PCT/2000/42 : PCT Gazette, Weekly Issue No. 42, 2000 - WIPO
PCT/2000/42 : PCT Gazette, Weekly Issue No. 42, 2000 - WIPO
PCT/2000/42 : PCT Gazette, Weekly Issue No. 42, 2000 - WIPO
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<strong>42</strong>/<strong>2000</strong><br />
15398 <strong>PCT</strong> <strong>Gazette</strong> - Section I - <strong>Gazette</strong> du <strong>PCT</strong> 19 Oct/oct <strong>2000</strong><br />
(43) 19 Oct/oct <strong>2000</strong> (19.10.<strong>2000</strong>)<br />
(54) LEAD FRAME FOR SEMICON-<br />
DUCTOR DEVICE<br />
GRILLE DE CONNEXION POUR<br />
DISPOSITIF SEMI–CONDUCTEUR<br />
(71) SHINKO ELECTRIC INDUSTRIES<br />
CO., LTD. [JP/JP]; 711, Aza Shariden,<br />
Oaza Kurita, Nagano–shi, Nagano 380–0921<br />
(JP).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) SEKI, Kazumitsu [JP/JP]; Shinko Electric<br />
Industries Co., Ltd., 711, Aza Shariden,<br />
Oaza Kurita, Nagano–shi, Nagano 380–0921<br />
(JP). YOSHIE, Takashi [JP/JP]; Shinko<br />
Electric Industries Co., Ltd., 711, Aza Shariden,<br />
Oaza Kurita, Nagano–shi, Nagano<br />
380–0921 (JP). SATO, Harunobu [JP/JP];<br />
Shinko Electric Industries Co., Ltd., 711,<br />
Aza Shariden, Oaza Kurita, Nagano–shi, Nagano<br />
380–0921 (JP).<br />
(74) ISHIDA, Takashi et al. / etc.; A. Aoki,<br />
Ishida & Associates, Toranomon 37 Mori<br />
Building, 5–1, Toranomon 3–chome, Minato–ku,<br />
Tokyo 105–8<strong>42</strong>3 (JP).<br />
(81) CN JP KR US; EP (AT BE CH CY DE DK<br />
ES FI FR GB GR IE IT LU MC NL PT SE).<br />
Published / Publiée :(b)<br />
(51) 7 H01L 27/02, 23/60, H01G 4/33<br />
(11) WO 00/623<strong>42</strong> (13) A1<br />
(21) <strong>PCT</strong>/EP00/02789<br />
(22) 29 Mar/mar <strong>2000</strong> (29.03.<strong>2000</strong>)<br />
(25) en (26) en<br />
(30) 9907910.5 7 Apr/avr 1999<br />
(07.04.1999)<br />
(43) 19 Oct/oct <strong>2000</strong> (19.10.<strong>2000</strong>)<br />
GB<br />
(54) THIN FILM CAPACITOR ELEMENT<br />
ELEMENT DE CONDENSATEUR A<br />
FILM MINCE<br />
(71) KONINKLIJKE PHILIPS ELECTRO-<br />
NICS N.V. [NL/NL]; Groenewoudseweg 1,<br />
NL–5621 BA Eindhoven (NL).<br />
(72) BATTERSBY, Stephen, J.; Prof. Holstlaan<br />
6, NL–5656 AA Eindhoven (NL).<br />
MURLEY, Darren, T.; Prof. Holstlaan<br />
6, NL–5656 AA Eindhoven (NL).<br />
SHANNON, John, M.; Prof. Holstlaan 6,<br />
NL–5656 AA Eindhoven (NL).<br />
(74) MOODY, Colin, J.; Internationaal Octrooibureau<br />
B.V., Prof. Holstlaan 6, NL–5656 AA<br />
Eindhoven (NL).<br />
(81) JP; EP (AT BE CH CY DE DK ES FI FR<br />
GB GR IE IT LU MC NL PT SE).<br />
(51) 7 H01L 27/12<br />
(11) WO 00/62343 (13) A1<br />
