WellCAD Basics - Advanced Logic Technology

Stacking Pattern Log
Description:
APPENDIX A - 329
The Stacking Pattern log can be used to display trends within certain depth intervals
such as coarsening or fining in grain size. Data values are represented by the means
of geometrical figures (triangle and square). Besides Top and Bottom Depth the data
format requires data values between 0 and 1, describing the width of the symbol at
top and bottom of the interval.
Data Format:
TopDepth, BottomDepth, TopWidth, BottomWidth
E.g.
Display Styles:
Each data point consists of a top and bottom depth with corresponding data values
(between 0 and 1). As shown below the data values control the width of the symbol
representing the direction of the trend.