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BSIM3v3.2.2 MOSFET Model - The University of Texas at Dallas

BSIM3v3.2.2 MOSFET Model - The University of Texas at Dallas

BSIM3v3.2.2 MOSFET Model - The University of Texas at Dallas

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<strong>Model</strong> Formul<strong>at</strong>ionwhere i represents the four terminals and C di and C si are the intrinsiccapacitances calcul<strong>at</strong>ed from the quasi-st<strong>at</strong>ic analysis. <strong>The</strong> correspondingvalues for S xpart can be derived from the fact th<strong>at</strong> D xpart + S xpart = 1.In the accumul<strong>at</strong>ion and depletion regions, Eq. (5.3.9) is simplified asIf XPART < 0.5, D xpart = 0.4;Else if XPART > 0.5, D xpart = 0.0;Else D xpart = 0.5;5.3.4 Deriv<strong>at</strong>ion <strong>of</strong> nodal conductancesThis section gives some examples <strong>of</strong> how to derive the nodal conductancesrel<strong>at</strong>ed to NQS for transient analysis. By noting th<strong>at</strong> τ = RC, G tau can bederived asCGtau=τfact(5.3.11)τis given by Eq. (5.3.2). Based on Eq. (5.3.8b), the self-conductance dueto NQS <strong>at</strong> the transistor node D can be derived asdDdVxpartd⋅( G ⋅V)taudef+ Dxpart⋅VdefdG⋅dVtaud(5.3.12)<strong>The</strong> trans-conductance due to NQS on the node D rel<strong>at</strong>ive to the node <strong>of</strong>Q def can be derived asDxpart ⋅Gtau(5.3.13)<strong>BSIM3v3.2.2</strong> Manual Copyright © 1999 UC Berkeley 5-7

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