(21) <strong>PCT</strong>/JP00/02074<br />
(22) 31 Mar/mar <strong>2000</strong> (31.03.<strong>2000</strong>)<br />
(25) ja (26) ja<br />
(30) 11/102698 9 Apr/avr 1999<br />
(09.04.1999)<br />
JP<br />
(43) 19 Oct/oct <strong>2000</strong> (19.10.<strong>2000</strong>)<br />
(54) SOI WAFER AND METHOD FOR PRO-<br />
DUCING SOI WAFER<br />
PLAQUETTE A SILICIUM SUR ISO-<br />
LANT ET PROCEDE DE PRODUC-<br />
TION DE PLAQUETTE A SILICIUM<br />
SUR ISOLANT<br />
(71) SHIN–ETSU HANDOTAI CO., LTD.<br />
[JP/JP]; 4–2, Marunouchi 1–chome,<br />
Chiyoda–ku, Tokyo 100–0005 (JP).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) FURIHATA, Jun–ichiro [JP/JP]; Isobe<br />
R & D Center, Shin–Etsu Handotai Co.,<br />
Ltd., 13–1, Isobe 2–chome, Annaka–shi,<br />
Gumma 379–0196 (JP). MITANI, Kiyoshi<br />
[JP/JP]; Isobe R & D Center, Shin–Etsu<br />
Handotai Co., Ltd., 13–1, Isobe 2–chome,<br />
Annaka–shi, Gumma 379–0196 (JP). KO-<br />
BAYASHI, <strong>No</strong>rihiro [JP/JP]; Isobe R &<br />
D Center, Shin–Etsu Handotai Co., Ltd.,<br />
13–1, Isobe 2–chome, Annaka–shi, Gumma<br />
379–0196 (JP). AKIYAMA, Shoji [JP/JP];<br />
Isobe R & D Center, Shin–Etsu Handotai<br />
Co., Ltd, 13–1, Isobe 2–chome, Annaka–shi,<br />
Gumma 379–0196 (JP).<br />
(74) YOSHIMIYA, Mikio; Uenosansei Building<br />
4F, 6–4, Motoasakusa 2–chome, Taito–ku,<br />
Tokyo 111–0041 (JP).<br />
(81) KR US; EP (AT BE CH CY DE DK ES FI<br />
FR GB GR IE IT LU MC NL PT SE).<br />
(51) 7 H01L 27/146, 31/0352, G01J 1/02, 3/36<br />
(11) WO 00/62344 (13) A1<br />
(21) <strong>PCT</strong>/JP00/02<strong>42</strong>4<br />
(22) 13 Apr/avr <strong>2000</strong> (13.04.<strong>2000</strong>)<br />
(25) ja (26) ja<br />
(30) 11/1054<strong>42</strong> 13 Apr/avr 1999 JP<br />
(13.04.1999)<br />
(43) 19 Oct/oct <strong>2000</strong> (19.10.<strong>2000</strong>)<br />
(54) SEMICONDUCTOR DEVICE<br />
DISPOSITIF À SEMICONDUCTEUR<br />
(71) HAMAMATSU PHOTONICS K.K.<br />
[JP/JP]; 1126–1, Ichino–cho, Hamamatsu–shi,<br />
Shizuoka–ken 435–8558 (JP).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) MURAMATSU, Masaharu [JP/JP];<br />
Hamamatsu Photonics K.K., 1126–1,<br />
Ichino–cho, Hamamatsu–shi, Shizuoka–ken<br />
435–8558 (JP).<br />
(74) HASEGAWA, Yoshiki et al. / etc.; Soei<br />
Patent and Law Firm, Okura–Honkan, 6–12,<br />
Ginza 2–chome, Chuo–ku, Tokyo 104–0061<br />
(JP).<br />
(81) AE AL AM AT AU AZ BA BB BG BR BY<br />
CA CH CN CR CU CZ DE DK DM EE ES<br />
FI GB GD GE GH GM HR HU ID IL IN<br />
IS JP KE KG KP KR KZ LC LK LR LS LT<br />
LU LV MA MD MG MK MN MW MX NO<br />
NZ PL PT RO RU SD SE SG SI SK SL TJ<br />
