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HVAC Control in the New Millennium.pdf - HVAC.Amickracing

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Advanced <strong>HVAC</strong> <strong>Control</strong>, Information Technology and Open SystemsIntegrated Circuit FabricationA sequence of patterned layers is used to build NMOS <strong>in</strong>tegratedcircuits and systems. The fabrication of a basic <strong>in</strong>verter circuit takesplace <strong>in</strong> a system and all o<strong>the</strong>r circuits are simultaneously implementedby <strong>the</strong> same process.The first mask <strong>in</strong>cludes <strong>the</strong> sources and dra<strong>in</strong>s of all transistors <strong>in</strong><strong>the</strong> circuit, toge<strong>the</strong>r with <strong>the</strong> transistor gate areas and any circuit <strong>in</strong>terconnectionpaths. This mask is used for <strong>the</strong> first step <strong>in</strong> <strong>the</strong> process.The next step is to differentiate transistors that are normally on(depletion mode) from those that are normally off (enhancement mode).This is done by an overcoat of <strong>the</strong> wafer with resist material, expos<strong>in</strong>g<strong>the</strong> resist material through open<strong>in</strong>gs <strong>in</strong> ano<strong>the</strong>r mask, and develop<strong>in</strong>g it.The pattern leaves an open<strong>in</strong>g <strong>in</strong> <strong>the</strong> resist material over <strong>the</strong> area to beturned <strong>in</strong>to depletion mode transistors.The actual conversion of <strong>the</strong> underly<strong>in</strong>g silicon is done by implant<strong>in</strong>gions of arsenic or antimony <strong>in</strong>to <strong>the</strong> silicon surface. The resist materialacts to prevent <strong>the</strong> ions from reach<strong>in</strong>g <strong>the</strong> silicon surface. Ions areonly implanted <strong>in</strong> <strong>the</strong> silicon area free of resist which causes a slight n-type conductivity <strong>in</strong> <strong>the</strong> underly<strong>in</strong>g silicon.The wafer is <strong>the</strong>n heated while exposed to oxygen, to grow a th<strong>in</strong>layer of silicon dioxide over its entire surface. It is <strong>the</strong>n coated with ath<strong>in</strong> layer of polycrystall<strong>in</strong>e silicon. This layer forms <strong>the</strong> gates of all <strong>the</strong>transistors <strong>in</strong> <strong>the</strong> circuit and also serves as a second layer for circuit<strong>in</strong>terconnections.The n-type regions are diffused <strong>in</strong>to <strong>the</strong> p-type silicon substrate,form<strong>in</strong>g <strong>the</strong> sources and dra<strong>in</strong>s of <strong>the</strong> transistors and <strong>the</strong> first level of<strong>in</strong>terconnections. This is done by first remov<strong>in</strong>g <strong>the</strong> th<strong>in</strong> gate oxide <strong>in</strong><strong>the</strong> areas not covered by <strong>the</strong> polysilicon.The wafer is <strong>the</strong>n exposed to n-type impurities such as arsenic,antimony, or phosphorous at high temperature which allows <strong>the</strong>se impuritiesto convert <strong>the</strong> exposed underly<strong>in</strong>g silicon to n-type material.The polysilicon area and <strong>the</strong> th<strong>in</strong> oxide under it act to prevent impuritiesfrom diffus<strong>in</strong>g <strong>in</strong>to <strong>the</strong> underly<strong>in</strong>g silicon.Interconnections are made with a metal layer that contacts both <strong>the</strong>diffused areas and <strong>the</strong> polycrystall<strong>in</strong>e areas. Ano<strong>the</strong>r layer of <strong>in</strong>sulat<strong>in</strong>goxide is coated over <strong>the</strong> entire circuit and <strong>the</strong>n removed <strong>in</strong> places wherecontacts are desired. The wafer surface is usually coated with ano<strong>the</strong>r layerof oxide. This is called overglass<strong>in</strong>g and provides physical protection for©2001 by The Fairmont Press, Inc. All rights reserved.

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