangzhou, Ch<strong>in</strong>a, <strong>in</strong> 2002 and 2005, respectively. He is currently work<strong>in</strong>g toward the Ph.D. degree <strong>in</strong> Shanghai Maritime University, Shanghai, Ch<strong>in</strong>a. After received the M.S. degree, he jo<strong>in</strong>ed Zhejiang Wanli University, where he is a lecturer <strong>in</strong> the faculty of electronic and <strong>in</strong>formation eng<strong>in</strong>eer<strong>in</strong>g. His current area of research <strong>in</strong>cludes power electronics and their fault diagnosis system. Y<strong>in</strong>zhong Ye was born <strong>in</strong> Zhejiang, Ch<strong>in</strong>a, <strong>in</strong> 1964. He received the B.Sc., M.Sc. and Ph.D. degrees <strong>in</strong> <strong>in</strong>dustrial automation and electronic eng<strong>in</strong>eer<strong>in</strong>g from East Ch<strong>in</strong>a University of Science and Technology, Shanghai, Ch<strong>in</strong>a <strong>in</strong> 1982, 1985 and 1989, respectively. After receiv<strong>in</strong>g the M.Sc. degree, he jo<strong>in</strong>ed the Research Institute of Automation, East Ch<strong>in</strong>a University of Science and Technology, Shanghai, Ch<strong>in</strong>a, where he had worked as a Teach<strong>in</strong>g Assistant, Lecturer and Associate Professor. In 1994 he jo<strong>in</strong>ed Shanghai Maritime University, Shanghai, Ch<strong>in</strong>a, as a Professor of electrical and automatic control eng<strong>in</strong>eer<strong>in</strong>g. S<strong>in</strong>ce 2009 he has jo<strong>in</strong>ed Shanghai Institute of Technology, Shanghai, Ch<strong>in</strong>a as Vice President and Professor <strong>in</strong> electrical eng<strong>in</strong>eer<strong>in</strong>g and automation. His ma<strong>in</strong> research <strong>in</strong>terests and experience <strong>in</strong>clude fault diagnosis, fault-tolerant control, system simulation, power electronics, measurement and control of <strong>in</strong>dustrial processes. Dr. Ye is a Vice Chairperson of SAFEPROCESS CHINA, Ch<strong>in</strong>ese Association of Automation. Rong Hua was born <strong>in</strong> Shanghai, Ch<strong>in</strong>a, on March 26, 1960. He received the B.S. degrees <strong>in</strong> motor control eng<strong>in</strong>eer<strong>in</strong>g from Shanghai University, Shanghai, Ch<strong>in</strong>a, <strong>in</strong> July 1982, and the M.S. degrees <strong>in</strong> control eng<strong>in</strong>eer<strong>in</strong>g from East Ch<strong>in</strong>a