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HVAC Control in the New Millennium.pdf - HVAC.Amickracing

HVAC Control in the New Millennium.pdf - HVAC.Amickracing

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<strong>HVAC</strong> <strong>Control</strong> <strong>in</strong> <strong>the</strong> <strong>New</strong> <strong>Millennium</strong>The resist is dried and baked and <strong>the</strong> wafer is ready to beg<strong>in</strong> <strong>the</strong>pattern<strong>in</strong>g step.The pattern to be transferred to <strong>the</strong> wafer surface exists as a mask.The mask is a transparent support material coated with a th<strong>in</strong> layer ofopaque material. Certa<strong>in</strong> portions of <strong>the</strong> opaque material are removed,leav<strong>in</strong>g opaque material on <strong>the</strong> mask <strong>in</strong> <strong>the</strong> precise pattern required on<strong>the</strong> silicon surface.The mask, with <strong>the</strong> desired pattern engraved upon it, is broughtface down <strong>in</strong>to close proximity with <strong>the</strong> wafer surface. The dark areasof opaque material on <strong>the</strong> surface of <strong>the</strong> mask are <strong>the</strong> areas where it isdesired to leave silicon dioxide on <strong>the</strong> surface of <strong>the</strong> silicon. Open<strong>in</strong>gs<strong>in</strong> <strong>the</strong> mask correspond to areas where it is desired to remove silicondioxide from <strong>the</strong> silicon surface.The mask is laid on <strong>the</strong> wafer and its back surface is flooded withioniz<strong>in</strong>g radiation, such as ultraviolet light or low-energy X-rays. Theradiation is blocked <strong>in</strong> areas where <strong>the</strong> mask has opaque material on itssurface. Where <strong>the</strong>re is no opaque material on <strong>the</strong> mask surface, <strong>the</strong>ioniz<strong>in</strong>g radiation passes through <strong>in</strong>to <strong>the</strong> resist, <strong>the</strong> silicon dioxide, andsilicon.The ioniz<strong>in</strong>g radiation has little effect on <strong>the</strong> silicon dioxide andsilicon but it breaks down <strong>the</strong> molecular structure of <strong>the</strong> resist <strong>in</strong>tosmaller molecules. This step makes it possible to dissolve exposed resistmaterial <strong>in</strong> solvents that will not dissolve <strong>the</strong> unexposed resist material.The resist is developed by immers<strong>in</strong>g <strong>the</strong> silicon wafer <strong>in</strong> a solvent.The pattern orig<strong>in</strong>ally exist<strong>in</strong>g as a set of opaque geometries on <strong>the</strong>mask surface is transferred as a correspond<strong>in</strong>g pattern <strong>in</strong>to <strong>the</strong> resistmaterial on <strong>the</strong> surface of <strong>the</strong> silicon dioxide.The same pattern is transferred to <strong>the</strong> silicon dioxide by expos<strong>in</strong>g<strong>the</strong> wafer to a material that will etch silicon dioxide but will not attack<strong>the</strong> organic resist material or <strong>the</strong> silicon wafer surface. The etch<strong>in</strong>g stepis usually done with hydrofluoric acid, which dissolves silicon dioxide,but is <strong>in</strong>capable of etch<strong>in</strong>g <strong>the</strong> surface of silicon.The f<strong>in</strong>al step <strong>in</strong> pattern<strong>in</strong>g is removal of <strong>the</strong> rema<strong>in</strong><strong>in</strong>g organicresist material. The techniques used to remove resist materials <strong>in</strong>volveacids, such as chromic acid and atomic oxygen, to oxidize <strong>the</strong> organicmaterials. The pattern <strong>the</strong>n has been transferred <strong>in</strong>to <strong>the</strong> silicon dioxideon <strong>the</strong> wafer surface. A similar sequence of steps is used to selectivelypattern each of <strong>the</strong> layers. The steps differ <strong>in</strong> <strong>the</strong> types ofetchants used.©2001 by The Fairmont Press, Inc. All rights reserved.

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