TM TR TT TZ UA UG US UZ VN YU ZA<br />
ZW; AP (GH GM KE LS MW SD SL SZ<br />
TZ UG ZW); EA (AM AZ BY KG KZ MD<br />
RU TJ TM); EP (AT BE CH CY DE DK ES<br />
FI FR GB GR IE IT LU MC NL PT SE);<br />
OA (BF BJ CF CG CI CM GA GN GW ML<br />
MR NE SN TD TG).<br />
(51) 6 H01L 29/78<br />
(11) WO 00/62345 (13) A1<br />
(21) <strong>PCT</strong>/JP99/01885<br />
(22) 9 Apr/avr 1999 (09.04.1999)<br />
(25) ja (26) ja<br />
(43) 19 Oct/oct <strong>2000</strong> (19.10.<strong>2000</strong>)<br />
(54) HIGH–VOLTAGE<br />
DEVICE<br />
SEMICONDUCTOR<br />
DISPOSITIF A SEMI–CONDUCTEUR<br />
HAUTE TENSION<br />
(71) SHINDENGEN ELECTRIC MANUFAC-<br />
TURING CO., LTD. [JP/JP]; 2–1, Ohtemachi<br />
2–chome, Chiyoda–ku, Tokyo 100–0004<br />
(JP).<br />
(for all designated States except / pour tous<br />
les États désignés sauf US)<br />
(72, 75) MIYAKOSHI, <strong>No</strong>buki [JP/JP]; Shindengen<br />
Electric Manufacturing Co., Ltd.,<br />
10–13, Minami–cho, Hanno–shi, Saitama<br />
357–8585 (JP). FUKUI, Masanori [JP/JP];<br />
Shindengen Electric Manufacturing Co.,<br />
Ltd., 10–13, Minami–cho, Hanno–shi,<br />
Saitama 357–8585 (JP). NAKAMURA,<br />
Hideyuki [JP/JP]; Shindengen Electric Manufacturing<br />
Co., Ltd., 10–13, Minami–cho,<br />
Hanno–shi, Saitama 357–8585 (JP).<br />
(74) ISHIJIMA, Shigeo et al. / etc.; Toranomonkougyou<br />
Building 3F, 2–18, Toranomon<br />
1–chome, Minato–ku, Tokyo<br />
105–0001 (JP).<br />
(81) US; EP (AT BE CH CY DE DK ES FI FR<br />
GB GR IE IT LU MC NL PT SE).<br />
(51) 7 H01L 29/861<br />
(11) WO 00/62346 (13) A1<br />
(21) <strong>PCT</strong>/EP00/02792<br />
(22) 29 Mar/mar <strong>2000</strong> (29.03.<strong>2000</strong>)<br />
(25) en (26) en<br />
(30) 99302762.2 8 Apr/avr 1999<br />
(08.04.1999)<br />
(43) 19 Oct/oct <strong>2000</strong> (19.10.<strong>2000</strong>)<br />
EP<br />
(54) PUNCHTHROUGH DIODE AND ME-<br />
THOD<br />
SAME<br />
OF MANUFACTURING THE<br />
DIODE A EFFET DE CLAQUAGE ET<br />
SON PROCEDE DE FABRICATION<br />
(71) KONINKLIJKE PHILIPS ELECTRO-<br />
NICS N.V. [NL/NL]; Groenewoudseweg 1,<br />
NL–5621 BA Eindhoven (NL).<br />
(72) BROWN, Adam, R.; Prof. Holstlaan 6,<br />
NL–5656 AA Eindhoven (NL). HURKX,<br />
Godefridus, A., M.; Prof. Holstlaan 6,<br />
NL–5656 AA Eindhoven (NL). DE BOER,<br />
Wiebe, B.; Prof. Holstlaan 6, NL–5656<br />
AA Eindhoven (NL). HUIZING, Hendrik,<br />
G., A.; Prof. Holstlaan 6, NL–5656 AA<br />
Eindhoven (NL). HUANG, Eddie; Prof.<br />
Holstlaan 6, NL–5656 AA Eindhoven (NL).<br />
(74) SMEETS, Eugenius, T., J., M.; Internationaal<br />
Octrooibureau B.V., Prof. Holstlaan 6,<br />
NL–5656 AA Eindhoven (NL).