University of Science and Technology, Shanghai, Ch<strong>in</strong>a, <strong>in</strong> March 2008. At present, he jo<strong>in</strong>ed the Shanghai Institute of Technology, Shanghai, Ch<strong>in</strong>a, as a Professor and a Master's Supervisor of electronics Information eng<strong>in</strong>eer<strong>in</strong>g. His ma<strong>in</strong> research <strong>in</strong>terests and experience <strong>in</strong>clude control eng<strong>in</strong>eer<strong>in</strong>g, signal process<strong>in</strong>g and power electronics and fault diagnosis system. © 2013 ACADEMY PUBLISHER
- Page 1 and 2:
Journal of Computers ISSN 1796-203X
- Page 3:
Corn Moisture Measurement using a C
- Page 6 and 7:
1378 JOURNAL OF COMPUTERS, VOL. 8,
- Page 8 and 9:
1380 JOURNAL OF COMPUTERS, VOL. 8,
- Page 10 and 11:
1382 JOURNAL OF COMPUTERS, VOL. 8,
- Page 12 and 13:
1384 JOURNAL OF COMPUTERS, VOL. 8,
- Page 14 and 15:
1386 JOURNAL OF COMPUTERS, VOL. 8,
- Page 16 and 17:
1388 JOURNAL OF COMPUTERS, VOL. 8,
- Page 18 and 19:
1390 JOURNAL OF COMPUTERS, VOL. 8,
- Page 20 and 21:
1392 JOURNAL OF COMPUTERS, VOL. 8,
- Page 22 and 23:
1394 JOURNAL OF COMPUTERS, VOL. 8,
- Page 24 and 25:
1396 JOURNAL OF COMPUTERS, VOL. 8,
- Page 26 and 27:
1398 JOURNAL OF COMPUTERS, VOL. 8,
- Page 28 and 29:
1400 JOURNAL OF COMPUTERS, VOL. 8,
- Page 30 and 31:
1402 JOURNAL OF COMPUTERS, VOL. 8,
- Page 32 and 33:
1404 JOURNAL OF COMPUTERS, VOL. 8,
- Page 34 and 35:
1406 JOURNAL OF COMPUTERS, VOL. 8,
- Page 36 and 37:
1408 JOURNAL OF COMPUTERS, VOL. 8,
- Page 38 and 39:
1410 JOURNAL OF COMPUTERS, VOL. 8,
- Page 40 and 41:
1412 JOURNAL OF COMPUTERS, VOL. 8,
- Page 42 and 43:
1414 JOURNAL OF COMPUTERS, VOL. 8,
- Page 44 and 45:
1416 JOURNAL OF COMPUTERS, VOL. 8,
- Page 46 and 47:
1418 JOURNAL OF COMPUTERS, VOL. 8,
- Page 48 and 49: 1420 JOURNAL OF COMPUTERS, VOL. 8,
- Page 50 and 51: 1422 JOURNAL OF COMPUTERS, VOL. 8,
- Page 52 and 53: 1424 JOURNAL OF COMPUTERS, VOL. 8,
- Page 54 and 55: 1426 JOURNAL OF COMPUTERS, VOL. 8,
- Page 56 and 57: 1428 JOURNAL OF COMPUTERS, VOL. 8,
- Page 58 and 59: 1430 JOURNAL OF COMPUTERS, VOL. 8,
- Page 60 and 61: 1432 JOURNAL OF COMPUTERS, VOL. 8,
- Page 62 and 63: 1434 JOURNAL OF COMPUTERS, VOL. 8,
- Page 64 and 65: 1436 JOURNAL OF COMPUTERS, VOL. 8,
- Page 66 and 67: 1438 JOURNAL OF COMPUTERS, VOL. 8,
- Page 68 and 69: 1440 JOURNAL OF COMPUTERS, VOL. 8,
- Page 70 and 71: 1442 JOURNAL OF COMPUTERS, VOL. 8,
- Page 72 and 73: 1444 JOURNAL OF COMPUTERS, VOL. 8,
- Page 74 and 75: 1446 JOURNAL OF COMPUTERS, VOL. 8,
- Page 76 and 77: 1448 JOURNAL OF COMPUTERS, VOL. 8,
- Page 78 and 79: 1450 JOURNAL OF COMPUTERS, VOL. 8,
- Page 80 and 81: 1452 JOURNAL OF COMPUTERS, VOL. 8,
- Page 82 and 83: 1454 JOURNAL OF COMPUTERS, VOL. 8,
- Page 84 and 85: 1456 JOURNAL OF COMPUTERS, VOL. 8,
- Page 86 and 87: 1458 JOURNAL OF COMPUTERS, VOL. 8,
- Page 88 and 89: 1460 JOURNAL OF COMPUTERS, VOL. 8,
- Page 90 and 91: 1462 JOURNAL OF COMPUTERS, VOL. 8,
- Page 92 and 93: 1464 JOURNAL OF COMPUTERS, VOL. 8,
- Page 94 and 95: 1466 JOURNAL OF COMPUTERS, VOL. 8,
- Page 96 and 97: 1468 JOURNAL OF COMPUTERS, VOL. 8,
- Page 100 and 101: 1472 JOURNAL OF COMPUTERS, VOL. 8,
- Page 102 and 103: 1474 JOURNAL OF COMPUTERS, VOL. 8,
- Page 104 and 105: 1476 JOURNAL OF COMPUTERS, VOL. 8,
- Page 106 and 107: 1478 JOURNAL OF COMPUTERS, VOL. 8,
- Page 108 and 109: 1480 JOURNAL OF COMPUTERS, VOL. 8,
- Page 110 and 111: 1482 JOURNAL OF COMPUTERS, VOL. 8,
- Page 112 and 113: 1484 JOURNAL OF COMPUTERS, VOL. 8,
- Page 114 and 115: 1486 JOURNAL OF COMPUTERS, VOL. 8,
- Page 116 and 117: 1488 JOURNAL OF COMPUTERS, VOL. 8,
- Page 118 and 119: 1490 JOURNAL OF COMPUTERS, VOL. 8,
- Page 120 and 121: 1492 JOURNAL OF COMPUTERS, VOL. 8,
- Page 122 and 123: 1494 JOURNAL OF COMPUTERS, VOL. 8,
- Page 124 and 125: 1496 JOURNAL OF COMPUTERS, VOL. 8,
- Page 126 and 127: 1498 JOURNAL OF COMPUTERS, VOL. 8,
- Page 128 and 129: 1500 JOURNAL OF COMPUTERS, VOL. 8,
- Page 130 and 131: 1502 JOURNAL OF COMPUTERS, VOL. 8,
- Page 132 and 133: 1504 JOURNAL OF COMPUTERS, VOL. 8,
- Page 134 and 135: 1506 JOURNAL OF COMPUTERS, VOL. 8,
- Page 136 and 137: 1508 JOURNAL OF COMPUTERS, VOL. 8,
- Page 138 and 139: 1510 JOURNAL OF COMPUTERS, VOL. 8,
- Page 140 and 141: 1512 JOURNAL OF COMPUTERS, VOL. 8,
- Page 142 and 143: 1514 JOURNAL OF COMPUTERS, VOL. 8,
- Page 144 and 145: 1516 JOURNAL OF COMPUTERS, VOL. 8,
- Page 146 and 147: 1518 JOURNAL OF COMPUTERS, VOL. 8,
- Page 148 and 149:
1520 JOURNAL OF COMPUTERS, VOL. 8,
- Page 150 and 151:
1522 JOURNAL OF COMPUTERS, VOL. 8,
- Page 152 and 153:
1524 JOURNAL OF COMPUTERS, VOL. 8,
- Page 154 and 155:
1526 JOURNAL OF COMPUTERS, VOL. 8,
- Page 156 and 157:
1528 JOURNAL OF COMPUTERS, VOL. 8,
- Page 158 and 159:
1530 JOURNAL OF COMPUTERS, VOL. 8,
- Page 160 and 161:
1532 JOURNAL OF COMPUTERS, VOL. 8,
- Page 162 and 163:
1534 JOURNAL OF COMPUTERS, VOL. 8,
- Page 164 and 165:
1536 JOURNAL OF COMPUTERS, VOL. 8,
- Page 166 and 167:
1538 JOURNAL OF COMPUTERS, VOL. 8,
- Page 168 and 169:
1540 JOURNAL OF COMPUTERS, VOL. 8,
- Page 170 and 171:
1542 JOURNAL OF COMPUTERS, VOL. 8,
- Page 172 and 173:
1544 JOURNAL OF COMPUTERS, VOL. 8,
- Page 174 and 175:
1546 JOURNAL OF COMPUTERS, VOL. 8,
- Page 176 and 177:
1548 JOURNAL OF COMPUTERS, VOL. 8,
- Page 178 and 179:
1550 JOURNAL OF COMPUTERS, VOL. 8,
- Page 180 and 181:
1552 JOURNAL OF COMPUTERS, VOL. 8,
- Page 182 and 183:
1554 JOURNAL OF COMPUTERS, VOL. 8,
- Page 184 and 185:
1556 JOURNAL OF COMPUTERS, VOL. 8,
- Page 186 and 187:
1558 JOURNAL OF COMPUTERS, VOL. 8,
- Page 188 and 189:
1560 JOURNAL OF COMPUTERS, VOL. 8,
- Page 190 and 191:
1562 JOURNAL OF COMPUTERS, VOL. 8,
- Page 192 and 193:
1564 JOURNAL OF COMPUTERS, VOL. 8,
- Page 194 and 195:
1566 JOURNAL OF COMPUTERS, VOL. 8,
- Page 196 and 197:
1568 JOURNAL OF COMPUTERS, VOL. 8,
- Page 198 and 199:
1570 JOURNAL OF COMPUTERS, VOL. 8,
- Page 200 and 201:
1572 JOURNAL OF COMPUTERS, VOL. 8,
- Page 202 and 203:
1574 JOURNAL OF COMPUTERS, VOL. 8,
- Page 204 and 205:
1576 JOURNAL OF COMPUTERS, VOL. 8,
- Page 206 and 207:
1578 JOURNAL OF COMPUTERS, VOL. 8,
- Page 208 and 209:
1580 JOURNAL OF COMPUTERS, VOL. 8,
- Page 210 and 211:
1582 JOURNAL OF COMPUTERS, VOL. 8,
- Page 212 and 213:
1584 JOURNAL OF COMPUTERS, VOL. 8,
- Page 214 and 215:
1586 JOURNAL OF COMPUTERS, VOL. 8,
- Page 216 and 217:
1588 JOURNAL OF COMPUTERS, VOL. 8,
- Page 218 and 219:
1590 JOURNAL OF COMPUTERS, VOL. 8,
- Page 220 and 221:
1592 JOURNAL OF COMPUTERS, VOL. 8,
- Page 222 and 223:
1594 JOURNAL OF COMPUTERS, VOL. 8,
- Page 224 and 225:
1596 JOURNAL OF COMPUTERS, VOL. 8,
- Page 226 and 227:
1598 JOURNAL OF COMPUTERS, VOL. 8,
- Page 228 and 229:
1600 JOURNAL OF COMPUTERS, VOL. 8,
- Page 230 and 231:
1602 JOURNAL OF COMPUTERS, VOL. 8,
- Page 232 and 233:
1604 JOURNAL OF COMPUTERS, VOL. 8,
- Page 234 and 235:
1606 JOURNAL OF COMPUTERS, VOL. 8,
- Page 236 and 237:
1608 JOURNAL OF COMPUTERS, VOL. 8,
- Page 238 and 239:
1610 JOURNAL OF COMPUTERS, VOL. 8,
- Page 240 and 241:
1612 JOURNAL OF COMPUTERS, VOL. 8,
- Page 242 and 243:
1614 JOURNAL OF COMPUTERS, VOL. 8,
- Page 244 and 245:
1616 JOURNAL OF COMPUTERS, VOL. 8,
- Page 246 and 247:
1618 JOURNAL OF COMPUTERS, VOL. 8,
- Page 248 and 249:
1620 JOURNAL OF COMPUTERS, VOL. 8,
- Page 250 and 251:
1622 JOURNAL OF COMPUTERS, VOL. 8,
- Page 252 and 253:
1624 JOURNAL OF COMPUTERS, VOL. 8,
- Page 254 and 255:
1626 JOURNAL OF COMPUTERS, VOL. 8,
- Page 256 and 257:
1628 JOURNAL OF COMPUTERS, VOL. 8,
- Page 258 and 259:
1630 JOURNAL OF COMPUTERS, VOL. 8,
- Page 261:
Call for Papers and Special Issues
- Page 264:
(Contents Continued from Back Cover